Okitsu K, Imai Y, Yoda Y, Ueji Y. Experimentally obtained and computer-simulated X-ray asymmetric eight-beam pinhole topographs for a silicon crystal.
Acta Crystallogr A Found Adv 2019;
75:474-482. [PMID:
31041903 PMCID:
PMC6492489 DOI:
10.1107/s2053273319001499]
[Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/24/2018] [Accepted: 01/26/2019] [Indexed: 11/17/2022] Open
Abstract
In this study, experimentally obtained eight-beam pinhole topographs for a silicon crystal using synchrotron X-rays were compared with computer-simulated images, and were found to be in good agreement. The experiment was performed with an asymmetric all-Laue geometry. However, the X-rays exited from both the bottom and side surfaces of the crystal. The simulations were performed using two different approaches: one was the integration of the n-beam Takagi-Taupin equation, and the second was the fast Fourier transformation of the X-ray amplitudes obtained by solving the eigenvalue problem of the n-beam Ewald-Laue theory as reported by Kohn & Khikhlukha [Acta Cryst. (2016), A72, 349-356] and Kohn [Acta Cryst. (2017), A73, 30-38].
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