Interface structure of MBE-grown CoSi2/Si/CoSi2 layers on Si(111): Partially correlated roughness and diffuse x-ray scattering

Molecularly-induced roughness and oxidation in cobalt/organodithiol/cobalt nanolayers synthesized by sputter-deposition and molecular sublimation

Integrating interfacial molecular nanolayers (MNL) with inorganic nanolayers is of interest for understanding processing-structure/chemistry correlations in hybrid nanolaminates. Here, we report the synthesis of Co/biphenyldithiol (BPDT)/Co nanolayer sandwiches by metal sputter-deposition and molecular sublimation. The density and surface roughness of the Co layers deposited on the native oxide are invariant with the Ar pressure pAr during deposition. In contrast, the Co layer roughness rCo deposited on top of the BPDT MNL increases with pAr, and correlates with a higher degree of Co oxidation. Increased roughening is attributed to MNL-accentuated self-shadowing of low mobility Co atoms at high pAr, which consequently increases Co oxidation. These results indicating MNL-induced effects on the morphology and chemistry of the inorganic layers should be of importance for tailoring nanolayered hybrid interfaces and laminates.

Generalized skew-symmetric interfacial probability distribution in reflectivity and small-angle scattering analysis

Generalized skew-symmetric probability density functions are proposed to model asymmetric interfacial density distributions for the parameterization of any arbitrary density profiles in the `effective-density model'. The penetration of the densities into adjacent layers can be selectively controlled and parameterized. A continuous density profile is generated and discretized into many independent slices of very thin thickness with constant density values and sharp interfaces. The discretized profile can be used to calculate reflectivitiesviaParratt's recursive formula, or small-angle scatteringviathe concentric onion model that is also developed in this work.

Probing the self-assembled nanostructures of functional polymers with synchrotron grazing incidence X-ray scattering

For advanced functional polymers such as biopolymers, biomimic polymers, brush polymers, star polymers, dendritic polymers, and block copolymers, information about their surface structures, morphologies, and atomic structures is essential for understanding their properties and investigating their potential applications. Grazing incidence X-ray scattering (GIXS) is established for the last 15 years as the most powerful, versatile, and nondestructive tool for determining these structural details when performed with the aid of an advanced third-generation synchrotron radiation source with high flux, high energy resolution, energy tunability, and small beam size. One particular merit of this technique is that GIXS data can be obtained facilely for material specimens of any size, type, or shape. However, GIXS data analysis requires an understanding of GIXS theory and of refraction and reflection effects, and for any given material specimen, the best methods for extracting the form factor and the structure factor from the data need to be established. GIXS theory is reviewed here from the perspective of practical GIXS measurements and quantitative data analysis. In addition, schemes are discussed for the detailed analysis of GIXS data for the various self-assembled nanostructures of functional homopolymers, brush, star, and dendritic polymers, and block copolymers. Moreover, enhancements to the GIXS technique are discussed that can significantly improve its structure analysis by using the new synchrotron radiation sources such as third-generation X-ray sources with picosecond pulses and partial coherence and fourth-generation X-ray laser sources with femtosecond pulses and full coherence.

Determination of thickness and optical constants of solgel derived polyvinylpyrrolidone/ZrO2 films from transmission spectra using different dispersion models

Transmission measurements have been used to investigate the optical properties of polyvinylpyrrolidone (PVP)/ZrO(2) films synthesized by the solgel route. The optical constants of PVP/ZrO(2) films deposited on quartz substrates were determined by fitting transmission spectra in the wavelength range of 200-800 nm with the Tauc-Lorentz and Cody-Lorentz physical models. Combined with Urbach tail, both models give a good description of transmission data and reveal that refractive index of film slightly decreases with increasing PVP mass fraction. X-ray reflectivity (XRR) measurements were also performed on PVP/ZrO(2) films to complement the thicknesses. The value of film thickness, including interface information from transmission spectra, is consistent with that result obtained from XRR, indicating that fitting transmission spectrum is a high reliable optical characterization.

Capillary wave fluctuations and intrinsic widths of coupled fluid-fluid interfaces: an x-ray scattering study of a wetting film on bulk liquid

An x-ray specular reflectivity (XR) and off-specular diffuse scattering (XDS) study of the coupled thermal capillary fluctuations and the intrinsic profiles of two interacting fluid-fluid interfaces is presented. The measurements are carried out on complete wetting films of perfluoromethylcyclohexane (PFMC) on the surface of bulk liquid eicosane (C20), as a function of film thickness 30<D<160 A. In order to facilitate the analysis and interpretation of the data with minimal complexity, approximate methods for calculating scattering intensities are developed to take into account the subtleties of thermal diffuse scattering from layered liquid surfaces. With these methods, the calculations of XR/XDS intensities are reduced to a single numerical integration of simple functions in real space. In addition, an analytic expression is derived for small-angle XR that contains Debye-Waller-like factors with effective capillary roughness and takes into account the partial correlations of the two interfaces. The expression for the XR is quantitatively accurate so long as the reflection angle is small enough that the scattering from interfaces is distinguishable from bulk scattering. The results of the XR and XDS data analysis indicate that the capillary fluctuations at the two interfaces of the wetting films are partially correlated and their coupling is consistent with the van der Waals interactions. The relatively large intrinsic width (4 approximately 6A) of the liquid-liquid interface observed for thicker films (D greater than or similar to 50 A) is comparable to the value expected for the bulk liquid-liquid interface (D-->infinity), determined by either the radius of gyration (5.3 A) or the bulk correlation length (4.8 A) of the alkane C20. The intrinsic liquid-vapor interfacial width is sharper (approximately 2 A) and remains essentially constant over the entire probed range of D .

Coupled capillary wave fluctuations in thin aqueous films on an aqueous subphase

X-ray scattering and interfacial tension measurements are used to demonstrate the formation of nanometer-thick aqueous films on aqueous bulk subphases from polymer-salt biphase mixtures. X-ray scattering determines a coupling constant that characterizes the coupled capillary wave fluctuations of the liquid-vapor and liquid-liquid interfaces of this thin film. These data also determine an effective Hamakar constant that characterizes the long-range interaction between the interfaces and parameters that characterize the short-range part of the interfacial interaction.