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For: Zuo JM, Spence JCH, Downs J, Mayer J. Measurement of individual structure-factor phases with tenth-degree accuracy: the 00.2 reflection in BeO studied by electron and X-ray diffraction. Acta Crystallogr A 1993. [DOI: 10.1107/s0108767392010699] [Citation(s) in RCA: 10] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register]  Open
Number Cited by Other Article(s)
1
Peng D, Nakashima PNH. Measuring Density Functional Parameters from Electron Diffraction Patterns. PHYSICAL REVIEW LETTERS 2021;126:176402. [PMID: 33988394 DOI: 10.1103/physrevlett.126.176402] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/17/2020] [Revised: 01/13/2021] [Accepted: 03/15/2021] [Indexed: 06/12/2023]
2
Palatinus L, Jacob D, Cuvillier P, Klementová M, Sinkler W, Marks LD. Structure refinement from precession electron diffraction data. Acta Crystallogr A 2013;69:171-88. [PMID: 23403968 DOI: 10.1107/s010876731204946x] [Citation(s) in RCA: 39] [Impact Index Per Article: 3.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/27/2012] [Accepted: 12/02/2012] [Indexed: 11/10/2022]  Open
3
Jiang B, Zuo JM, Holec D, Humphreys CJ, Spackman M, Spence JCH. Combined structure-factor phase measurement and theoretical calculations for mapping of chemical bonds in GaN. Acta Crystallogr A 2010;66:446-50. [PMID: 20555184 DOI: 10.1107/s0108767310008664] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/08/2009] [Accepted: 03/06/2010] [Indexed: 11/11/2022]  Open
4
Holmestad R, Zuo JM, Spence JCH, Hoiert R, Horita Z. Effect of Mn doping on charge density in γ-TiAl by quantitative convergent beam electron diffraction. ACTA ACUST UNITED AC 2006. [DOI: 10.1080/01418619508243787] [Citation(s) in RCA: 30] [Impact Index Per Article: 1.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/23/2022]
5
Spackman MA, Jiang B, Groy TL, He H, Whitten AE, Spence JCH. Phase measurement for accurate mapping of chemical bonds in acentric space groups. PHYSICAL REVIEW LETTERS 2005;95:085502. [PMID: 16196869 DOI: 10.1103/physrevlett.95.085502] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/22/2004] [Indexed: 05/04/2023]
6
Lábár JL, Morgiel J. A New Method for the Measurement of Thickness in Single Crystals. Micron 1998. [DOI: 10.1016/s0968-4328(98)00025-0] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/16/2022]
7
Electron Spectroscopic Diffraction. ACTA ACUST UNITED AC 1995. [DOI: 10.1007/978-3-540-48995-5_6] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register]
8
Holmestad R, Krivanek O, Høier R, Marthinsen K, Spence J. Commercial spectrometer modifications for energy filtering of electron diffraction patterns and images. Ultramicroscopy 1993. [DOI: 10.1016/0304-3991(93)90060-b] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/28/2022]
9
Zuo JM, Spence JCH. Coherent electron nanodiffraction from perfect and imperfect crystals. ACTA ACUST UNITED AC 1993. [DOI: 10.1080/01418619308219387] [Citation(s) in RCA: 12] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/23/2022]
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