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For: Anders M, Heiden C. Imaging of tip-sample compliance in STM. J Microsc 2011. [DOI: 10.1111/j.1365-2818.1988.tb01433.x] [Citation(s) in RCA: 18] [Impact Index Per Article: 1.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/30/2022]
Number Cited by Other Article(s)
1
Göddenhenrich T, Hartmann U, Anders M, Heiden C. Investigation of Bloch wall fine structures by magnetic force microscopy. J Microsc 2011. [DOI: 10.1111/j.1365-2818.1988.tb01417.x] [Citation(s) in RCA: 61] [Impact Index Per Article: 4.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/26/2022]
2
Hartmann U, Heiden C. Calculation of the Bloch wall contrast in magnetic force microscopy. J Microsc 2011. [DOI: 10.1111/j.1365-2818.1988.tb01389.x] [Citation(s) in RCA: 23] [Impact Index Per Article: 1.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/29/2022]
3
Molecular Scale Analysis Using Scanning Force Microscopy. ACTA ACUST UNITED AC 2006. [DOI: 10.1007/978-3-540-39502-7_5] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register]
4
Dedkov G. Experimental and Theoretical Aspects of the Modern Nanotribology. ACTA ACUST UNITED AC 2000. [DOI: 10.1002/1521-396x(200005)179:1<3::aid-pssa3>3.0.co;2-m] [Citation(s) in RCA: 59] [Impact Index Per Article: 2.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/06/2022]
5
Schenk M, Amrein M, Reichelt R. An electret microphone as a force sensor for combined scanning probe microscopy. Ultramicroscopy 1996. [DOI: 10.1016/s0304-3991(96)00067-8] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/30/2022]
6
Fundamentals and Special Applications of Non-Contact Scanning Force Microscopy. ACTA ACUST UNITED AC 1993. [DOI: 10.1016/s0065-2539(08)60016-5] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 04/14/2023]
7
Hartmann U. Manifestation of zero-point quantum fluctuations in atomic force microscopy. PHYSICAL REVIEW. B, CONDENSED MATTER 1990;42:1541-1546. [PMID: 9995583 DOI: 10.1103/physrevb.42.1541] [Citation(s) in RCA: 38] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
8
Hartmann U. Analysis of Bloch-wall fine structures by magnetic force microscopy. PHYSICAL REVIEW. B, CONDENSED MATTER 1989;40:7421-7424. [PMID: 9991161 DOI: 10.1103/physrevb.40.7421] [Citation(s) in RCA: 14] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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