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For: Bruhwiler PA, Schnatterly SE. Empirical application of Dyson's equation to the L2,3 soft-x-ray-emission transition densities of states of c-Si and a-Si:H. Phys Rev B Condens Matter 1989;39:12649-12654. [PMID: 9948133 DOI: 10.1103/physrevb.39.12649] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]

For:	Bruhwiler PA, Schnatterly SE. Empirical application of Dyson's equation to the L2,3 soft-x-ray-emission transition densities of states of c-Si and a-Si:H. Phys Rev B Condens Matter 1989;39:12649-12654. [PMID: 9948133 DOI: 10.1103/physrevb.39.12649] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]

Number	Cited by Other Article(s)
1	Shin S, Agui A, Watanabe M, Fujisawa M, Tezuka Y, Ishii T. Observation of resonant Raman scattering at the Si L2,3 core exciton. PHYSICAL REVIEW. B, CONDENSED MATTER 1996;53:15660-15666. [PMID: 9983400 DOI: 10.1103/physrevb.53.15660] [Citation(s) in RCA: 22] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023] Abstract Collapse Key Words Collapse MESH Headings Collapse Grants Collapse Affiliation(s) Collapse
2	Nilsson PO, Kanski J, Thordson JV, Andersson TG, Nordgren J, Guo J, Magnuson M. Electronic structure of buried Si layers in GaAs(001) as studied by soft-x-ray emission. PHYSICAL REVIEW. B, CONDENSED MATTER 1995;52:R8643-R8645. [PMID: 9979915 DOI: 10.1103/physrevb.52.r8643] [Citation(s) in RCA: 9] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023] Abstract Collapse Key Words Collapse MESH Headings Collapse Grants Collapse Affiliation(s) Collapse
3	Ma H, Lin SH, Carpenter RW, Sankey OF. Ab initio study of the valence-electron relaxation effect on x-ray-emission spectra and the excitonic effect on electron-energy-loss spectra of the Si L2,3 edge. PHYSICAL REVIEW. B, CONDENSED MATTER 1991;44:13393-13397. [PMID: 9999541 DOI: 10.1103/physrevb.44.13393] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023] Abstract Collapse Key Words Collapse MESH Headings Collapse Grants Collapse Affiliation(s) Collapse
4	Rubensson JE, Mueller D, Shuker R, Ederer DL, Zhang CH, Jia J, Callcott TA. Excitation-energy dependence in the L2,3 fluorescence spectrum of Si. PHYSICAL REVIEW LETTERS 1990;64:1047-1050. [PMID: 10042149 DOI: 10.1103/physrevlett.64.1047] [Citation(s) in RCA: 18] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/23/2023] Abstract Collapse Key Words Collapse MESH Headings Collapse Grants Collapse Affiliation(s) Collapse