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Jeong BG, Chang JH, Hahm D, Rhee S, Park M, Lee S, Kim Y, Shin D, Park JW, Lee C, Lee DC, Park K, Hwang E, Bae WK. Interface polarization in heterovalent core-shell nanocrystals. NATURE MATERIALS 2022; 21:246-252. [PMID: 34795403 DOI: 10.1038/s41563-021-01119-8] [Citation(s) in RCA: 28] [Impact Index Per Article: 9.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/02/2020] [Accepted: 08/22/2021] [Indexed: 06/13/2023]
Abstract
The potential profile and the energy level offset of core-shell heterostructured nanocrystals (h-NCs) determine the photophysical properties and the charge transport characteristics of h-NC solids. However, limited material choices for heavy metal-free III-V-II-VI h-NCs pose challenges in comprehensive control of the potential profile. Herein, we present an approach to such a control by steering dipole densities at the interface of III-V-II-VI h-NCs. The controllable heterovalency at the interface is responsible for interfacial dipole densities that result in the vacuum-level shift, providing an additional knob for the control of optical and electrical characteristics of h-NCs. The synthesis of h-NCs with atomic precision allows us to correlate interfacial dipole moments with the NCs' photochemical stability and optoelectronic performance.
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Affiliation(s)
- Byeong Guk Jeong
- SKKU Advanced Institute of Nano Technology and Department of Nano Engineering, Sungkyunkwan University, Suwon, Republic of Korea
| | - Jun Hyuk Chang
- SKKU Advanced Institute of Nano Technology and Department of Nano Engineering, Sungkyunkwan University, Suwon, Republic of Korea
| | - Donghyo Hahm
- SKKU Advanced Institute of Nano Technology and Department of Nano Engineering, Sungkyunkwan University, Suwon, Republic of Korea
| | - Seunghyun Rhee
- SKKU Advanced Institute of Nano Technology and Department of Nano Engineering, Sungkyunkwan University, Suwon, Republic of Korea
| | - Myeongjin Park
- Samsung Display Research Center, Samsung Display, Yongin, Republic of Korea
| | - Sooho Lee
- Samsung Display Research Center, Samsung Display, Yongin, Republic of Korea
| | - Youngdu Kim
- SKKU Advanced Institute of Nano Technology and Department of Nano Engineering, Sungkyunkwan University, Suwon, Republic of Korea
| | - Doyoon Shin
- SKKU Advanced Institute of Nano Technology and Department of Nano Engineering, Sungkyunkwan University, Suwon, Republic of Korea
| | - Jeong Woo Park
- SKKU Advanced Institute of Nano Technology and Department of Nano Engineering, Sungkyunkwan University, Suwon, Republic of Korea
| | - Changhee Lee
- Samsung Display Research Center, Samsung Display, Yongin, Republic of Korea
| | - Doh C Lee
- Department of Chemical and Biomolecular Engineering, KAIST Institute for the Nanocentury, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea.
| | - Kyoungwon Park
- Display Research Center, Korea Electronics Technology Institute (KETI), Seongnam, Republic of Korea
| | - Euyheon Hwang
- SKKU Advanced Institute of Nano Technology and Department of Nano Engineering, Sungkyunkwan University, Suwon, Republic of Korea.
| | - Wan Ki Bae
- SKKU Advanced Institute of Nano Technology and Department of Nano Engineering, Sungkyunkwan University, Suwon, Republic of Korea.
