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For: Chen X, Abukawa T, Tani J, Kono S. Structural determination of a W(001)c(2 x 2)-Ag surface by x-ray photoelectron diffraction with multiple-scattering analysis. Phys Rev B 1995;52:12380-12385. [PMID: 9980379 DOI: 10.1103/physrevb.52.12380] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]

For:	Chen X, Abukawa T, Tani J, Kono S. Structural determination of a W(001)c(2 x 2)-Ag surface by x-ray photoelectron diffraction with multiple-scattering analysis. Phys Rev B 1995;52:12380-12385. [PMID: 9980379 DOI: 10.1103/physrevb.52.12380] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]

Number	Cited by Other Article(s)
1	Gunnella R, Castrucci P, Pinto N, Davoli I, Sébilleau D. X-ray photoelectron-diffraction study of intermixing and morphology at the Ge/Si(001) and Ge/Sb/Si(001) interface. PHYSICAL REVIEW. B, CONDENSED MATTER 1996;54:8882-8891. [PMID: 9984569 DOI: 10.1103/physrevb.54.8882] [Citation(s) in RCA: 19] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023] Abstract Collapse Key Words Collapse MESH Headings Collapse Grants Collapse Affiliation(s) Collapse

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Gunnella R, Castrucci P, Pinto N, Davoli I, Sébilleau D. X-ray photoelectron-diffraction study of intermixing and morphology at the Ge/Si(001) and Ge/Sb/Si(001) interface. PHYSICAL REVIEW. B, CONDENSED MATTER 1996;54:8882-8891. [PMID: 9984569 DOI: 10.1103/physrevb.54.8882] [Citation(s) in RCA: 19] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]