1
|
Czelej K, Mansoor M, Sarsil MA, Tas M, Sorkhe YA, Mansoor M, Mansoor M, Derin B, Ergen O, Timur S, Ürgen M. Atomistic Origins of Various Luminescent Centers and n-Type Conductivity in GaN: Exploring the Point Defects Induced by Cr, Mn, and O through an Ab Initio Thermodynamic Approach. CHEMISTRY OF MATERIALS : A PUBLICATION OF THE AMERICAN CHEMICAL SOCIETY 2024; 36:6392-6409. [PMID: 39005534 PMCID: PMC11238542 DOI: 10.1021/acs.chemmater.4c00178] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 01/21/2024] [Revised: 06/10/2024] [Accepted: 06/11/2024] [Indexed: 07/16/2024]
Abstract
GaN is a technologically indispensable material for various optoelectronic properties, mainly due to the dopant-induced or native atomic-scale point defects that can create single photon emitters, a range of luminescence bands, and n- or p-type conductivities. Among the various dopants, chromium and manganese-induced defects have been of particular interest over the past few years, because some of them contribute to our present-day light-emitting diode (LED) and spintronic technologies. However, the nature of such atomistic centers in Cr and Mn-doped GaN is yet to be understood. A comprehensive defect thermodynamic analysis of Cr- and Mn-induced defects is essential for their engineering in GaN crystals because by mapping out the defect stabilities as a function of crystal growth parameters, we can maximize the concentration of the target point defects. We therefore investigate chromium and manganese-induced defects in GaN with ab initio methods using the highly accurate exchange-correlation hybrid functionals, and the phase transformations upon excess incorporation of these dopants using the CALPHAD method. We also investigate the impact of oxygen codoping that can be unintentionally incorporated during crystal growth. Our analysis sheds light on the atomistic cause of the unintentional n-type conductivity in GaN, being ON-related. In the case of Cr doping, the formation of CrGa defects is the most dominant, with an E +/0 charge transition at E VBM + 2.19 eV. Increasing nitrogen partial pressure tends to enhance the concentration of CrGa. However, in the case of doping with Mn, several different Mn-related centers can form depending on the growth conditions, with MnGa being the most dominant. MnGa possesses the E 2+/+, E +/0, and E 0/- charge transitions at 0.56, 1.04, and 2.10 eV above the VBM. The incorporation of oxygen tends to cause the formation of the MnGa-VGa center, which explains a series of prior experimental observations in Mn-doped GaN. We provide a powerful tool for point defect engineering in wide band gap binary semiconductors that can be readily used to design optimal crystal growth protocols.
Collapse
Affiliation(s)
- Kamil Czelej
- Faculty
of Chemical and Process Engineering, Warsaw
University of Technology, Waryńskiego 1, 00-645 Warsaw, Poland
- Department
of Complex System Modeling, Institute of Theoretical Physics, Faculty
of Physics, University of Warsaw, Ludwika Pasteura 5, 02-093 Warsaw, Poland
| | - Mubashir Mansoor
- Metallurgical
and Materials Engineering Department, Istanbul
Technical University, 34469 Maslak, Istanbul, Turkey
- Department
of Applied Physics, Istanbul Technical University, 34469 Maslak, Istanbul, Turkey
| | - Mehmet Ali Sarsil
- Department
of Electronics and Communications Engineering, Istanbul Technical University, 34469 Maslak, Istanbul, Turkey
| | - Mert Tas
- Department
of Electronics and Communications Engineering, Istanbul Technical University, 34469 Maslak, Istanbul, Turkey
| | - Yahya A. Sorkhe
- Metallurgical
and Materials Engineering Department, Istanbul
Technical University, 34469 Maslak, Istanbul, Turkey
| | - Mehya Mansoor
- Metallurgical
and Materials Engineering Department, Istanbul
Technical University, 34469 Maslak, Istanbul, Turkey
- Department
of Geological Engineering, Istanbul Technical
University, 34469 Maslak, Istanbul, Turkey
| | - Maryam Mansoor
- Metallurgical
and Materials Engineering Department, Istanbul
Technical University, 34469 Maslak, Istanbul, Turkey
- Nuclear
Engineering Department, Energy Institute, Istanbul Technical University, 34469 Maslak, Istanbul, Turkey
- Department
of Mining Engineering, Istanbul Technical
University, 34469 Maslak, Istanbul, Turkey
| | - Bora Derin
- Metallurgical
and Materials Engineering Department, Istanbul
Technical University, 34469 Maslak, Istanbul, Turkey
| | - Onur Ergen
- Department
of Electronics and Communications Engineering, Istanbul Technical University, 34469 Maslak, Istanbul, Turkey
| | - Servet Timur
- Metallurgical
and Materials Engineering Department, Istanbul
Technical University, 34469 Maslak, Istanbul, Turkey
| | - Mustafa Ürgen
- Metallurgical
and Materials Engineering Department, Istanbul
Technical University, 34469 Maslak, Istanbul, Turkey
| |
Collapse
|
2
|
Syed N, Stacey A, Zavabeti A, Nguyen CK, Haas B, Koch CT, Creedon DL, Della Gaspera E, Reineck P, Jannat A, Wurdack M, Bamford SE, Pigram PJ, Tawfik SA, Russo SP, Murdoch BJ, Kalantar-Zadeh K, McConville CF, Daeneke T. Large Area Ultrathin InN and Tin Doped InN Nanosheets Featuring 2D Electron Gases. ACS NANO 2022; 16:5476-5486. [PMID: 35377615 DOI: 10.1021/acsnano.1c09636] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/14/2023]
Abstract
Indium nitride (InN) has been of significant interest for creating and studying two-dimensional electron gases (2DEG). Herein we demonstrate the formation of 2DEGs in ultrathin doped and undoped 2D InN nanosheets featuring high carrier mobilities at room temperature. The synthesis is carried out via a two-step liquid metal-based printing method followed by a microwave plasma-enhanced nitridation reaction. Ultrathin InN nanosheets with a thickness of ∼2 ± 0.2 nm were isolated over large areas with lateral dimensions exceeding centimeter scale. Room temperature Hall effect measurements reveal carrier mobilities of ∼216 and ∼148 cm2 V-1 s-1 for undoped and doped InN, respectively. Further analysis suggests the presence of defined quantized states in these ultrathin nitride nanosheets that can be attributed to a 2D electron gas forming due to strong out-of-plane confinement. Overall, the combination of electronic and plasmonic features in undoped and doped ultrathin 2D InN holds promise for creating advanced optoelectronic devices and functional 2D heterostructures.
