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For: Schattschneider P, Sölkner G. A comparison of techniques for the removal of plural scattering in energy loss spectroscopy. J Microsc 2011. [DOI: 10.1111/j.1365-2818.1984.tb00505.x] [Citation(s) in RCA: 12] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/29/2022]

For:	Schattschneider P, Sölkner G. A comparison of techniques for the removal of plural scattering in energy loss spectroscopy. J Microsc 2011. [DOI: 10.1111/j.1365-2818.1984.tb00505.x] [Citation(s) in RCA: 12] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/29/2022]

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Cited by Other Article(s)

Stöger-Pollach M, Löffler S, Maurer N, Bukvišová K. Using Cˇerenkov radiation for measuring the refractive index in thick samples by interferometric cathodoluminescence. Ultramicroscopy 2020;214:113011. [DOI: 10.1016/j.ultramic.2020.113011] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/10/2020] [Revised: 04/24/2020] [Accepted: 04/25/2020] [Indexed: 10/24/2022]

Werner WSM. Obtaining quantitative information on surface excitations from reflection electron energy-loss spectroscopy (REELS). SURF INTERFACE ANAL 2003. [DOI: 10.1002/sia.1540] [Citation(s) in RCA: 47] [Impact Index Per Article: 2.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/10/2022]

Schattschneider P, Stöger M, Hébert C, Jouffrey B. The separation of surface and bulk contributions in ELNES spectra. Ultramicroscopy 2002;93:91-7. [PMID: 12425587 DOI: 10.1016/s0304-3991(02)00144-4] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/16/2022]

Spence J. The structural sensitivity of electron energy-loss near-edge structure (ELNES). Ultramicroscopy 1985. [DOI: 10.1016/0304-3991(85)90134-2] [Citation(s) in RCA: 14] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/29/2022]