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For: Montero I, Galán L, Najmi O, Albella JM. Disorder-induced vibration-mode coupling in SiO2 films observed under normal-incidence infrared radiation. Phys Rev B Condens Matter 1994;50:4881-4884. [PMID: 9976802 DOI: 10.1103/physrevb.50.4881] [Citation(s) in RCA: 13] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
Number Cited by Other Article(s)
1
Chen C, Chen X, Yu H, Shao Y, Guo Q, Deng B, Lee S, Ma C, Watanabe K, Taniguchi T, Park JG, Huang S, Yao W, Xia F. Symmetry-Controlled Electron-Phonon Interactions in van der Waals Heterostructures. ACS NANO 2019;13:552-559. [PMID: 30457832 DOI: 10.1021/acsnano.8b07290] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/09/2023]
2
Cappeletti LB, Moncada E, Poisson J, Butler IS, Dos Santos JHZ. Determination of the network structure of sensor materials prepared by three different sol-gel routes using Fourier transform infrared spectroscopy (FT-IR). APPLIED SPECTROSCOPY 2013;67:441-447. [PMID: 23601544 DOI: 10.1366/12-06748] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/02/2023]
3
Arendse CJ, Malgas GF, Muller TFG, Knoesen D, Oliphant CJ, Motaung DE, Halindintwali S, Mwakikunga BW. Thermally Induced Nano-Structural and Optical Changes of nc-Si:H Deposited by Hot-Wire CVD. NANOSCALE RESEARCH LETTERS 2009;4:307-312. [PMID: 20596406 PMCID: PMC2893958 DOI: 10.1007/s11671-008-9243-0] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 10/28/2008] [Accepted: 12/30/2008] [Indexed: 05/29/2023]
4
Investigation of a nanocrystalline silicon phase embedded in SiO[sub x] thin films grown by pulsed laser deposition. ACTA ACUST UNITED AC 2005. [DOI: 10.1116/1.1880252] [Citation(s) in RCA: 15] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/17/2022]
5
Ojeda F, Abel F, Albella JM. Hydrogen Elimination Kinetics during Chemical Vapor Deposition of Silica Films. J Phys Chem B 2002. [DOI: 10.1021/jp0255381] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/29/2022]
6
Chigane M, Ishikawa M, Izaki M. Preparation of Silica Thin Films by Electrolyses of Aqueous Solution. ACTA ACUST UNITED AC 2002. [DOI: 10.1149/1.1506462] [Citation(s) in RCA: 13] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/16/2022]
7
Rouchon D, Rochat N, Gustavo F, Chabli A, Renault O, Besson P. Study of ultrathin silicon oxide films by FTIR-ATR and ARXPS after wet chemical cleaning processes. SURF INTERFACE ANAL 2002. [DOI: 10.1002/sia.1335] [Citation(s) in RCA: 26] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/07/2022]
8
Glinka YD, Jaroniec M. Spontaneous and Stimulated Raman Scattering from Surface Phonon Modes in Aggregated SiO2 Nanoparticles. J Phys Chem B 1997. [DOI: 10.1021/jp971837s] [Citation(s) in RCA: 21] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/30/2022]
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