Collapse
Affiliation(s)
- Nitu Syed
- School of Engineering, RMIT University, Melbourne, VIC 3001, Australia
- School of Physics, The University of Melbourne, Parkville, VIC 3010, Australia
| | - Alastair Stacey
- School of Physics, The University of Melbourne, Parkville, VIC 3010, Australia
- School of Science, RMIT University, Melbourne, VIC 3001, Australia
| | - Ali Zavabeti
- Department of Chemical Engineering, The University of Melbourne, Parkville, VIC 3010, Australia
| | - Chung Kim Nguyen
- School of Engineering, RMIT University, Melbourne, VIC 3001, Australia
| | - Benedikt Haas
- Department of Physics & IRIS Adlershof, Humboldt-Universität zu Berlin, 10099 Berlin, Germany
| | - Christoph T Koch
- Department of Physics & IRIS Adlershof, Humboldt-Universität zu Berlin, 10099 Berlin, Germany
| | - Daniel L Creedon
- School of Physics, The University of Melbourne, Parkville, VIC 3010, Australia
| | | | - Philipp Reineck
- ARC Centre of Excellence for Nanoscale BioPhotonics, School of Science, RMIT University, Melbourne, VIC 3001, Australia
| | - Azmira Jannat
- Research School of Physics, The Australian National University, Canberra, ACT 2601, Australia
| | - Matthias Wurdack
- ARC Centre of Excellence in Future Low-Energy Electronics Technologies and Department of Quantum Science and Technology, Research School of Physics, The Australian National University, Canberra, ACT 2601, Australia
| | - Sarah E Bamford
- Centre for Materials and Surface Science and Department of Mathematical and Physical Sciences, La Trobe University, Melbourne, VIC 3086, Australia
| | - Paul J Pigram
- Centre for Materials and Surface Science and Department of Mathematical and Physical Sciences, La Trobe University, Melbourne, VIC 3086, Australia
| | - Sherif Abdulkader Tawfik
- ARC Centre of Excellence in Exciton Science, School of Science, RMIT University, Melbourne, VIC 3001 Australia
- Institute for Frontier Materials, Deakin University, Geelong, VIC 3216, Australia
| | - Salvy P Russo
- School of Science, RMIT University, Melbourne, VIC 3001, Australia
- ARC Centre of Excellence in Exciton Science, School of Science, RMIT University, Melbourne, VIC 3001 Australia
| | - Billy J Murdoch
- RMIT Microscopy and Microanalysis Facility, STEM College, RMIT University, Melbourne, VIC 3001, Australia
| | - Kourosh Kalantar-Zadeh
- School of Chemical Engineering, University of New South Wales (UNSW), Kensington, NSW 2031, Australia
| | - Chris F McConville
- School of Science, RMIT University, Melbourne, VIC 3001, Australia
- Institute for Frontier Materials, Deakin University, Geelong, VIC 3216, Australia
| | - Torben Daeneke
- School of Engineering, RMIT University, Melbourne, VIC 3001, Australia
| |
Collapse
|
3
|
Kim DH, Schweitz MA, Koo SM. Effect of Gas Annealing on the Electrical Properties of Ni/AlN/SiC. MICROMACHINES 2021; 12:mi12030283. [PMID: 33800338 PMCID: PMC7998277 DOI: 10.3390/mi12030283] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 02/17/2021] [Revised: 03/03/2021] [Accepted: 03/05/2021] [Indexed: 12/15/2022]
Abstract
It is shown in this work that annealing of Schottky barrier diodes (SBDs) in the form of Ni/AlN/SiC heterojunction devices in an atmosphere of nitrogen and oxygen leads to a significant improvement in the electrical properties of the structures. Compared to the non-annealed device, the on/off ratio of the annealed SBD devices increased by approximately 100 times. The ideality factor, derived from the current-voltage (IV) characterization, decreased by a factor of ~5.1 after annealing, whereas the barrier height increased from ~0.52 to 0.71 eV. The bonding structure of the AlN layer was characterized by X-ray photoelectron spectroscopy. Examination of the N 1 s and O 1 s peaks provided direct indication of the most prevalent chemical bonding states of the elements.
Collapse
|
4
|
Kim DH, Min SJ, Oh JM, Koo SM. Fabrication and Characterization of Oxygenated AlN/4H-SiC Heterojunction Diodes. MATERIALS 2020; 13:ma13194335. [PMID: 33003505 PMCID: PMC7579660 DOI: 10.3390/ma13194335] [Citation(s) in RCA: 7] [Impact Index Per Article: 1.4] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 08/28/2020] [Revised: 09/23/2020] [Accepted: 09/24/2020] [Indexed: 11/16/2022]
Abstract
The effects of rapid thermal annealing (RTA) on Schottky barrier diodes (SBDs) made from oxygenated aluminum nitride (AlN) thin films deposited on a silicon carbide (SiC) substrate using radio frequency sputtering were investigated. The annealed SBD devices exhibited a 10x increase in the on/off current ratio vs. non-annealed devices for measurement temperatures ranging from 300 K to 450 K. The ideality factor, derived from the current density–voltage (J-V) characterization, increased by a factor of ~2.2 after annealing, whereas the barrier height decreased from ~0.91 to ~0.68 eV. Additionally, Auger electron spectroscopy indicated decreased concentrations of atomic oxygen in the AlN thin film, from ~36% before, to ~24% after annealing. This may have contributed to the reduced barrier height and improved on/off ratio in the annealed AlN/SiC diodes.
Collapse
Affiliation(s)
| | | | - Jong-Min Oh
- Correspondence: (J.-M.O.); (S.-M.K.); Tel.: +82-2-940-5763 (J.-M.O. & S.-M.K.)
| | - Sang-Mo Koo
- Correspondence: (J.-M.O.); (S.-M.K.); Tel.: +82-2-940-5763 (J.-M.O. & S.-M.K.)
| |
Collapse
|
5
|
Coutinho J, Markevich VP, Peaker AR. Characterisation of negative- Udefects in semiconductors. JOURNAL OF PHYSICS. CONDENSED MATTER : AN INSTITUTE OF PHYSICS JOURNAL 2020; 32:323001. [PMID: 32182607 DOI: 10.1088/1361-648x/ab8091] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 02/07/2020] [Accepted: 03/17/2020] [Indexed: 05/25/2023]
Abstract
This review aims at providing a retrospective, as well as a description of the state-of-the-art and future prospects regarding the theoretical and experimental characterisation of negative-Udefects in semiconductors. This is done by complementing the account with a description of the work that resulted in some of the most detailed, and yet more complex defect models in semiconductors. The essential physics underlying the negative-Ubehaviour is presented, including electronic correlation, electron-phonon coupling, disproportionation, defect transition levels and rates. Techniques for the analysis of the experimental data and modelling are also introduced, namely defect statistics, kinetics of carrier capture and emission, defect transformation, configuration coordinate diagrams and other tools. We finally include a showcase of several works that led to the identification of some of the most impacting negative-Udefects in group-IV and compound semiconductors.
