Interfacial roughness and related growth mechanisms in sputtered W/Si multilayers

Lamellar nanoporous gold thin films with tunable porosity for ultrasensitive SERS detection in liquid and gas phase

Lamellar nanoporous gold thin films, constituted of a stack of very thin layers of porous gold, are synthesized by chemical etching from a stack of successively deposited nanolayers of copper and gold. The gold ligament size, the pore size and the distance between lamellas are tunable in the few tens nanometer range by controlling the initial thickness of the layers and the etching time. The SERS activity of these lamellar porous gold films is characterized by their SERS responses after adsorption of probe bipyridine and naphtalenethiol molecules. The SERS signal is investigated as a function of the bipyridine concentration from 10^-14 mol L^-1 to 10^-3 mol L^-1. The higher SERS response corresponds to an experimental detection limit down to 10^-12 mol L^-1. These performance is mainly attributed to the specific nanoporous gold architecture and the larger accessible surface to volume ratio. The lamellar nanoporous gold substrate is explored for sensitive SERS detection of dimethyl methylphosphonate (DMMP), a surrogate molecule of the highly toxic G-series nerve agents. The resultant nanostructure facilitates the diffusion of target molecules through the nanopores and their localization at the enhancing metallic surface leading to the unequivocal Raman signature of DMMP at a concentration of 5 parts per million.

Roughness replication in neutron supermirrors

Neutron supermirrors (SMs), the major components of neutron optical devices, are depth-graded d-spacing multilayers of several hundreds to several thousands of bilayers. The interface roughness is a major factor in the reflectivity of multilayers. This influence is especially significant if the number of bilayers is large. In this work, the interface roughness and its correlations were studied in DC-sputtered Ni–Ti neutron supermirrors. Detector scans were carried out to observe off-specular neutron scattering in selected regions of the q space from (increasing bilayer thickness) normal- and (decreasing bilayer thickness) reverse-layer-sequence SMs. In-plane and out-of-plane roughness correlations are manifested in diffuse scatter plateaus and peaks which are interpreted in terms of resonant diffuse scattering. Distorted wave Born approximation simulations quantitatively reproduce the characteristic features of the measured detector scans with reasonable roughness correlation parameters, i.e. in-plane and out-of-plane correlation lengths, common interface roughness, and Hurst parameters. The different character of resonant diffuse scattering from normal- and reverse-layer-sequence SMs is qualitatively explained and systematized using quasi-kinematical considerations in terms of material and SM parameters. The total off-specular intensity of the supermirrors was found to be non-monotonic with respect to the specular reflectivity at the corresponding angle of incidence.

Role of dynamic effects in the characterization of multilayers by means of power spectral density

In this paper, we present measurements of angle- and wavelength-resolved diffuse scattering of EUV radiation on a Mo/Si multilayer. Our sample is optimized for high reflectivity at 13.5 nm wavelength near-normal incidence. We present a rigorous theoretical analysis of the off-specular EUV scattering on the basis of the distorted-wave Born approximation. We prove that the determination of the interface roughness power spectral density (PSD) is only possible by considering geometry-dependent and dynamic contributions. The scattering from multilayer mirrors leads to an intrinsic enhancement in off-specular intensity independent of roughness properties. The thickness oscillations in the scattering intensity (Kiessig fringes) are found to cause additional dynamic enhancement in analogy to Bragg-like peaks for grazing incidence geometry. Considering these effects, the interface PSD is consistently determined.

Integration method for directly analyzing interface statistics of periodic multilayers from X-ray scattering

An integration method is demonstrated for directly determining the average interface statistics of periodic multilayers from the X-ray scattering diagram. By measuring the X-ray scattering diagram in the out-of-plane geometry and integrating the scattered intensity along the vertical momentum transfer qz in an interval, which is decided by the thickness ratio Γ (ratio of sublayer's thickness to periodic thickness), the cross-correlations between different interfaces are canceled and only the autocorrelations are reserved. Then the multilayer can be treated as a `single interface' and the average power spectral density can be obtained without assuming any vertical correlation model. This method has been employed to study the interface morphology of sputter-deposited W/Si multilayers grown at an Ar pressure of 1-7 mTorr. The results show an increase in vertical correlation length and a decrease in lateral correlation length with increased Ar pressure. The static roughness exponent α = 0 and dynamic growth exponent z = 2 indicate the Edwards-Wilkinson growth model at an Ar pressure of 1-5 mTorr. At an Ar pressure of 7 mTorr, α = 0.35 and z = 1.65 indicate the Kardar-Parisi-Zhang growth model.

