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Amjadipour M, MacLeod J, Lipton-Duffin J, Tadich A, Boeckl JJ, Iacopi F, Motta N. Electron effective attenuation length in epitaxial graphene on SiC. NANOTECHNOLOGY 2019; 30:025704. [PMID: 30382023 DOI: 10.1088/1361-6528/aae7ec] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/08/2023]
Abstract
The inelastic mean free path (IMFP) for carbon-based materials is notoriously challenging to model, and moving from bulk materials to 2D materials may exacerbate this problem, making the accurate measurements of IMFP in 2D carbon materials critical. The overlayer-film method is a common experimental method to estimate IMFP by measuring electron effective attenuation length (EAL). This estimation relies on an assumption that elastic scattering effects are negligible. We report here an experimental measurement of electron EAL in epitaxial graphene on SiC using photoelectron spectroscopy over an electron kinetic energy range of 50-1150 eV. We find a significant effect of the interface between the 2D carbon material and the substrate, indicating that the attenuation length in the so-called 'buffer layer' is smaller than for free-standing graphene. Our results also suggest that the existing models for estimating IMFPs may not adequately capture the physics of electron interactions in 2D materials.
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Affiliation(s)
- Mojtaba Amjadipour
- School of Chemistry, Physics and Mechanical Engineering, Science and Engineering Faculty, Queensland University of Technology, Brisbane, QLD, Australia
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Ferrari E, Allaria E, Buck J, De Ninno G, Diviacco B, Gauthier D, Giannessi L, Glaser L, Huang Z, Ilchen M, Lambert G, Lutman AA, Mahieu B, Penco G, Spezzani C, Viefhaus J. Single Shot Polarization Characterization of XUV FEL Pulses from Crossed Polarized Undulators. Sci Rep 2015; 5:13531. [PMID: 26314764 PMCID: PMC4551986 DOI: 10.1038/srep13531] [Citation(s) in RCA: 17] [Impact Index Per Article: 1.9] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/22/2015] [Accepted: 07/29/2015] [Indexed: 12/03/2022] Open
Abstract
Polarization control is a key feature of light generated by short-wavelength free-electron lasers. In this work, we report the first experimental characterization of the polarization properties of an extreme ultraviolet high gain free-electron laser operated with crossed polarized undulators. We investigate the average degree of polarization and the shot-to-shot stability and we analyze aspects such as existing possibilities for controlling and switching the polarization state of the emitted light. The results are in agreement with predictions based on Gaussian beams propagation.
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Affiliation(s)
- E Ferrari
- Elettra-Sincrotrone Trieste, S.S. 14-km 163.5, 34149 Basovizza, Trieste, Italy.,Università degli Studi di Trieste, Dipartimento di Fisica, Piazzale Europa 1, 34127 Trieste, Italy
| | - E Allaria
- Elettra-Sincrotrone Trieste, S.S. 14-km 163.5, 34149 Basovizza, Trieste, Italy
| | - J Buck
- European XFEL, 22761 Hamburg, Germany
| | - G De Ninno
- Elettra-Sincrotrone Trieste, S.S. 14-km 163.5, 34149 Basovizza, Trieste, Italy.,Laboratory of Quantum Optics, University of Nova Gorica, 5000 Nova Gorica, Slovenia
| | - B Diviacco
- Elettra-Sincrotrone Trieste, S.S. 14-km 163.5, 34149 Basovizza, Trieste, Italy
| | - D Gauthier
- Elettra-Sincrotrone Trieste, S.S. 14-km 163.5, 34149 Basovizza, Trieste, Italy.,Laboratory of Quantum Optics, University of Nova Gorica, 5000 Nova Gorica, Slovenia
| | - L Giannessi
- Elettra-Sincrotrone Trieste, S.S. 14-km 163.5, 34149 Basovizza, Trieste, Italy.,Enea, via Enrico Fermi 45, 00044 Frascati, Roma, Italy
| | | | - Z Huang
- SLAC National Accelerator Laboratory, Menlo Park, California 94025, USA
| | - M Ilchen
- European XFEL, 22761 Hamburg, Germany.,Stanford PULSE Institute, Menlo Park, CA, USA
| | - G Lambert
- Laboratoire d'Optique Appliquée, ENSTA ParisTech-CNRS UMR 7639-Ecole polytechnique, Chemin de la Huniére, 91761 Palaiseau, France