Collapse
Affiliation(s)
- José Coutinho
- i3N, Department of Physics, University of Aveiro, Campus Santiago, 3810-193 Aveiro, Portugal
| | - Vladimir P Markevich
- Photon Science Institute, School of Electrical and Electronic Engineering, The University of Manchester, Manchester M13 9PL, United Kingdom
| | - Anthony R Peaker
- Photon Science Institute, School of Electrical and Electronic Engineering, The University of Manchester, Manchester M13 9PL, United Kingdom
| |
Collapse
|
6
|
AlGaN Nanowires for Ultraviolet Light-Emitting: Recent Progress, Challenges, and Prospects. MICROMACHINES 2020; 11:mi11020125. [PMID: 31979274 PMCID: PMC7074201 DOI: 10.3390/mi11020125] [Citation(s) in RCA: 30] [Impact Index Per Article: 6.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 12/21/2019] [Revised: 01/19/2020] [Accepted: 01/22/2020] [Indexed: 12/12/2022]
Abstract
In this paper, we discuss the recent progress made in aluminum gallium nitride (AlGaN) nanowire ultraviolet (UV) light-emitting diodes (LEDs). The AlGaN nanowires used for such LED devices are mainly grown by molecular beam epitaxy (MBE) and metalorganic chemical vapor deposition (MOCVD); and various foreign substrates/templates have been investigated. Devices on Si so far exhibit the best performance, whereas devices on metal and graphene have also been investigated to mitigate various limitations of Si substrate, e.g., the UV light absorption. Moreover, patterned growth techniques have also been developed to grow AlGaN nanowire UV LED structures, in order to address issues with the spontaneously formed nanowires. Furthermore, to reduce the quantum confined Stark effect (QCSE), nonpolar AlGaN nanowire UV LEDs exploiting the nonpolar nanowire sidewalls have been demonstrated. With these recent developments, the prospects, together with the general challenges of AlGaN nanowire UV LEDs, are discussed in the end.
Collapse
|
7
|
Kiarii EM, Govender KK, Govender PP. A theoretical study of 2D AlN on 3D C4H6N6Ni2 clathrate thermoelectric material composites. SN APPLIED SCIENCES 2019. [DOI: 10.1007/s42452-019-1696-5] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/29/2022] Open
|
8
|
Jiang H, Wang XH, Fan GF, Lei W, Fu M, Wang XC, Liang F, Lu WZ. Effect of hot-pressing sintering on thermal and electrical properties of AlN ceramics with impedance spectroscopy and dielectric relaxations analysis. Ann Ital Chir 2019. [DOI: 10.1016/j.jeurceramsoc.2019.08.029] [Citation(s) in RCA: 20] [Impact Index Per Article: 3.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/28/2022]
|
9
|
Ozerov GK, Bezrukov DS, Buchachenko AA. Accommodation of a dimer in an Ar-like lattice: exploring the generic structural motifs. Phys Chem Chem Phys 2019; 21:16549-16563. [PMID: 31313774 DOI: 10.1039/c9cp02119a] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
Abstract
A global optimization strategy is applied to Lennard-Jones models describing the stable trapping sites of a dimer in the face-centered cubic Ar-like lattice. Effective volumes of the trapping sites, quantified as the number of host atoms dislodged from the lattice, are mapped onto the parameter space defined by the strength and range of the dimer interaction potentials. The two models considered differ in the host-guest interaction and give very different maps that reflect the effect of local lattice relaxation. A hierarchical complete-linkage clustering technique is applied to identify generic structural types of the dimer accommodations. The dominant types found and enlisted maintain the symmetry of the isolated dimer and possess high tetrahedral and octahedral symmetry of the host environment with respect to the dimer atoms or center and can be roughly classified as the "whole" or "per atom" dimer accommodations. The results are compared to the analysis of the analogous model for trapped atoms and realistic model for trapped alkaline-earth metal dimers. Implications for matrix isolation spectroscopy are discussed.
Collapse
Affiliation(s)
- Georgiy K Ozerov
- Skolkovo Institute of Science and Technology, Skolkovo Innovation Center, Nobel str. 3, Moscow 121205, Russia
| | - Dmitry S Bezrukov
- Skolkovo Institute of Science and Technology, Skolkovo Innovation Center, Nobel str. 3, Moscow 121205, Russia and Department of Chemistry, M.V. Lomonosov Moscow State University, Moscow 119991, Russia
| | - Alexei A Buchachenko
- Skolkovo Institute of Science and Technology, Skolkovo Innovation Center, Nobel str. 3, Moscow 121205, Russia
| |
Collapse
|
10
|
Syed N, Zavabeti A, Messalea KA, Della Gaspera E, Elbourne A, Jannat A, Mohiuddin M, Zhang BY, Zheng G, Wang L, Russo SP, Dorna Esrafilzadeh, McConville CF, Kalantar-Zadeh K, Daeneke T. Wafer-Sized Ultrathin Gallium and Indium Nitride Nanosheets through the Ammonolysis of Liquid Metal Derived Oxides. J Am Chem Soc 2018; 141:104-108. [PMID: 30571094 DOI: 10.1021/jacs.8b11483] [Citation(s) in RCA: 50] [Impact Index Per Article: 7.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/19/2022]
Abstract
We report the synthesis of centimeter sized ultrathin GaN and InN. The synthesis relies on the ammonolysis of liquid metal derived two-dimensional (2D) oxide sheets that were squeeze-transferred onto desired substrates. Wurtzite GaN nanosheets featured typical thicknesses of 1.3 nm, an optical bandgap of 3.5 eV and a carrier mobility of 21.5 cm2 V-1 s-1, while the InN featured a thickness of 2.0 nm. The deposited nanosheets were highly crystalline, grew along the (001) direction and featured a thickness of only three unit cells. The method provides a scalable approach for the integration of 2D morphologies of industrially important semiconductors into emerging electronics and optical devices.
Collapse
Affiliation(s)
- Nitu Syed
- School of Engineering , RMIT University , Melbourne , Victoria 3001 , Australia
| | - Ali Zavabeti
- School of Engineering , RMIT University , Melbourne , Victoria 3001 , Australia
| | - Kibret A Messalea
- School of Engineering , RMIT University , Melbourne , Victoria 3001 , Australia
| | | | - Aaron Elbourne
- School of Science , RMIT University , Melbourne , Victoria 3001 , Australia
| | - Azmira Jannat
- School of Engineering , RMIT University , Melbourne , Victoria 3001 , Australia
| | - Md Mohiuddin
- School of Engineering , RMIT University , Melbourne , Victoria 3001 , Australia
| | - Bao Yue Zhang
- School of Engineering , RMIT University , Melbourne , Victoria 3001 , Australia
| | - Guolin Zheng
- School of Science , RMIT University , Melbourne , Victoria 3001 , Australia
| | - Lan Wang
- School of Science , RMIT University , Melbourne , Victoria 3001 , Australia
| | - Salvy P Russo
- School of Science , RMIT University , Melbourne , Victoria 3001 , Australia
| | - Dorna Esrafilzadeh
- School of Engineering , RMIT University , Melbourne , Victoria 3001 , Australia
| | - Chris F McConville
- School of Science , RMIT University , Melbourne , Victoria 3001 , Australia
| | - Kourosh Kalantar-Zadeh
- School of Chemical Engineering , University of New South Wales (UNSW) , Kensington , New South Wales 2052 , Australia
| | - Torben Daeneke
- School of Engineering , RMIT University , Melbourne , Victoria 3001 , Australia
| |
Collapse
|
11
|
Parida S, Das A, Prasad AK, Ghatak J, Dhara S. Native defect-assisted enhanced response to CH 4 near room temperature by Al 0.07Ga 0.93N nanowires. Phys Chem Chem Phys 2018; 20:18391-18399. [PMID: 29943784 DOI: 10.1039/c8cp02879f] [Citation(s) in RCA: 7] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
Abstract
Gas sensors at low operating temperature with high sensitivity require group III nitrides owing to their high chemical and thermal stabilities. For the first time, Al0.07Ga0.93N nanowires (NWs) have been utilized in CH4 sensing, and it has been demonstrated that they exhibit an improved response compared to GaN NWs at the low operating temperature of 50 °C. Al0.07Ga0.93N NWs have been synthesized via the ion beam mixing process using inert gas ion irradiation on the bilayer of Al/GaN NWs. The sensing mechanism is explained with the help of native defects present in the system. The number of shallow acceptors created by Ga vacancies (VGa) is found to be higher in Al0.07Ga0.93N NWs than in as-grown GaN NWs. The role of the O antisite defect (ON) for the formation of shallow VGa is inferred from photoluminescence spectroscopic analysis. These native defects strongly influence the gas sensing behaviour, which results in enhanced and low-temperature CH4 sensing.
