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Yang M, Wang Z, Li J, Hong B, Du Y, Wei W, Wang R, Liu F, Zu L. Electronic and thermal transport properties of the metallic antiferromagnet MnSn 2. Phys Chem Chem Phys 2023; 25:2462-2467. [PMID: 36601881 DOI: 10.1039/d2cp04281a] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/24/2022]
Abstract
We report the structure, magnetic and electrical/thermal transport properties of the antiferromagnet MnSn2. Importantly, the existence of the two antiferromagnetic states below TN2 (∼320 K) is confirmed by magnetism and electrical transport measurements. An unsaturated positive magnetoresistance up to 150% at ∼9 T was observed at 5 K, whereas the magnetoresistance becomes negative in the whole range at high temperatures (T > 74 K). Systematic investigations of the Hall transport and thermoelectric properties reveal that the hole-type carriers are the majority carriers in MnSn2. The kink around 320 K in the Seebeck coefficient originates from the effect of the antiferromagnetic phase on the band structure, while the pronounced peak around 231 K is attributed to the phonon-drag effect. The results suggest that the spin arrangement plays a vital role in the magnetic, electrical, and thermal transport properties in MnSn2.
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Affiliation(s)
- Mingge Yang
- Hubei Key Laboratory of Ferro & Piezoelectric Materials and Devices, Faculty of Physics and Electronic Science, Hubei University, Wuhan 430062, P. R. China. .,Anhui High Reliability Chips Engineering Laboratory, Hefei Innovation Research Institute, Beihang University, Hefei, Anhui 230012, P. R. China.
| | - Ziyue Wang
- Fert Beijing Institute, MIIT Key Laboratory of Spintronics, School of Integrated Circuit Science and Engineering, Beihang University, Beijing 100191, P. R. China
| | - Jiangxiao Li
- National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230029, China
| | - Bin Hong
- Anhui High Reliability Chips Engineering Laboratory, Hefei Innovation Research Institute, Beihang University, Hefei, Anhui 230012, P. R. China. .,Fert Beijing Institute, MIIT Key Laboratory of Spintronics, School of Integrated Circuit Science and Engineering, Beihang University, Beijing 100191, P. R. China
| | - Yinchang Du
- Anhui High Reliability Chips Engineering Laboratory, Hefei Innovation Research Institute, Beihang University, Hefei, Anhui 230012, P. R. China. .,Key Laboratory of Geospace Environment, University of Science & Technology of China, Chinese Academy of Sciences, Hefei 230026, P. R. China
| | - Wensen Wei
- Research Institute of Interdisciplinary Science & School of Materials Science and Engineering, Dongguan University of Technology, Dongguan 523808, China
| | - Ruilong Wang
- Hubei Key Laboratory of Ferro & Piezoelectric Materials and Devices, Faculty of Physics and Electronic Science, Hubei University, Wuhan 430062, P. R. China.
| | - Fengguang Liu
- Anhui High Reliability Chips Engineering Laboratory, Hefei Innovation Research Institute, Beihang University, Hefei, Anhui 230012, P. R. China. .,Fert Beijing Institute, MIIT Key Laboratory of Spintronics, School of Integrated Circuit Science and Engineering, Beihang University, Beijing 100191, P. R. China
| | - Lin Zu
- Anhui High Reliability Chips Engineering Laboratory, Hefei Innovation Research Institute, Beihang University, Hefei, Anhui 230012, P. R. China. .,Fert Beijing Institute, MIIT Key Laboratory of Spintronics, School of Integrated Circuit Science and Engineering, Beihang University, Beijing 100191, P. R. China
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Lin JJ, Li ZQ. Electronic conduction properties of indium tin oxide: single-particle and many-body transport. JOURNAL OF PHYSICS. CONDENSED MATTER : AN INSTITUTE OF PHYSICS JOURNAL 2014; 26:343201. [PMID: 25105780 DOI: 10.1088/0953-8984/26/34/343201] [Citation(s) in RCA: 10] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/03/2023]
Abstract
Indium tin oxide (Sn-doped In2O3-δ or ITO) is a very interesting and technologically important transparent conducting oxide. This class of material has been extensively investigated for decades, with research efforts mostly focusing on the application aspects. The fundamental issues of the electronic conduction properties of ITO from room temperature down to liquid-helium temperatures have rarely been addressed thus far. Studies of the electrical-transport properties over a wide range of temperature are essential to unravelling the underlying electronic dynamics and microscopic electronic parameters. In this topical review, we show that one can learn rich physics in ITO material, including the semi-classical Boltzmann transport, the quantum-interference electron transport, as well as the many-body Coulomb electron-electron interaction effects in the presence of disorder and inhomogeneity (granularity). To fully reveal the numerous avenues and unique opportunities that the ITO material has provided for fundamental condensed matter physics research, we demonstrate a variety of charge transport properties in different forms of ITO structures, including homogeneous polycrystalline thin and thick films, homogeneous single-crystalline nanowires and inhomogeneous ultrathin films. In this manner, we not only address new physics phenomena that can arise in ITO but also illustrate the versatility of the stable ITO material forms for potential technological applications. We emphasize that, microscopically, the novel and rich electronic conduction properties of ITO originate from the inherited robust free-electron-like energy bandstructure and low-carrier concentration (as compared with that in typical metals) characteristics of this class of material. Furthermore, a low carrier concentration leads to slow electron-phonon relaxation, which in turn causes the experimentally observed (i) a small residual resistance ratio, (ii) a linear electron diffusion thermoelectric power in a wide temperature range 1-300 K and (iii) a weak electron dephasing rate. We focus our discussion on the metallic-like ITO material.
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Affiliation(s)
- Juhn-Jong Lin
- NCTU-RIKEN Joint Research Laboratory, Institute of Physics and Department of Electrophysics, National Chiao Tung University, Hsinchu 30010, Taiwan
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Lin S, Tong P, Wang B, Lin J, Huang Y, Sun Y. Good Thermoelectric Performance in Strongly Correlated System SnCCo3 with Antiperovskite Structure. Inorg Chem 2014; 53:3709-15. [DOI: 10.1021/ic500026t] [Citation(s) in RCA: 23] [Impact Index Per Article: 2.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/30/2022]
Affiliation(s)
| | | | | | | | | | - Yuping Sun
- University of Science and Technology of China, Hefei 230026, People’s Republic of China
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