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For: Lue HT, Tseng TY. Application of on-wafer TRL calibration on the measurement of microwave properties of Ba0.5Sr0.5TiO3 thin films. IEEE Trans Ultrason Ferroelectr Freq Control 2001;48:1640-1647. [PMID: 11800126 DOI: 10.1109/58.971716] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/23/2023]
Number Cited by Other Article(s)
1
Bhakdisongkhram G, Okamura S, Shiosaki T. Precise measurement of the dielectric properties of BaxSr1−xTiO3 thin films by on-wafer through-reflect-line (TRL) calibration method. Ann Ital Chir 2006. [DOI: 10.1016/j.jeurceramsoc.2005.09.011] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/26/2022]
2
Wang Z, Wang C, Liu L. Design and analysis of a PZT-based micromachined acoustic sensor with increased sensitivity. IEEE TRANSACTIONS ON ULTRASONICS, FERROELECTRICS, AND FREQUENCY CONTROL 2005;52:1840-50. [PMID: 16382637 DOI: 10.1109/tuffc.2005.1561640] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/05/2023]
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