Collapse
Affiliation(s)
- Santanu Parida
- Surface and Nanoscience Division, Indira Gandhi Centre for Atomic Research, Homi Bhabha National Institute, Kalpakkam-603102, India.
| | | | | | | | | |
Collapse
|
12
|
Cao X, Kawamura F, Ninomiya Y, Taniguchi T, Yamada N. Conduction-band effective mass and bandgap of ZnSnN 2 earth-abundant solar absorber. Sci Rep 2017; 7:14987. [PMID: 29118322 PMCID: PMC5678229 DOI: 10.1038/s41598-017-14850-7] [Citation(s) in RCA: 26] [Impact Index Per Article: 3.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/21/2017] [Accepted: 10/17/2017] [Indexed: 11/10/2022] Open
Abstract
Pseudo III-V nitride ZnSnN2 is an earth-abundant semiconductor with a high optical absorption coefficient in the solar spectrum. Its bandgap can be tuned by controlling the cation sublattice disorder. Thus, it is a potential candidate for photovoltaic absorber materials. However, its important basic properties such as the intrinsic bandgap and effective mass have not yet been quantitatively determined. This paper presents a detailed optical absorption analysis of disordered ZnSnN2 degenerately doped with oxygen (ZnSnN2-x O x ) in the ultraviolet to infrared region to determine the conduction-band effective mass (m c*) and intrinsic bandgap (E g). ZnSnN2-x O x epilayers are n-type degenerate semiconductors, which exhibit clear free-electron absorption in the infrared region. By analysing the free-electron absorption using the Drude model, m c* was determined to be (0.37 ± 0.05)m 0 (m 0 denotes the free electron mass). The fundamental absorption edge in the visible to ultraviolet region shows a blue shift with increasing electron density. The analysis of the blue shift in the framework of the Burstein-Moss effect gives the E g value of 0.94 ± 0.02 eV. We believe that the findings of this study will provide important information to establish this material as a photovoltaic absorber.
Collapse
Affiliation(s)
- Xiang Cao
- Department of Applied Chemistry, Chubu University, Kasugai, 487-8501, Japan.
| | - Fumio Kawamura
- National Institute for Materials Science (NIMS), Tsukuba, 305-0044, Japan
| | - Yoshihiko Ninomiya
- Department of Applied Chemistry, Chubu University, Kasugai, 487-8501, Japan
| | - Takashi Taniguchi
- National Institute for Materials Science (NIMS), Tsukuba, 305-0044, Japan
| | - Naoomi Yamada
- Department of Applied Chemistry, Chubu University, Kasugai, 487-8501, Japan.
| |
Collapse
|
13
|
Chichibu SF, Kojima K, Uedono A, Sato Y. Defect-Resistant Radiative Performance of m-Plane Immiscible Al 1-x In x N Epitaxial Nanostructures for Deep-Ultraviolet and Visible Polarized Light Emitters. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2017; 29:1603644. [PMID: 27882616 DOI: 10.1002/adma.201603644] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/10/2016] [Revised: 09/21/2016] [Indexed: 06/06/2023]
Abstract
Planar vacuum-fluorescent-display devices emitting polarized UV-C, blue, and green light are demonstrated using immiscible Al1-x Inx N nanostructures grown in nonpolar m-directions. Despite the presence of high concentration of nonradiative recombination centers, the Al1-x Inx N nanostructures emit polarized light with the luminescence lifetimes of 22-32 ps at 300 K. This defect-resistant radiative performance suggests supernormal localized characteristics of electron-hole pairs.
Collapse
Affiliation(s)
- Shigefusa F Chichibu
- Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba, Sendai, 980-8577, Japan
| | - Kazunobu Kojima
- Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba, Sendai, 980-8577, Japan
| | - Akira Uedono
- Division of Applied Physics, Faculty of Pure and Applied Sciences, University of Tsukuba, 1-1-1 Tennodai, Tsukuba, 305-8573, Japan
| | - Yoshitaka Sato
- Futaba Corporation, 1080 Yabutsuka, Chosei-mura, Chosei-gun, Chiba, 299-4395, Japan
| |
Collapse
|
14
|
Liang F, Chen P, Zhao DG, Jiang DS, Zhao ZJ, Liu ZS, Zhu JJ, Yang J, Le LC, Liu W, He X, Li XJ, Li X, Liu ST, Yang H, Liu JP, Zhang LQ, Zhang YT, Du GT. XPS study of impurities in Si-doped AlN film. SURF INTERFACE ANAL 2016. [DOI: 10.1002/sia.6037] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/07/2022]
Affiliation(s)
- F. Liang
- State Key Laboratory on Integrated Optoelectronics; Institute of Semiconductors, Chinese Academy of Science; PO BOX 912, Beijing 100083 China
| | - P. Chen
- State Key Laboratory on Integrated Optoelectronics; Institute of Semiconductors, Chinese Academy of Science; PO BOX 912, Beijing 100083 China
| | - D. G. Zhao
- State Key Laboratory on Integrated Optoelectronics; Institute of Semiconductors, Chinese Academy of Science; PO BOX 912, Beijing 100083 China
| | - D. S. Jiang
- State Key Laboratory on Integrated Optoelectronics; Institute of Semiconductors, Chinese Academy of Science; PO BOX 912, Beijing 100083 China
| | - Z. J. Zhao
- Center for Physicochemical Analysis and Measurement; Institute of Chemistry, Chinese Academy of Sciences; Beijing 100190 China
| | - Z. S. Liu
- State Key Laboratory on Integrated Optoelectronics; Institute of Semiconductors, Chinese Academy of Science; PO BOX 912, Beijing 100083 China
| | - J. J. Zhu
- State Key Laboratory on Integrated Optoelectronics; Institute of Semiconductors, Chinese Academy of Science; PO BOX 912, Beijing 100083 China
| | - J. Yang
- State Key Laboratory on Integrated Optoelectronics; Institute of Semiconductors, Chinese Academy of Science; PO BOX 912, Beijing 100083 China
| | - L. C. Le
- State Key Laboratory on Integrated Optoelectronics; Institute of Semiconductors, Chinese Academy of Science; PO BOX 912, Beijing 100083 China
| | - W. Liu
- State Key Laboratory on Integrated Optoelectronics; Institute of Semiconductors, Chinese Academy of Science; PO BOX 912, Beijing 100083 China
| | - X.G. He
- State Key Laboratory on Integrated Optoelectronics; Institute of Semiconductors, Chinese Academy of Science; PO BOX 912, Beijing 100083 China
| | - X. J. Li
- State Key Laboratory on Integrated Optoelectronics; Institute of Semiconductors, Chinese Academy of Science; PO BOX 912, Beijing 100083 China
| | - X Li
- State Key Laboratory on Integrated Optoelectronics; Institute of Semiconductors, Chinese Academy of Science; PO BOX 912, Beijing 100083 China
| | - S. T Liu
- State Key Laboratory on Integrated Optoelectronics; Institute of Semiconductors, Chinese Academy of Science; PO BOX 912, Beijing 100083 China
| | - H. Yang
- Suzhou Institute of Nano-tech and Nano-bionics, Chinese Academy of Sciences; Suzhou 215123 China
| | - J. P. Liu
- Suzhou Institute of Nano-tech and Nano-bionics, Chinese Academy of Sciences; Suzhou 215123 China
| | - L. Q. Zhang
- Suzhou Institute of Nano-tech and Nano-bionics, Chinese Academy of Sciences; Suzhou 215123 China
| | - Y. T. Zhang
- State Key Laboratory on Integrated Optoelectronics; College of Electronic Science and Engineering, Jilin University; Changchun 130023 China
| | - G. T. Du
- State Key Laboratory on Integrated Optoelectronics; College of Electronic Science and Engineering, Jilin University; Changchun 130023 China
| |
Collapse
|
15
|
Sarkar S, Sampath S. Ambient temperature deposition of gallium nitride/gallium oxynitride from a deep eutectic electrolyte, under potential control. Chem Commun (Camb) 2016; 52:6407-10. [PMID: 27074315 DOI: 10.1039/c6cc02487d] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
Abstract
A ternary, ionically conducting, deep eutectic solvent based on acetamide, urea and gallium nitrate is reported for the electrodeposition of gallium nitride/gallium indium nitride under ambient conditions; blue and white light emitting photoluminescent deposits are obtained under potential control.
