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For: Wu CH, Kuo SN, Chang KM, Chen YM, Zhang YX, Xu N, Liu WY, Chin A. Reliability of Atmosphere Pressure-Plasma Enhanced Chemical Vapor Deposition Deposited Indium Gallium Zinc Oxide Resistive Random Access Memory Device with Microwave Annealing. J Nanosci Nanotechnol 2020;20:4057-4060. [PMID: 31968420 DOI: 10.1166/jnn.2020.17560] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/10/2023]
Number Cited by Other Article(s)
1
Wojnarowicz J, Chudoba T, Lojkowski W. A Review of Microwave Synthesis of Zinc Oxide Nanomaterials: Reactants, Process Parameters and Morphoslogies. NANOMATERIALS (BASEL, SWITZERLAND) 2020;10:E1086. [PMID: 32486522 PMCID: PMC7353225 DOI: 10.3390/nano10061086] [Citation(s) in RCA: 126] [Impact Index Per Article: 31.5] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 04/22/2020] [Revised: 05/11/2020] [Accepted: 05/19/2020] [Indexed: 12/18/2022]
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