Evidence of self-affine rough interfaces in a Langmuir-Blodgett film from x-ray reflectometry

Langmuir films of low-dimensional nanomaterials

A large number of low-dimensional nanomaterials having different shapes and being dispersible in solvents open a fundamental question if there is a universal deposition technique for the monolayer formation. A monolayer formation of various nanomaterials at the air-water interface, also known as a Langmuir film, is a well-established technique even for the large group of the recently developed low-dimensional nanomaterials. In this review, we cover the monolayer formation of the zero-dimensional, one-dimensional and two-dimensional nanomaterials. Thanks to the formation of a Langmuir layer at the thermodynamic equilibrium, by using a suitable nanomaterial dispersion and subphase, the monolayers can be formed from all kinds of materials, ranging from the graphene oxide to the semiconducting quantum dots. In this review, we will discuss the basic requirements for the successful formation of monolayers and summarize the recent scientific advances in the field of Langmuir films.

Solidlike and liquidlike behavior in monolayers and multilayers of metal-bearing amphiphiles

Atomic force microscopy (AFM) of cadmium stearate (CdSt) and cobalt stearate (CoSt) Langmuir-Blodgett films show differences in their in-plane morphologies. CdSt films, with a huge number of in-plane "pinhole" defects, follow self-affine behavior, whereas CoSt films, which are almost void of such in-plane defects, show deviation from self-affinity especially at small length scales, suggesting liquidlike behavior, imparting flexibility to the system, in plane. Phase images of CoSt obtained from tapping mode AFM show gentle undulations or hemispherelike features in contrast to its smooth topography, unlike the CdSt system where both height and phase images show self-affine domains. Near edge x-ray absorption fine structure spectroscopy indicates no preferred in-plane orientation of the head group in CoSt films. The undulating features in CoSt is explained by invoking a radially symmetric orientational distribution in the tilt of adjacent hydrocarbon tails, causing a small in-plane density variation which shows up in the phase image. These orientational disorders in adjacent tails probably allow "filling up" of in-plane defects thereby giving rise to its excellent in-plane coverage and hence a "liquidlike" behavior in CoSt. Brewster angle microscopy shows that parent Langmuir monolayers of stearic acid in the presence of Cd and Co ions in the aqueous subphase behave as two-dimensional "solids" and "liquids," respectively, suggesting the phenomena to be inherent in the amphiphiles and probably independent of their organization as monolayers and multilayers.

Effect of water and air-water interface on the structural modification of Ni-arachidate Langmuir-Blodgett films

Nickel arachidate (NiA) Langmuir-Blodgett (LB) films have been deposited on hydrophilic Si(0 0 1) substrates by three (up-down-up) and five (up-down-up-down-up) strokes. During deposition, substrates were kept inside the water subphase for different times after each down stroke. Structural information of all the LB films have been obtained from X-ray reflectivity (XRR) studies. One and two symmetric monolayer (SML) was deposited on top of the asymmetric monolayer (AML) in three and five stokes respectively. All the preformed LB films were then used to go through the air-water interface with the same speed that was used at the time of film deposition. Structural information obtained from the XRR studies show that mainly the top layer density decreases after passing through the air-water interface but the layered structure remains the same. Information obtained from both the XRR and atomic force microscopy (AFM) studies suggest that molecules peeled from the top SML layer do not reincorporate with the LB film through tail-tail hydrophobic interaction. Our study shows that NiA LB film has better stability compared with cadmium arachidate LB film inside the water subphase without forming any out-of-plane molecular reorganization.

Capillary wave fluctuations and intrinsic widths of coupled fluid-fluid interfaces: an x-ray scattering study of a wetting film on bulk liquid

An x-ray specular reflectivity (XR) and off-specular diffuse scattering (XDS) study of the coupled thermal capillary fluctuations and the intrinsic profiles of two interacting fluid-fluid interfaces is presented. The measurements are carried out on complete wetting films of perfluoromethylcyclohexane (PFMC) on the surface of bulk liquid eicosane (C20), as a function of film thickness 30<D<160 A. In order to facilitate the analysis and interpretation of the data with minimal complexity, approximate methods for calculating scattering intensities are developed to take into account the subtleties of thermal diffuse scattering from layered liquid surfaces. With these methods, the calculations of XR/XDS intensities are reduced to a single numerical integration of simple functions in real space. In addition, an analytic expression is derived for small-angle XR that contains Debye-Waller-like factors with effective capillary roughness and takes into account the partial correlations of the two interfaces. The expression for the XR is quantitatively accurate so long as the reflection angle is small enough that the scattering from interfaces is distinguishable from bulk scattering. The results of the XR and XDS data analysis indicate that the capillary fluctuations at the two interfaces of the wetting films are partially correlated and their coupling is consistent with the van der Waals interactions. The relatively large intrinsic width (4 approximately 6A) of the liquid-liquid interface observed for thicker films (D greater than or similar to 50 A) is comparable to the value expected for the bulk liquid-liquid interface (D-->infinity), determined by either the radius of gyration (5.3 A) or the bulk correlation length (4.8 A) of the alkane C20. The intrinsic liquid-vapor interfacial width is sharper (approximately 2 A) and remains essentially constant over the entire probed range of D .

X-ray scattering from freestanding polymer films with geometrically curved surfaces

We show that the x-ray surface scattering from a freestanding polymer film exhibits features that cannot be explained by the usual stochastic formalism for surfaces with random height fluctuations. Instead, a geometric description of the film morphology assuming two curved surfaces characterized by a radius of curvature and a lateral cutoff length successfully accounts for the phase difference between the Kiessig fringes of the nominal "specular" and "off-specular" components of the scattering. The formalism allows one to distinguish unambiguously between conformal and anticonformal curvature morphologies at long length scales.