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For: Klapwijk TM, Suurmeijer EP. Critical temperature of thin niobium films on heavily doped silicon. Phys Rev B Condens Matter 1993;47:5151-5156. [PMID: 10006680 DOI: 10.1103/physrevb.47.5151] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
Number Cited by Other Article(s)
1
Heslinga DR, Shafranjuk SE, Klapwijk TM. Observation of double-gap-edge Andreev reflection at Si/Nb interfaces by point-contact spectroscopy. PHYSICAL REVIEW. B, CONDENSED MATTER 1994;49:10484-10494. [PMID: 10009873 DOI: 10.1103/physrevb.49.10484] [Citation(s) in RCA: 18] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
2
Klapwijk TM, Heslinga DR. Carrier transport in mesoscopic silicon-coupled superconducting junctions. PHYSICAL REVIEW. B, CONDENSED MATTER 1993;47:5170-5189. [PMID: 10006683 DOI: 10.1103/physrevb.47.5170] [Citation(s) in RCA: 31] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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