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For: Wu YN, Zhang XG, Pantelides ST. Fundamental Resolution of Difficulties in the Theory of Charged Point Defects in Semiconductors. Phys Rev Lett 2017;119:105501. [PMID: 28949192 DOI: 10.1103/physrevlett.119.105501] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/23/2017] [Indexed: 06/07/2023]
Number Cited by Other Article(s)
1
Ma R, Sun Y, Ge M, Ma C, Zhang J. Electronic and magnetic properties of charged point defects in monolayer CrI3. Phys Chem Chem Phys 2023;25:8809-8815. [PMID: 36916286 DOI: 10.1039/d2cp05657g] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 03/16/2023]
2
Oxygen vacancy regulation strategy in V-Nb mixed oxides catalyst for enhanced aerobic oxidative desulfurization performance. J Colloid Interface Sci 2023;641:289-298. [PMID: 36934576 DOI: 10.1016/j.jcis.2023.02.155] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/16/2022] [Revised: 02/24/2023] [Accepted: 02/27/2023] [Indexed: 03/06/2023]
3
Durrant TR, Murphy ST, Watkins MB, Shluger AL. Relation between image charge and potential alignment corrections for charged defects in periodic boundary conditions. J Chem Phys 2018;149:024103. [DOI: 10.1063/1.5029818] [Citation(s) in RCA: 41] [Impact Index Per Article: 6.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/14/2022]  Open
4
Wu YN, Zhang XG, Pantelides ST. Wu, Zhang, and Pantelides Reply. PHYSICAL REVIEW LETTERS 2018;120:039602. [PMID: 29400530 DOI: 10.1103/physrevlett.120.039602] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/10/2017] [Indexed: 06/07/2023]
5
Deng HX, Wei SH. Comment on "Fundamental Resolution of Difficulties in the Theory of Charged Point Defects in Semiconductors". PHYSICAL REVIEW LETTERS 2018;120:039601. [PMID: 29400501 DOI: 10.1103/physrevlett.120.039601] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/03/2017] [Indexed: 06/07/2023]
6
Chen W, Pasquarello A. Comment on "Fundamental Resolution of Difficulties in the Theory of Charged Point Defects in Semiconductors". PHYSICAL REVIEW LETTERS 2018;120:039603. [PMID: 29400524 DOI: 10.1103/physrevlett.120.039603] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/21/2017] [Indexed: 06/07/2023]
7
Wu YN, Zhang XG, Pantelides ST. Wu, Zhang, and Pantelides Reply. PHYSICAL REVIEW LETTERS 2018;120:039604. [PMID: 29400504 DOI: 10.1103/physrevlett.120.039604] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/14/2017] [Indexed: 06/07/2023]
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