Collapse
Affiliation(s)
- Sujoy Sarkar
- Department of Inorganic and Physical Chemistry, Indian Institute of Science, Bangalore-560012, India.
| | | |
Collapse
|
16
|
Mitchell B, Timmerman D, Poplawsky J, Zhu W, Lee D, Wakamatsu R, Takatsu J, Matsuda M, Guo W, Lorenz K, Alves E, Koizumi A, Dierolf V, Fujiwara Y. Utilization of native oxygen in Eu(RE)-doped GaN for enabling device compatibility in optoelectronic applications. Sci Rep 2016; 6:18808. [PMID: 26725651 PMCID: PMC4698738 DOI: 10.1038/srep18808] [Citation(s) in RCA: 28] [Impact Index Per Article: 3.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/17/2015] [Accepted: 11/23/2015] [Indexed: 11/25/2022] Open
Abstract
The detrimental influence of oxygen on the performance and reliability of V/III nitride based devices is well known. However, the influence of oxygen on the nature of the incorporation of other co-dopants, such as rare earth ions, has been largely overlooked in GaN. Here, we report the first comprehensive study of the critical role that oxygen has on Eu in GaN, as well as atomic scale observation of diffusion and local concentration of both atoms in the crystal lattice. We find that oxygen plays an integral role in the location, stability, and local defect structure around the Eu ions that were doped into the GaN host. Although the availability of oxygen is essential for these properties, it renders the material incompatible with GaN-based devices. However, the utilization of the normally occurring oxygen in GaN is promoted through structural manipulation, reducing its concentration by 2 orders of magnitude, while maintaining both the material quality and the favorable optical properties of the Eu ions. These findings open the way for full integration of RE dopants for optoelectronic functionalities in the existing GaN platform.
Collapse
Affiliation(s)
- B Mitchell
- Department of Physics and Astronomy, University of Mount. Union, 1972 Clark Ave, Alliance, OH, 44601, USA
| | - D Timmerman
- Division of Materials and Manufacturing Science, Graduate School of Engineering, Osaka University, Suita, Osaka 565-0871, Japan
| | - J Poplawsky
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
| | - W Zhu
- Division of Materials and Manufacturing Science, Graduate School of Engineering, Osaka University, Suita, Osaka 565-0871, Japan
| | - D Lee
- Division of Materials and Manufacturing Science, Graduate School of Engineering, Osaka University, Suita, Osaka 565-0871, Japan
| | - R Wakamatsu
- Division of Materials and Manufacturing Science, Graduate School of Engineering, Osaka University, Suita, Osaka 565-0871, Japan
| | - J Takatsu
- Division of Materials and Manufacturing Science, Graduate School of Engineering, Osaka University, Suita, Osaka 565-0871, Japan
| | - M Matsuda
- Division of Materials and Manufacturing Science, Graduate School of Engineering, Osaka University, Suita, Osaka 565-0871, Japan
| | - W Guo
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
| | - K Lorenz
- Instituto Superior Técnico, Campus Tecnológico e Nuclear, Estrada Nacional 10, P-2695-066 Bobadela LRS, Portugal
| | - E Alves
- Instituto Superior Técnico, Campus Tecnológico e Nuclear, Estrada Nacional 10, P-2695-066 Bobadela LRS, Portugal
| | - A Koizumi
- Division of Materials and Manufacturing Science, Graduate School of Engineering, Osaka University, Suita, Osaka 565-0871, Japan
| | - V Dierolf
- Department of Physics and Astronomy, Lehigh University, 16 Memorial Dr. E, Bethlehem, PA, 18015, USA
| | - Y Fujiwara
- Division of Materials and Manufacturing Science, Graduate School of Engineering, Osaka University, Suita, Osaka 565-0871, Japan
| |
Collapse
|
17
|
Kioseoglou J, Pontikis V, Komninou P, Pavloudis T, Chen J, Karakostas T. Energetic, structural and electronic properties of metal vacancies in strained AlN/GaN interfaces. JOURNAL OF PHYSICS. CONDENSED MATTER : AN INSTITUTE OF PHYSICS JOURNAL 2015; 27:125006. [PMID: 25693505 DOI: 10.1088/0953-8984/27/12/125006] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/04/2023]
Abstract
AlN/GaN heterostructures have been studied using density-functional pseudopotential calculations yielding the formation energies of metal vacancies under the influence of local interfacial strains, the associated charge distribution and the energies of vacancy-induced electronic states. Interfaces are built normal to the polar <0 0 0 1> direction of the wurtzite structure by joining two single crystals of AlN and GaN that are a few atomic layers thick; thus, periodic boundary conditions generate two distinct heterophase interfaces. We show that the formation energy of vacancies is a function of their distance from the interfaces: the vacancy-interface interaction is found repulsive or attractive, depending on the type of the interface. When the interaction is attractive, the vacancy formation energy decreases with increasing the associated electric charge, and hence the equilibrium vacancy concentration at the interface is greater. This finding can reveal the well-known morphological differences existing between the two types of investigated interfaces. Moreover, we found that the electric charge is strongly localized around the Ga vacancy, while in the case of Al vacancies is almost uniformly distributed throughout the AlN/GaN heterostructure. Crucially, for the applications of heterostructures, metal vacancies introduce deep states in the calculated bandgap at energy levels from 0.5 to 1 eV above the valence band maximum (VBM). It is, therefore, predicted that vacancies could initiate 'green luminescence' i.e. light emission in the energy range of 2.5 eV stemming from electronic transitions between these extra levels, and the conduction band, or energy levels, due to shallow donors.
