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For: Holt SA, Brown AS, Creagh DC, Leon R. Application of imaging-grazing-incidence X-ray diffraction and specular reflectivity to the structural investigation of quantum-confinement semiconductor devices. J Synchrotron Radiat 1997;4:169-74. [PMID: 16699224 DOI: 10.1107/s0909049597004123] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/09/2023]

For:	Holt SA, Brown AS, Creagh DC, Leon R. Application of imaging-grazing-incidence X-ray diffraction and specular reflectivity to the structural investigation of quantum-confinement semiconductor devices. J Synchrotron Radiat 1997;4:169-74. [PMID: 16699224 DOI: 10.1107/s0909049597004123] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/09/2023]

Number	Cited by Other Article(s)
1	Creagh D, Otieno-Alego V, O’Neill P. X-ray reflectivity and grazing incidence diffraction studies of the adhesion of protective wax coatings on metal surfaces. Radiat Phys Chem Oxf Engl 1993 2001. [DOI: 10.1016/s0969-806x(01)00396-6] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/27/2022] Abstract Collapse Key Words Collapse MESH Headings Collapse Grants Collapse Affiliation(s) Collapse
2	An X-ray reflectivity study of the influence of anodic oxidation and annealing on interface structure in quantum well devices. Colloids Surf A Physicochem Eng Asp 1999. [DOI: 10.1016/s0927-7757(98)00492-0] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/19/2022] Abstract Collapse Key Words Collapse MESH Headings Collapse Grants Collapse Affiliation(s) Collapse
3	X-ray reflectivity studies of mono- and bi-layers of manganese stearate on silicon substrates. Radiat Phys Chem Oxf Engl 1993 1998. [DOI: 10.1016/s0969-806x(97)00201-6] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/23/2022] Abstract Collapse Key Words Collapse MESH Headings Collapse Grants Collapse Affiliation(s) Collapse