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Huang X, Tong L, Xu L, Shi W, Peng Z, Li Z, Yu X, Li W, Wang Y, Zhang X, Gong X, Xu J, Qiu X, Wen H, Wang J, Hu X, Xiong C, Ye Y, Miao X, Ye L. 2D MoS 2-based reconfigurable analog hardware. Nat Commun 2025; 16:101. [PMID: 39747070 PMCID: PMC11695594 DOI: 10.1038/s41467-024-55395-4] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/12/2024] [Accepted: 12/10/2024] [Indexed: 01/04/2025] Open
Abstract
Biological neural circuits demonstrate exceptional adaptability to diverse tasks by dynamically adjusting neural connections to efficiently process information. However, current two-dimension materials-based neuromorphic hardware mainly focuses on specific devices to individually mimic artificial synapse or heterosynapse or soma and encoding the inner neural states to realize corresponding mock object function. Recent advancements suggest that integrating multiple two-dimension material devices to realize brain-like functions including the inter-mutual connecting assembly engineering has become a new research trend. In this work, we demonstrate a two-dimension MoS2-based reconfigurable analog hardware that emulate synaptic, heterosynaptic, and somatic functionalities. The inner-states and inter-connections of all modules co-encode versatile functions such as analog-to-digital/digital-to-analog conversion, and linear/nonlinear computations including integration, vector-matrix multiplication, convolution, to name a few. By assembling the functions to fit with different environment-interactive demanding tasks, this hardware experimentally achieves the reconstruction and image sharpening of medical images for diagnosis as well as circuit-level imitation of attention-switching and visual residual mechanisms for smart perception. This innovative hardware promotes the development of future general-purpose computing machines with high adaptability and flexibility to multiple tasks.
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Affiliation(s)
- Xinyu Huang
- School of Integrated Circuits and Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan, Hubei, 430074, China
- Hubei Yangtze Memory Laboratories, Wuhan, 430205, China
| | - Lei Tong
- Department of Electronic Engineering, Materials Science and Technology Research Center, The Chinese University of Hong Kong, Hong Kong, China
| | - Langlang Xu
- School of Integrated Circuits and Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan, Hubei, 430074, China
| | - Wenhao Shi
- School of Integrated Circuits and Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan, Hubei, 430074, China
| | - Zhuiri Peng
- School of Integrated Circuits and Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan, Hubei, 430074, China
| | - Zheng Li
- School of Integrated Circuits and Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan, Hubei, 430074, China
| | - Xiangxiang Yu
- School of Integrated Circuits and Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan, Hubei, 430074, China
| | - Wei Li
- School of Materials Science and Engineering, Smart Sensing Interdisciplinary Science Center, Nankai University & TKL of Metal and Molecule Based Material Chemistry, Tianjin, 300350, China
| | - Yilun Wang
- School of Integrated Circuits and Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan, Hubei, 430074, China
| | - Xinliang Zhang
- School of Integrated Circuits and Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan, Hubei, 430074, China
| | - Xuan Gong
- Institute of Medical Equipment Science and Engineering, Huazhong University of Science and Technology, Wuhan, Hubei, 430074, China
| | - Jianbin Xu
- Department of Electronic Engineering, Materials Science and Technology Research Center, The Chinese University of Hong Kong, Hong Kong, China
| | - Xiaoming Qiu
- Department of Radiology, Huangshi Central Hospital, Affiliated Hospital of Hubei Polytechnic University, Huangshi, China
| | - Hongyang Wen
- Department of clinical laboratory, Wuhan Wuchang Hospital, Wuhan, 430000, China
| | - Jing Wang
- Department of Radiology and Hubei Province Key Laboratory of Molecular Imaging, Union Hospital, Tongji Medical College, Huazhong University of Science and Technology, Wuhan, China
| | - Xuebin Hu
- Department of Neurosurgery, Union Hospital, Tongji Medical College, Huazhong University of Science and Technology, Wuhan, China
| | - Caihua Xiong
- Institute of Medical Equipment Science and Engineering, Huazhong University of Science and Technology, Wuhan, Hubei, 430074, China.
| | - Yu Ye
- Department of Radiology, Huangshi Central Hospital, Affiliated Hospital of Hubei Polytechnic University, Huangshi, China.
| | - Xiangshui Miao
- School of Integrated Circuits and Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan, Hubei, 430074, China.
- Hubei Yangtze Memory Laboratories, Wuhan, 430205, China.
| | - Lei Ye
- School of Integrated Circuits and Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan, Hubei, 430074, China.
- Hubei Yangtze Memory Laboratories, Wuhan, 430205, China.
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Tetteh M, Dias DM, Ryan C. Grammatical Evolution of Complex Digital Circuits in SystemVerilog. SN COMPUTER SCIENCE 2022; 3:188. [PMID: 35308804 PMCID: PMC8918139 DOI: 10.1007/s42979-022-01045-9] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 07/22/2021] [Accepted: 01/21/2022] [Indexed: 11/29/2022]
Abstract
The evolution of complex circuits remains a challenge for the Evolvable Hardware field in spite much effort. There are two major issues: the amount of testing required and the low evolvability of representation structures to handle complex circuitry, at least partially due to the destructive effects of genetic operators. A 64-bit \documentclass[12pt]{minimal}
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\begin{document}$$\times$$\end{document}× 64-bit add-shift multiplier circuit modelled at register-transfer level in SystemVerilog would require approximately 33,200 gates when synthesized using Yosys Open SYnthesis Suite tool. This enormous gate count makes evolving such a circuit at the gate-level difficult. We use Grammatical Evolution (GE) and SystemVerilog, a hardware description language (HDL), to evolve fully functional parameterized Adder, Multiplier, Selective Parity and Up–Down Counter circuits at a more abstract level other than gate level—register transfer level. Parameterized modules have the additional benefit of not requiring a re-run of evolutionary experiments if multiple instances with different input sizes are required. For example, a 64-bit \documentclass[12pt]{minimal}
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\begin{document}$$\times$$\end{document}× 64-bit and 128-bit \documentclass[12pt]{minimal}
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\begin{document}$$\times$$\end{document}× 128-bit multipliers etc., can be instantiated from a fully evolved functional and parameterized N-bit \documentclass[12pt]{minimal}
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\begin{document}$$\times$$\end{document}× N-bit multiplier. The Adder (6.4\documentclass[12pt]{minimal}
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\begin{document}$$\times$$\end{document}×), Multiplier (10.7\documentclass[12pt]{minimal}
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\begin{document}$$\times$$\end{document}×) and Selective Parity (6.7\documentclass[12pt]{minimal}
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\begin{document}$$\times$$\end{document}×) circuits are substantially larger than the current state of the art for evolutionary approaches. We are able to scale so dramatically because of the use of a HDL, which permits us to operate at a register-transfer level. Furthermore, we adopt a well known technique for reducing testing from digital circuit design known as corner case testing. Skilled circuit designers rely on this to avoid time-consuming exhaustive testing. We demonstrate a simple way to identify and use corner cases for evolutionary testing and show that it enables the generation of massively complex circuits. All circuits were successfully evolved without resorting to the use of any standard decomposition methods, due to our ability to use programming constructs and operators available in SystemVerilog.
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