Collapse
Affiliation(s)
- J Kioseoglou
- Physics Department, Aristotle University of Thessaloniki, GR-54124 Thessaloniki, Greece
| | | | | | | | | | | |
Collapse
|
18
|
Van de Walle CG, Stampfl C, Neugebauer J, McCluskey MD, Johnson NM. Doping of AlGaN Alloys. ACTA ACUST UNITED AC 2014. [DOI: 10.1557/s1092578300003574] [Citation(s) in RCA: 21] [Impact Index Per Article: 1.9] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/13/2022]
Abstract
Nitride-based device structures for electronic and optoelectronic applications usually incor-porate layers of AlxGa1−xN, and n- and p-type doping of these alloys is typically required. Experimental results indicate that doping efficiencies in AlxGa1−xN are lower than in GaN. We address the cause of these doping difficulties, based on results from first-principles density-functional-pseudopotential calculations. For n-type doping we will discuss doping with oxygen, the most common unintentional donor, and with silicon. For oxygen, a DX transition occurs which converts the shallow donor into a negatively charged deep level. We present experimental evidence that oxygen is a DX center in AlxGa1−xN for x>∼0.3. For p-type doping, we find that compensation by nitrogen vacancies becomes increasingly important as the Al content is in-creased. We also find that the ionization energy of the Mg acceptor increases with alloy composition x. To address the limitations on p-type doping we have performed a comprehensive investigation of alternative acceptor impurities; none of the candidates exhibits characteristics that surpass those of Mg in all respects.
Collapse
|
19
|
Gillen R, Robertson J. A hybrid density functional view of native vacancies in gallium nitride. JOURNAL OF PHYSICS. CONDENSED MATTER : AN INSTITUTE OF PHYSICS JOURNAL 2013; 25:405501. [PMID: 24025763 DOI: 10.1088/0953-8984/25/40/405501] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/02/2023]
Abstract
We investigated the transition energy levels of the vacancy defects in gallium nitride by means of a hybrid density functional theory approach (DFT). We show that, in contrast to predictions from a recent study on the level of purely local DFT, the inclusion of screened exchange stabilizes the triply positive charge state of the nitrogen vacancy for Fermi energies close to the valence band. On the other hand, the defect levels associated with the negative charge states of the nitrogen vacancy hybridize with the conduction band and turn out to be energetically unfavorable, except for high n-doping. For the gallium vacancy, the increased magnetic splitting between up-spin and down-spin bands due to stronger exchange interactions in sX-LDA pushes the defect levels deeper into the band gap and significantly increases the associated charge transition levels. Based on these results, we propose the ϵ(0| - 1) transition level as an alternative candidate for the yellow luminescence in GaN.
Collapse
Affiliation(s)
- Roland Gillen
- Department of Engineering, University of Cambridge, Cambridge CB3 0FA, UK
| | | |
Collapse
|
20
|
Silicon and Oxygen in High-Al-Content AlGaN: Incorporation Kinetics and Electron Paramagnetic Resonance Study. ACTA ACUST UNITED AC 2013. [DOI: 10.4028/www.scientific.net/ssp.205-206.441] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
Abstract
The high-Al-content AlxGa1-xN alloys, x>0.70, and AlN is the fundamental wide-band-gap material system associated with the technology development of solid-state LEDs operating at the short wavelengths in the deep-UV (λ < 280 nm). Yet, their properties are insufficiently understood. The present study is intended to bring elucidation on the long-time debated and much speculated Si transition from shallow donor in GaN to a localized deep DX defect in AlxGa1-xN alloys with increasing Al content. For that purpose electron paramagnetic resonance is performed on a particular selection of high-Al-content epitaxial layers of Al0.77Ga0.23N, alternatively Al0.72Ga0.28N, alloy composition.
Collapse
|
21
|
Liu F, Li L, Guo T, Gan H, Mo X, Chen J, Deng S, Xu N. Investigation on the photoconductive behaviors of an individual AlN nanowire under different excited lights. NANOSCALE RESEARCH LETTERS 2012; 7:454. [PMID: 22883472 PMCID: PMC3502526 DOI: 10.1186/1556-276x-7-454] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/12/2012] [Accepted: 07/27/2012] [Indexed: 05/22/2023]
Abstract
Ultra-long AlN nanowire arrays are prepared by chemical vapor deposition, and the photoconductive performances of individual nanowires are investigated in our self-built measurement system. Individual ultra-long AlN nanowire (UAN) exhibits a clear photoconductive effect under different excited lights. We attribute the positive photocurrent response of individual UAN to the dominant molecular sensitization effect. It is found that they have a much faster response speed (a rise and decay time of about 1 ms), higher photocurrent response (2.7×106), and more reproductive working performance (the photocurrent fluctuation is lower than 2%) in the air environment. Their better photoconductive performances are comparable to many nanostructures, which are suggested to be a candidate for building promising photosensitive nanodevices in the future.
