Han S, Yu Y, Chu X, Chu SI, Wang Z. Time-resolved measurement of dissipation-induced decoherence in a Josephson junction.
Science 2001;
293:1457-9. [PMID:
11520978 DOI:
10.1126/science.1062266]
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Abstract
We determined the dissipation-induced decoherence time (DIDT) of a superconducting Josephson tunnel junction by time-resolved measurements of its escape dynamics. Double-exponential behavior of the time-dependent escape probability was observed, suggesting the occurrence of a two-level decay-tunneling process in which energy relaxation from the excited to the ground level significantly affects the escape dynamics of the system. The observation of temporal double-exponential dependence enables direct measurements of the DIDT, a property critical to the study of quantum dynamics and the realization of macroscopic quantum coherence and quantum computing. We found that the DIDT was tau(d) > 11 micros at T = 0.55 K, demonstrating good prospects for implementing quantum computing with Josephson devices.
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