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For: Tweet DJ, Akimoto K, Tatsumi T, Hirosawa I, Mizuki J, Matsui J. Direct observation of Ge and Si ordering at the Si/B/GexSi1-x(111) interface by anomalous x-ray diffraction. Phys Rev Lett 1992;69:2236-2239. [PMID: 10046433 DOI: 10.1103/physrevlett.69.2236] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/23/2023]
Number Cited by Other Article(s)
1
Kondo T, Shibata M, Hayashi N, Fukumitsu H, Masuda T, Takakusagi S, Uosaki K. Resonance surface X-ray scattering technique to determine the structure of electrodeposited Pt ultrathin layers on Au(111) surface. Electrochim Acta 2010. [DOI: 10.1016/j.electacta.2010.05.020] [Citation(s) in RCA: 20] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/19/2022]
2
Xiao H, Daykin A. Extra diffractions caused by stacking faults in cubic crystals. Ultramicroscopy 1994. [DOI: 10.1016/0304-3991(94)90045-0] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/27/2022]
3
Specht ED, Walker FJ. Oxidation state of a buried interface: Near-edge x-ray fine structure of a crystal truncation rod. PHYSICAL REVIEW. B, CONDENSED MATTER 1993;47:13743-13751. [PMID: 10005692 DOI: 10.1103/physrevb.47.13743] [Citation(s) in RCA: 15] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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