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For: Luo X, Zhang SB, Wei SH. Understanding ultrahigh doping: the case of boron in silicon. Phys Rev Lett 2003;90:026103. [PMID: 12570559 DOI: 10.1103/physrevlett.90.026103] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/12/2002] [Indexed: 05/24/2023]
Number Cited by Other Article(s)
1
Garcia-Castello N, Illera S, Prades JD, Ossicini S, Cirera A, Guerra R. Energetics and carrier transport in doped Si/SiO2 quantum dots. NANOSCALE 2015;7:12564-12571. [PMID: 26144524 DOI: 10.1039/c5nr02616d] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/04/2023]
2
Höglund A, Eriksson O, Castleton CWM, Mirbt S. Increasing the equilibrium solubility of dopants in semiconductor multilayers and alloys. PHYSICAL REVIEW LETTERS 2008;100:105501. [PMID: 18352201 DOI: 10.1103/physrevlett.100.105501] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/29/2007] [Indexed: 05/26/2023]
3
De Salvador D, Napolitani E, Mirabella S, Bisognin G, Impellizzeri G, Carnera A, Priolo F. Atomistic mechanism of boron diffusion in silicon. PHYSICAL REVIEW LETTERS 2006;97:255902. [PMID: 17280368 DOI: 10.1103/physrevlett.97.255902] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/08/2006] [Indexed: 05/13/2023]
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