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For: Healey PD, Bao K, Gokhale M, Ayers JE, Jain FC. X-ray determination of the dislocation densities in semiconductor crystals using a Bartels five-crystal diffractometer. Acta Crystallogr A 1995. [DOI: 10.1107/s0108767394014303] [Citation(s) in RCA: 31] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/10/2022]  Open
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