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For: Kamiński R, Szarejko D, Pedersen MN, Hatcher LE, Łaski P, Raithby PR, Wulff M, Jarzembska KN. Instrument-model refinement in normalized reciprocal-vector space for X-ray Laue diffraction. J Appl Crystallogr 2020;53:1370-1375. [PMID: 33122973 DOI: 10.1107/s1600576720011929] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/03/2020] [Accepted: 08/29/2020] [Indexed: 11/10/2022] Open

For:	Kamiński R, Szarejko D, Pedersen MN, Hatcher LE, Łaski P, Raithby PR, Wulff M, Jarzembska KN. Instrument-model refinement in normalized reciprocal-vector space for X-ray Laue diffraction. J Appl Crystallogr 2020;53:1370-1375. [PMID: 33122973 DOI: 10.1107/s1600576720011929] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/03/2020] [Accepted: 08/29/2020] [Indexed: 11/10/2022] Open

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(The first 100,000 artilces are displayed in RCA.)