Nondestructive Testing for Wheat Quality with Sensor Technology Based on Big Data

Nondestructive testing with sensor technology is one of the fastest growing and most promising wheat quality information analysis technologies. Nondestructive testing with sensor technology benefits from the latest achievement of many disciplines such as computer, optics, mathematics, chemistry, and chemometrics. It has the advantages of simplicity, speed, low cost, no pollution, and no contact. It is widely used in wheat quality analysis and testing research. This article summarizes nondestructive testing with sensor technology for wheat quality, including the mechanical model, hyperspectral technology, Raman spectroscopy, and near-infrared techniques for wheat mechanical properties, storage properties, and physical and chemical properties (such as moisture, ash, protein, and starch) in the past decade. Based on the current research progress, big data technology needs a lot of research in spectral data mining, modeling algorithm optimization, model robustness, etc. to provide more data support and method reference for the research and application of wheat quality.

Limitations and current applications of Near Infrared Spectroscopy for single seed analysis

Near Infrared Spectroscopy (NIRS) analysis at the single seed level is a useful tool for breeders, farmers, feeding facilities, and food companies according to current researches. As a non-destructive technique, NIRS allows for the selection and classification of seeds according to specific traits and attributes without alteration of their properties. Critical aspects in using NIRS for single seed analysis such as reference method, sample morphology, and spectrometer suitability are discussed in this review. A summary of current applications of NIRS technologies at single seed level is also presented.