Collapse
Affiliation(s)
- Fei Liu
- State Key Laboratory of Optoelectronic Materials and Technologies, Guangdong Province Key Laboratory of Display Material and Technology, Sun Yat-sen University, Guangzhou, 510275, People’s Republic of China
- School of Physics and Engineering, Sun Yat-sen University, Guangzhou, 510275, People’s Republic of China
| | - Lifang Li
- State Key Laboratory of Optoelectronic Materials and Technologies, Guangdong Province Key Laboratory of Display Material and Technology, Sun Yat-sen University, Guangzhou, 510275, People’s Republic of China
- School of Physics and Engineering, Sun Yat-sen University, Guangzhou, 510275, People’s Republic of China
| | - Tongyi Guo
- State Key Laboratory of Optoelectronic Materials and Technologies, Guangdong Province Key Laboratory of Display Material and Technology, Sun Yat-sen University, Guangzhou, 510275, People’s Republic of China
- School of Physics and Engineering, Sun Yat-sen University, Guangzhou, 510275, People’s Republic of China
| | - Haibo Gan
- State Key Laboratory of Optoelectronic Materials and Technologies, Guangdong Province Key Laboratory of Display Material and Technology, Sun Yat-sen University, Guangzhou, 510275, People’s Republic of China
- School of Physics and Engineering, Sun Yat-sen University, Guangzhou, 510275, People’s Republic of China
| | - Xiaoshu Mo
- State Key Laboratory of Optoelectronic Materials and Technologies, Guangdong Province Key Laboratory of Display Material and Technology, Sun Yat-sen University, Guangzhou, 510275, People’s Republic of China
- School of Physics and Engineering, Sun Yat-sen University, Guangzhou, 510275, People’s Republic of China
| | - Jun Chen
- State Key Laboratory of Optoelectronic Materials and Technologies, Guangdong Province Key Laboratory of Display Material and Technology, Sun Yat-sen University, Guangzhou, 510275, People’s Republic of China
- School of Physics and Engineering, Sun Yat-sen University, Guangzhou, 510275, People’s Republic of China
| | - Shaozhi Deng
- State Key Laboratory of Optoelectronic Materials and Technologies, Guangdong Province Key Laboratory of Display Material and Technology, Sun Yat-sen University, Guangzhou, 510275, People’s Republic of China
- School of Physics and Engineering, Sun Yat-sen University, Guangzhou, 510275, People’s Republic of China
| | - Ningsheng Xu
- State Key Laboratory of Optoelectronic Materials and Technologies, Guangdong Province Key Laboratory of Display Material and Technology, Sun Yat-sen University, Guangzhou, 510275, People’s Republic of China
- School of Physics and Engineering, Sun Yat-sen University, Guangzhou, 510275, People’s Republic of China
| |
Collapse
|
22
|
Tang YB, Bo XH, Xu J, Cao YL, Chen ZH, Song HS, Liu CP, Hung TF, Zhang WJ, Cheng HM, Bello I, Lee ST, Lee CS. Tunable p-type conductivity and transport properties of AlN nanowires via Mg doping. ACS NANO 2011; 5:3591-8. [PMID: 21480640 DOI: 10.1021/nn200963k] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/08/2023]
Abstract
Arrays of well-aligned AlN nanowires (NWs) with tunable p-type conductivity were synthesized on Si(111) substrates using bis(cyclopentadienyl)magnesium (Cp(2)Mg) vapor as a doping source by chemical vapor deposition. The Mg-doped AlN NWs are single-crystalline and grow along the [001] direction. Gate-voltage-dependent transport measurements on field-effect transistors constructed from individual NWs revealed the transition from n-type conductivity in the undoped AlN NWs to p-type conductivity in the Mg-doped NWs. By adjusting the doping gas flow rate (0-10 sccm), the conductivity of AlN NWs can be tuned over 7 orders of magnitude from (3.8-8.5) × 10(-6) Ω(-1) cm(-1) for the undoped sample to 15.6-24.4 Ω(-1) cm(-1) for the Mg-doped AlN NWs. Hole concentration as high as 4.7 × 10(19) cm(-3) was achieved for the heaviest doping. In addition, the maximum hole mobility (∼6.4 cm(2)/V s) in p-type AlN NWs is much higher than that of Mg-doped AlN films (∼1.0 cm(2)/V s). (2) The realization of p-type AlN NWs with tunable electrical transport properties may open great potential in developing practical nanodevices such as deep-UV light-emitting diodes and photodetectors.
Collapse
Affiliation(s)
- Yong-Bing Tang
- Center of Super-Diamond and Advanced Films (COSDAF) and Department of Physics and Materials Science, City University of Hong Kong, Hong Kong SAR, People's Republic of China
| | | | | | | | | | | | | | | | | | | | | | | | | |
Collapse
|
23
|
Liu BY, Wu AM, Qin FW. Crystallography and cathodoluminescence of ultra-long GaN nanowires. CRYSTAL RESEARCH AND TECHNOLOGY 2011. [DOI: 10.1002/crat.201100064] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/10/2022]
|
24
|
Pei LZ, Wang JF, Yang LJ, Dong YP, Wang SB, Fan CG, Hu JL, Zhang QF. Preparation of copper germanate nanowires with good electrochemical sensing properties. CRYSTAL RESEARCH AND TECHNOLOGY 2010. [DOI: 10.1002/crat.201000522] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/06/2022]
|
25
|
Giorgi G, Van Schilfgaarde M, Korkin A, Yamashita K. On the Chemical Origin of the Gap Bowing in (GaAs)(1-x)Ge(2x) Alloys: A Combined DFT-QSGW Study. NANOSCALE RESEARCH LETTERS 2010; 5:469-477. [PMID: 20671794 PMCID: PMC2893788 DOI: 10.1007/s11671-009-9516-2] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 11/20/2009] [Accepted: 12/17/2009] [Indexed: 05/29/2023]
Abstract
Motivated by the research and analysis of new materials for photovoltaics and by the possibility of tailoring their optical properties for improved solar energy conversion, we have focused our attention on the (GaAs)(1-x)Ge(2x) series of alloys. We have investigated the structural properties of some (GaAs)(1-x)Ge(2x) compounds within the local-density approximation to density-functional theory, and their optical properties within the Quasiparticle Self-consistent GW approximation. The QSGW results confirm the experimental evidence of asymmetric bandgap bowing. It is explained in terms of violations of the octet rule, as well as in terms of the order-disorder phase transition.
Collapse
Affiliation(s)
- Giacomo Giorgi
- Department of Chemical System Engineering, School of Engineering, University of Tokyo, Tokyo, 113-8656, Japan
| | | | | | - Koichi Yamashita
- Department of Chemical System Engineering, School of Engineering, University of Tokyo, Tokyo, 113-8656, Japan
| |
Collapse
|
26
|
Yazdi GR, Persson POA, Gogova D, Fornari R, Hultman L, Syväjärvi M, Yakimova R. Aligned AlN nanowires by self-organized vapor-solid growth. NANOTECHNOLOGY 2009; 20:495304. [PMID: 19904025 DOI: 10.1088/0957-4484/20/49/495304] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/28/2023]
Abstract
Highly oriented AlN single crystal nanowires with aspect ratio up to 600, diameter in the range of 40-500 nm, and 100 microm lengths, have been synthesized via a vapor-solid growth mechanism. The results were obtained at 1750 degrees C and 850 mbar nitrogen pressure on vicinal SiC substrates pretreated by SiC sublimation epitaxy in order to attain distinguishable terraces. It was found that the nanowires change in thickness after they have reached a critical length, and this fact contributes to an understanding of the growth mechanism of AlN nanowires. The nanowires are hexagonally shaped and perfectly aligned along the [0001] direction with a small tilt given by the substrate vicinality. Under nitrogen excess a preferential growth along the c-axis of the wurtzite structure takes place while below some critical value of nitrogen pressure the growth mode switches to lateral. The AlN nanowires are shown to have a dislocation free wurtzite crystal structure. Some possible applications are discussed.
Collapse
Affiliation(s)
- G R Yazdi
- Department of Physics, Chemistry, and Biology (IFM), Linköping University, SE-581 83 Linköping, Sweden.
| | | | | | | | | | | | | |
Collapse
|
27
|
Pei LZ, Zhao HS, Tan W, Yu HY, Chen YW, Zhang QF, Fan CG. Low temperature growth and characterizations of single crystalline CuGeO3 nanowires. CrystEngComm 2009. [DOI: 10.1039/b900837n] [Citation(s) in RCA: 38] [Impact Index Per Article: 2.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
|
28
|
Zheng J, Yang Y, Yu B, Song X, Li X. [0001] oriented aluminum nitride one-dimensional nanostructures: synthesis, structure evolution, and electrical properties. ACS NANO 2008; 2:134-42. [PMID: 19206557 DOI: 10.1021/nn700363t] [Citation(s) in RCA: 15] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/08/2023]
Abstract
This paper presents a systematic investigation on the controlled synthesis of wurtzite aluminum nitride (AlN) one-dimensional (1D) nanostructures in a chemical vapor deposition (CVD) system using Al and NH(3) as starting materials. By controlling reaction temperature and NH(3) flow, nanostructures with manifold morphologies including nanoneedles, branched nanoneedles, short nanorods, slim nanorods, and nanofences were synthesized with high yield and selectivity. The correlation between experiment parameters and product morphologies was interpreted by a surface diffusion based model. Moreover, electrical properties of a single nanoneedle were studied for the first time, in which typical semiconductor characteristics were observed. Silicon was speculated to incorporate into the AlN nanoneedle from silicon substrates during the synthesis, which served as an n-type donor and was responsible for the observed electrical behavior.
