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For: Glas F. Correlated static atomic displacements and transmission-electron-microscopy contrast in compositionally homogeneous disordered alloys. Phys Rev B Condens Matter 1995;51:825-839. [PMID: 9978231 DOI: 10.1103/physrevb.51.825] [Citation(s) in RCA: 9] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
Number Cited by Other Article(s)
1
Virtual crystal description of III-V semiconductor alloys in the tight binding approach. JOURNAL OF PHYSICS. CONDENSED MATTER : AN INSTITUTE OF PHYSICS JOURNAL 2016;28:305801. [PMID: 27270264 DOI: 10.1088/0953-8984/28/30/305801] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/06/2023]
2
Compositional characterization of GaAs/GaAsSb nanowires by quantitative HAADF-STEM. Micron 2013;44:254-60. [DOI: 10.1016/j.micron.2012.07.002] [Citation(s) in RCA: 27] [Impact Index Per Article: 2.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/04/2012] [Revised: 07/10/2012] [Accepted: 07/10/2012] [Indexed: 10/28/2022]
3
Composition mapping in InGaN by scanning transmission electron microscopy. Ultramicroscopy 2011;111:1316-27. [DOI: 10.1016/j.ultramic.2011.04.009] [Citation(s) in RCA: 146] [Impact Index Per Article: 11.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/17/2010] [Revised: 04/21/2011] [Accepted: 04/24/2011] [Indexed: 11/22/2022]
4
Quantitative Z-contrast atomic resolution studies of semiconductor nanostructured materials. ACTA ACUST UNITED AC 2010. [DOI: 10.1088/1742-6596/209/1/012005] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/12/2022]
5
The consequences of the atomic size effect in quantitative high resolution electron microscopy. Ultramicroscopy 1995. [DOI: 10.1016/0304-3991(95)00055-6] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/28/2022]
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