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Gao G, Li Z, Chen M, Xie Y, Wang Y. Effect of molybdenum disulfide nanoribbon on quantum transport of graphene. JOURNAL OF PHYSICS. CONDENSED MATTER : AN INSTITUTE OF PHYSICS JOURNAL 2017; 29:435001. [PMID: 28829340 DOI: 10.1088/1361-648x/aa879f] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/07/2023]
Abstract
Based on the density functional theory method in combination with the nonequilibrium green's function formalism, the quantum transport properties in graphene-[Formula: see text] vertical heterojunction were investigated in this work. The leads are boron doped graphene and seamlessly connect to the graphene nanoribbon in central scattering region. Although there is a weak graphene-[Formula: see text] interaction, molybdenum disulfide can smooth the electrostatic potential and enlarge the transport properties of the whole device. However, another competitive factor is that of the edge states of the [Formula: see text] nanoribbon. When the transport is along the zigzag direction of graphene, the armchair [Formula: see text] nanoribbon simply enlarges the transmission coefficient. Nevertheless, in the armchair transport system, there is an asymmetric electrostatic potential induced by the different atomic potentials of S and Mo atoms at both edges in the zigzag [Formula: see text] nanoribbon, whose potential can lead to obvious scattering from graphene to [Formula: see text] and suppress the transmission probability. Therefore, it also suppresses the influence of zigzag [Formula: see text] nanoribbon on the transmission coefficient. Our first principles simulations provide useful predictions for the application of graphene based emerging electronics, which may stimulate further experimental exploration.
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Affiliation(s)
- Guanyi Gao
- College of Science, University of Shanghai for Science and Technology, Shanghai 200093, People's Republic of China
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Xi S, Jie W, Zha G, Yuan Y, Wang T, Zhang W, Zhu J, Xu L, Xu Y, Su J, Zhang H, Gu Y, Li J, Ren J, Zhao Q. Effects of Ga-Te interface layer on the potential barrier height of CdTe/GaAs heterointerface. Phys Chem Chem Phys 2016; 18:2639-45. [PMID: 26699197 DOI: 10.1039/c5cp04802h] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
Abstract
The interface layer has great significance on the potential barrier height of the CdTe/GaAs heterointerface. In this study, the electronic properties of the CdTe/GaAs heterostructure prepared by molecular beam epitaxy was investigated in situ by synchrotron radiation photoemission spectroscopy for CdTe thicknesses ranging from 3.5 to 74.6 Å. During CdTe deposition, an As-Te and Ga-Te interface reaction occurred, which caused the out diffusion of Ga. As a result a stable GaTe interface dipole layer (more than 30 Å) was formed, which reduced the potential barrier height by 0.38 eV. The potential barrier height was in proportion to the chemical bonding density and thickness of the Ga-Te interface layer. These results provide a more fundamental understanding of the influencing mechanism of the interface layer on the potential barrier height of the CdTe/GaAs heterointerface.
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Affiliation(s)
- Shouzhi Xi
- State Key Laboratory of Solidification Processing, Northwestern Polytechnical University, Xi'an 710072, P. R. China. and Key Laboratory of Radiation Detection Materials and Devices, Ministry of Industry and Information Technology, China
| | - Wanqi Jie
- State Key Laboratory of Solidification Processing, Northwestern Polytechnical University, Xi'an 710072, P. R. China. and Key Laboratory of Radiation Detection Materials and Devices, Ministry of Industry and Information Technology, China
| | - Gangqiang Zha
- State Key Laboratory of Solidification Processing, Northwestern Polytechnical University, Xi'an 710072, P. R. China. and Key Laboratory of Radiation Detection Materials and Devices, Ministry of Industry and Information Technology, China
| | - Yanyan Yuan
- State Key Laboratory of Solidification Processing, Northwestern Polytechnical University, Xi'an 710072, P. R. China.
| | - Tao Wang
- State Key Laboratory of Solidification Processing, Northwestern Polytechnical University, Xi'an 710072, P. R. China. and Key Laboratory of Radiation Detection Materials and Devices, Ministry of Industry and Information Technology, China
| | - Wenhua Zhang
- National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230029, P. R. China
| | - Junfa Zhu
- National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230029, P. R. China
| | - Lingyan Xu
- State Key Laboratory of Solidification Processing, Northwestern Polytechnical University, Xi'an 710072, P. R. China. and Key Laboratory of Radiation Detection Materials and Devices, Ministry of Industry and Information Technology, China
| | - Yadong Xu
- State Key Laboratory of Solidification Processing, Northwestern Polytechnical University, Xi'an 710072, P. R. China. and Key Laboratory of Radiation Detection Materials and Devices, Ministry of Industry and Information Technology, China
| | - Jie Su
- State Key Laboratory of Solidification Processing, Northwestern Polytechnical University, Xi'an 710072, P. R. China.
