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For: Wzorek M, Katcki J, Płuska M, Ratajczak J, Jaroszewicz B, Domański K, Grabiec P. Buried amorphous-layer impact on dislocation densities in silicon. J Microsc 2006;224:104-7. [PMID: 17100918 DOI: 10.1111/j.1365-2818.2006.01677.x] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/01/2022]
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