Interface study of a high-performance W/B4C X-ray mirror

A high-performance W/B4C multilayer mirror with 80 periods of nominally 1.37 nm was measured by grazing-incidence small-angle X ray scattering (GISAXS) in order to analyse the lateral and vertical correlations of the interface roughness within the framework of a scaling concept of multilayer growth. A dynamic growth exponentz= 2.19 (7) was derived, which is close to the value predicted by the Edwards–Wilkinson growth model. The effective number of correlated periods indicates a partial replication of the low interface roughness frequencies. A simulation of the GISAXS pattern based on the Born approximation suggests a zero Hurst fractal parameterHand a logarithmic type of autocorrelation function. The as-deposited mirror layers are amorphous and exhibit excellent thermal stability up to 1248 K in a 120 s rapid thermal vacuum annealing process. At higher temperatures, the B4C layers decompose and poorly developed crystallites of a boron-rich W–B hexagonal phase are formed, and yet multilayer collapse is not complete even at 1273 K. Ozone treatment for 3000 s in a reactor with an ozone concentration of 150 mg m−3results in the formation of an oxidized near-surface region of a thickness approaching ∼10% of the total multilayer thickness, with a tendency to saturation.

Structure of PbTe(SiO2)/SiO2multilayers deposited on Si(111)

The structure of thin films composed of a multilayer of PbTe nanocrystals embedded in SiO2, named as PbTe(SiO2), between homogeneous layers of amorphous SiO2deposited on a single-crystal Si(111) substrate was studied by grazing-incidence small-angle X-ray scattering (GISAXS) as a function of PbTe content. PbTe(SiO2)/SiO2multilayers were produced by alternately applying plasma-enhanced chemical vapour deposition and pulsed laser deposition techniques. From the analysis of the experimental GISAXS patterns, the average radius and radius dispersion of PbTe nanocrystals were determined. With increasing deposition dose the size of the PbTe nanocrystals progressively increases while their number density decreases. Analysis of the GISAXS intensity profiles along the normal to the sample surface allowed the determination of the period parameter of the layers and a structure parameter that characterizes the disorder in the distances between PbTe layers.

Layer-by-layer self-assembly of supramolecular and biomolecular films

In this paper, we give a short account on recent studies of layer-by-layer self-assembly of supramolecular and biomolecular films. Such films are built up from layers of macro-ions with opposing charge. A simple film can be obtained by alternating the adsorption of two components: a flexible, synthetic polycation chains and a supramolecular or biomolecular moiety. We focus on three examples, in which the second component consists either of a supramolecular metal-organic complex (MOC), a nucleic acid, or a biological membrane patch (purple membrane). While the flexible polvcation chains (as well as eventual annealing layers) ensure a uniform build-up of the chain, the second macromolecular component may be used to functionalize the films. The combination of layer-by-layer self-assembly and biotechnologically relevant macromolecules may lead to new devices or biomaterial applications. To this end, precise studies of the deposition process and the film structure are needed. Here, we focus on interface sensitive scattering techniques for the structural analysis.

Specular and diffuse scattering of highly aligned phospholipid membranes

We present a quantitative study of specular and diffuse (non-specular) x-ray and neutron reflectivity from highly aligned phospholipid membranes deposited on solid substrates. The height-height correlation function could be obtained from the diffuse scattering without further model assumptions. The results differ significantly from the linear theory of smectic elasticity. We argue that the diffuse scattering is dominated by static liquid-crystalline defects, rather than thermal fluctuations.