| | - Hao Zhang
- State Key Laboratory of Solidification Processing, Northwestern Polytechnical University, Xi'an 710072, P. R. China. and Key Laboratory of Radiation Detection Materials and Devices, Ministry of Industry and Information Technology, China
| | - Yaxu Gu
- State Key Laboratory of Solidification Processing, Northwestern Polytechnical University, Xi'an 710072, P. R. China. and Key Laboratory of Radiation Detection Materials and Devices, Ministry of Industry and Information Technology, China
| | - Jiawei Li
- State Key Laboratory of Solidification Processing, Northwestern Polytechnical University, Xi'an 710072, P. R. China.
| | - Jie Ren
- State Key Laboratory of Solidification Processing, Northwestern Polytechnical University, Xi'an 710072, P. R. China. and Key Laboratory of Radiation Detection Materials and Devices, Ministry of Industry and Information Technology, China
| | - Qinghua Zhao
- State Key Laboratory of Solidification Processing, Northwestern Polytechnical University, Xi'an 710072, P. R. China. and Key Laboratory of Radiation Detection Materials and Devices, Ministry of Industry and Information Technology, China
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Goniakowski J, Noguera C. Conditions for electronic reconstruction at stoichiometric polar/polar interfaces. JOURNAL OF PHYSICS. CONDENSED MATTER : AN INSTITUTE OF PHYSICS JOURNAL 2014; 26:485010. [PMID: 25374280 DOI: 10.1088/0953-8984/26/48/485010] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/04/2023]
Abstract
Relying on first principles simulations of ZnO(0 0 0 1)/MgO(1 1 1), MgO(1 1 1)/CaO(1 1 1) and AlN(0 0 0 1)/GaN(0 0 0 1) interfaces and examples taken from the literature, we discuss under which conditions stoichiometric polar/polar interfaces may display an electronic reconstruction. We point out the role of the three contributions to the interfacial polarization discontinuity--structure, valence and electronic terms--of interfacial strains, and of finite size effects. Depending upon their relative values, the interfaces may be polar (compensated by an electron reconstruction), non-polar, or polar uncompensated at low thickness. We stress that, in superlattices or heterostructures made of thin layers, the prediction of the interface polarity character from the bulk properties of the two materials may be questionable.
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Affiliation(s)
- Jacek Goniakowski
- CNRS, UMR 7588, Institut des Nanosciences de Paris, F-75005 Paris, France. Sorbonne Universités, UPMC Université Paris 06, UMR 7588, INSP, F-75005 Paris, France
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El-Brolossy TA, Abdalla S, Negm S, Talaat H. Interfacial electronic traps at ZnSe/GaAs heterostructures studied by photomodulation Raman scattering. JOURNAL OF PHYSICS. CONDENSED MATTER : AN INSTITUTE OF PHYSICS JOURNAL 2006; 18:4189-4195. [PMID: 21690773 DOI: 10.1088/0953-8984/18/17/007] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/30/2023]
Abstract
Photomodulation Raman scattering spectroscopy has been employed to study free charge trapping mechanisms at ZnSe-GaAs(001) heterostructure interfaces. This technique reveals that the interfacial region contains predominantly hole traps. Time dependent measurements of the photomodulated Raman scattering intensity show that interfacial charge-trap lifetime is ≈30 s for both electrons and holes.
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Affiliation(s)
- T A El-Brolossy
- Physics Department, Faculty of Science, Ain Shams University, Cairo, Egypt
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