| | - A A Lutman
- SLAC National Accelerator Laboratory, Menlo Park, California 94025, USA
| | - B Mahieu
- Laboratoire d'Optique Appliquée, ENSTA ParisTech-CNRS UMR 7639-Ecole polytechnique, Chemin de la Huniére, 91761 Palaiseau, France
| | - G Penco
- Elettra-Sincrotrone Trieste, S.S. 14-km 163.5, 34149 Basovizza, Trieste, Italy
| | - C Spezzani
- Elettra-Sincrotrone Trieste, S.S. 14-km 163.5, 34149 Basovizza, Trieste, Italy
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Bourke JD, Chantler CT. Measurements of electron inelastic mean free paths in materials. PHYSICAL REVIEW LETTERS 2010; 104:206601. [PMID: 20867048 DOI: 10.1103/physrevlett.104.206601] [Citation(s) in RCA: 13] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 02/10/2010] [Indexed: 05/29/2023]
Abstract
We present a method for determining inelastic mean free paths (IMFPs) in materials using high-accuracy measurements of x-ray absorption fine structure (XAFS). For electron energies below 100 eV, theoretical predictions have large variability and alternate measurement techniques exhibit significant uncertainties. In this regime, the short IMFP makes photoelectrons ideal for structural determination of surfaces and nanostructures, and measurements are valuable for studies of diverse fields such as low-energy electron diffraction and ballistic electron emission microscopy. Our approach, here applied to solid copper, is unique and exhibits enhanced sensitivity at electron energies below 100 eV. Furthermore, it is readily applicable to any material for which sufficiently high accuracy XAFS data can be obtained.
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Affiliation(s)
- J D Bourke
- School of Physics, University of Melbourne, Parkville, Vic, 3010 Australia
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Chiang CT, Winkelmann A, Yu P, Kirschner J. Magnetic dichroism from optically excited quantum well states. PHYSICAL REVIEW LETTERS 2009; 103:077601. [PMID: 19792686 DOI: 10.1103/physrevlett.103.077601] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/16/2009] [Indexed: 05/28/2023]
Abstract
We demonstrate magnetic dichroism from optically excited states in two-photon photoemission. Using ultrathin cobalt films grown on Cu(001), we observe unoccupied quantum well states which give rise to a sizable intensity change in photoemission under magnetization reversal. The simultaneous comparison of both circular and linear magnetic dichroism in the same system permits us to check fundamental symmetry requirements and allows us to explicitly elucidate the common origin of both effects. Based on our observations we argue that the observed effect is related to spin-orbit coupling in the intermediate quantum well states.
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Affiliation(s)
- Cheng-Tien Chiang
- Max-Planck-Institut für Mikrostrukturphysik, Weinberg 2, D-06120 Halle(Saale), Germany
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Fanelsa A, Schellenberg R, Hillebrecht FU, Kisker E, Menchero JG, Kaduwela AP, Fadley CS. Magnetic dichroism in core-level x-ray photoemission with unpolarized excitation. PHYSICAL REVIEW. B, CONDENSED MATTER 1996; 54:17962-17965. [PMID: 9985931 DOI: 10.1103/physrevb.54.17962] [Citation(s) in RCA: 11] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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Hillebrecht FU, Roth C, Rose HB, Park WG, Kisker E, Cherepkov NA. Magnetic linear dichroism in spin-resolved Fe 2p photoemission. PHYSICAL REVIEW. B, CONDENSED MATTER 1996; 53:12182-12195. [PMID: 9982848 DOI: 10.1103/physrevb.53.12182] [Citation(s) in RCA: 14] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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Rose HB, Fanelsa A, Kinoshita T, Roth C, Hillebrecht FU, Kisker E. Spin-orbit-induced spin polarization in W 4f photoemission. PHYSICAL REVIEW. B, CONDENSED MATTER 1996; 53:1630-1634. [PMID: 9983627 DOI: 10.1103/physrevb.53.1630] [Citation(s) in RCA: 11] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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