Single-pulse characterization of the focal spot size of X-ray free-electron lasers using coherent diffraction imaging

Single-shot X-ray imaging of two-dimensional strain fields in colloidal crystals

We used a soft X-ray free-electron laser and the Bragg coherent diffraction imaging method to characterize the defect structure of colloidal crystals. The single-shot X-ray pulse allowed us to reach four powder rings and measured all six reflections of the hexagonal lattice. We reproduced the static shape of the 2D crystal and mapped out the 2D strain tensors inside the crystal. The observed defect structures agreed with electron microscope images of similar colloidal samples.

Design and first-round commissioning result of the SASE beamline at the Shanghai Soft X-ray FEL facility

The Shanghai Soft X-ray Free-Electron Laser (SXFEL) is the first X-ray free-electron laser facility in China. The SASE beamline, which consists of a pink-beam branch and a mono-beam branch, is one of the two beamlines in the Phase-I construction. The pink-beam branch opened for users in 2023 after successful first-round beamline commissioning. In this paper, the design of the beamline is presented and the performance of the pink-beam branch is reported. The measured energy-resolving power of the online spectrometer is over 6000 @ 400 eV. The focusing spot size of the pink beam is less than 3 µm in both the horizontal and vertical at the endstation.