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For: Guo X, Canney S, Kheifets AS, Vos M, Fang Z, Utteridge S, McCarthy IE, Weigold E. Electronic-structure investigation of oxidized aluminum films with electron-momentum spectroscopy. Phys Rev B Condens Matter 1996;54:17943-17953. [PMID: 9985929 DOI: 10.1103/physrevb.54.17943] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]

For:	Guo X, Canney S, Kheifets AS, Vos M, Fang Z, Utteridge S, McCarthy IE, Weigold E. Electronic-structure investigation of oxidized aluminum films with electron-momentum spectroscopy. Phys Rev B Condens Matter 1996;54:17943-17953. [PMID: 9985929 DOI: 10.1103/physrevb.54.17943] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]

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(The first 100,000 artilces are displayed in RCA.)