Characterization of detector modulation-transfer function with noise, edge, and holographic methods

We developed a new method for characterization of detector performance used in the transmission electron microscope (TEM) based on the measured contrast of holographic fringes. The new method changes spatial frequency of the measured holographic fringes, generated by an electrostatic biprism and Schottky or cold field-emission gun, to sample the modulation-transfer function (MTF) of the detector. The MTF of a Gatan Ultrascan™ 1000 charged-coupled detector (CCD) is evaluated using the new method and the results are compared to the established noise and slanted-edge method results. Requirements for accuracy of the edge and noise MTF methods are discussed. We consider issues surrounding incomplete read-out and how it affects the gain reference normalization of the detector. We evaluate how the MTF affects optimization of experimental parameters in the TEM.

TEM-EELS: a personal perspective

The development of electron energy-loss spectroscopy in a transmission electron microscope (TEM-EELS) is illustrated through personal anecdote, highlighting some of the basic principles, instrumentation and personalities involved. The current state of the art is reviewed, together with some challenges for the future.