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For: Liu S, Dong J, Ma Z, Hu W, Deng Y, Shi Y, Wang X, Qiu Y, Walther T. The evolution of indium precipitation in gallium focused ion beam prepared samples of InGaAs/InAlAs quantum wells under electron beam irradiation. J Microsc 2024;293:169-176. [PMID: 38112123 DOI: 10.1111/jmi.13251] [Citation(s) in RCA: 1] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/16/2023] [Revised: 11/20/2023] [Accepted: 12/11/2023] [Indexed: 12/20/2023]

For:	Liu S, Dong J, Ma Z, Hu W, Deng Y, Shi Y, Wang X, Qiu Y, Walther T. The evolution of indium precipitation in gallium focused ion beam prepared samples of InGaAs/InAlAs quantum wells under electron beam irradiation. J Microsc 2024;293:169-176. [PMID: 38112123 DOI: 10.1111/jmi.13251] [Citation(s) in RCA: 1] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/16/2023] [Revised: 11/20/2023] [Accepted: 12/11/2023] [Indexed: 12/20/2023]

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Cited by Other Article(s)

Walther T, Oliver RA. Preface to the special issue on Microscopy of Semiconducting Materials 2023. J Microsc 2024;293:135-137. [PMID: 38282251 DOI: 10.1111/jmi.13265] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/30/2024]