Collapse
Affiliation(s)
- Jie Zheng
- Beijing National Laboratory for Molecular Sciences (The State Key Laboratory of Rare Earth Materials Chemistry and Applications), College of Chemistry and Molecular Engineering, Peking University, Beijing 100871, P R China
| | | | | | | | | |
Collapse
|
29
|
Nakano T, Shirai M, Miura Y, Nagao K. The computational materials design of (Ga, Cr)N: effects of co-doping on exchange interactions. JOURNAL OF PHYSICS. CONDENSED MATTER : AN INSTITUTE OF PHYSICS JOURNAL 2007; 19:365238. [PMID: 21694183 DOI: 10.1088/0953-8984/19/36/365238] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/30/2023]
Abstract
We investigate the effect of O or Be co-doping on the exchange interaction between Cr spins in (Ga, Cr)N by means of first-principles calculations based on the density-functional theory. The ferromagnetic exchange interactions are reduced by doping Be around Cr. On the other hand, O doping reduces the ferromagnetic interaction remarkably only for the case of Cr-O-Cr complex formation. The enhancement of the ferromagnetic exchange interaction cannot be achieved by doping O or Be impurities. However, the O and Be impurities can help the clustering of Cr atoms due to the enhancement of the attractive interaction between Cr atoms.
Collapse
Affiliation(s)
- Tatsuya Nakano
- Research Institute of Electrical Communication, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan
| | | | | | | |
Collapse
|
30
|
Jian JK, Chen XL, Tu QY, Xu YP, Dai L, Zhao M. Preparation and Optical Properties of Prism-Shaped GaN Nanorods. J Phys Chem B 2004. [DOI: 10.1021/jp048420o] [Citation(s) in RCA: 60] [Impact Index Per Article: 2.9] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/29/2022]
Affiliation(s)
- J. K. Jian
- Nanoscale Physics and Devices Laboratory, Institute of Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing 100080, People's Republic of China
| | - X. L. Chen
- Nanoscale Physics and Devices Laboratory, Institute of Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing 100080, People's Republic of China
| | - Q. Y. Tu
- Nanoscale Physics and Devices Laboratory, Institute of Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing 100080, People's Republic of China
| | - Y. P. Xu
- Nanoscale Physics and Devices Laboratory, Institute of Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing 100080, People's Republic of China
| | - L. Dai
- Nanoscale Physics and Devices Laboratory, Institute of Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing 100080, People's Republic of China
| | - M. Zhao
- Nanoscale Physics and Devices Laboratory, Institute of Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing 100080, People's Republic of China
| |
Collapse
|
31
|
Bickermann M, Epelbaum BM, Winnacker A. PVT growth of bulk AlN crystals with low oxygen contamination. ACTA ACUST UNITED AC 2003. [DOI: 10.1002/pssc.200303280] [Citation(s) in RCA: 29] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/11/2022]
|
32
|
Arslan I, Browning ND. Role of oxygen at screw dislocations in GaN. PHYSICAL REVIEW LETTERS 2003; 91:165501. [PMID: 14611410 DOI: 10.1103/physrevlett.91.165501] [Citation(s) in RCA: 11] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/05/2003] [Indexed: 05/24/2023]
Abstract
Here we report the first direct atomic scale experimental observations of oxygen segregation to screw dislocations in GaN using correlated techniques in the scanning transmission electron microscope. The amount of oxygen present in each of the three distinct types of screw dislocation core is found to depend on the evolution and structure of the core, and thus gives rise to a varying concentration of localized states in the band gap. Contrary to previous theoretical predictions, the substitution of oxygen for nitrogen is observed to extend over many monolayers for the open core dislocation.
Collapse
Affiliation(s)
- I Arslan
- Department of Physics, University of California-Davis, 1 Shields Avenue, Davis, California 95616, USA
| | | |
Collapse
|
33
|
Tran NH, Holzschuh WJ, Lamb RN, Lai LJ, Yang YW. Structural Order in Oxygenated Gallium Nitride Films. J Phys Chem B 2003. [DOI: 10.1021/jp034990x] [Citation(s) in RCA: 17] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/28/2022]
|
34
|
Ranade MR, Tessier F, Navrotsky A, Leppert VJ, Risbud SH, DiSalvo FJ, Balkas CM. Enthalpy of Formation of Gallium Nitride. J Phys Chem B 2000. [DOI: 10.1021/jp993752s] [Citation(s) in RCA: 54] [Impact Index Per Article: 2.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/30/2022]
Affiliation(s)
- M. R. Ranade
- University of California at Davis, Department of Chemical Engineering and Materials Science, Davis, California 95616, Department of Chemistry and Chemical Biology, Cornell University, Ithaca, New York 14853, and Sterling Semiconductor, Inc., Sterling, Virginia 20166
| | - F. Tessier
- University of California at Davis, Department of Chemical Engineering and Materials Science, Davis, California 95616, Department of Chemistry and Chemical Biology, Cornell University, Ithaca, New York 14853, and Sterling Semiconductor, Inc., Sterling, Virginia 20166
| | - A. Navrotsky
- University of California at Davis, Department of Chemical Engineering and Materials Science, Davis, California 95616, Department of Chemistry and Chemical Biology, Cornell University, Ithaca, New York 14853, and Sterling Semiconductor, Inc., Sterling, Virginia 20166
| | - V. J. Leppert
- University of California at Davis, Department of Chemical Engineering and Materials Science, Davis, California 95616, Department of Chemistry and Chemical Biology, Cornell University, Ithaca, New York 14853, and Sterling Semiconductor, Inc., Sterling, Virginia 20166
| | - S. H. Risbud
- University of California at Davis, Department of Chemical Engineering and Materials Science, Davis, California 95616, Department of Chemistry and Chemical Biology, Cornell University, Ithaca, New York 14853, and Sterling Semiconductor, Inc., Sterling, Virginia 20166
| | - F. J. DiSalvo
- University of California at Davis, Department of Chemical Engineering and Materials Science, Davis, California 95616, Department of Chemistry and Chemical Biology, Cornell University, Ithaca, New York 14853, and Sterling Semiconductor, Inc., Sterling, Virginia 20166
| | - C. M. Balkas
- University of California at Davis, Department of Chemical Engineering and Materials Science, Davis, California 95616, Department of Chemistry and Chemical Biology, Cornell University, Ithaca, New York 14853, and Sterling Semiconductor, Inc., Sterling, Virginia 20166
| |
Collapse
|