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For: Nakamura T, Homma K, Tachibana K. Thin film deposition of metal oxides in resistance switching devices: electrode material dependence of resistance switching in manganite films. Nanoscale Res Lett 2013;8:76. [PMID: 23414549 PMCID: PMC3577670 DOI: 10.1186/1556-276x-8-76] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 07/17/2012] [Accepted: 12/29/2012] [Indexed: 06/01/2023]
Number Cited by Other Article(s)
1
Arulpriya P, Krishnaveni T, Shanmugasundaram T, Kadirvelu K. Mesoporous TiO2 @ Fe metal organic framework nanocomposite for an efficient chlorpyrifos detection and degradation. J IND ENG CHEM 2022. [DOI: 10.1016/j.jiec.2022.05.007] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/18/2022]
2
Lähteenlahti V, Schulman A, Beiranvand A, Huhtinen H, Paturi P. Electron Doping Effect in the Resistive Switching Properties of Al/Gd1-xCaxMnO3/Au Memristor Devices. ACS APPLIED MATERIALS & INTERFACES 2021;13:18365-18371. [PMID: 33832220 PMCID: PMC8288910 DOI: 10.1021/acsami.1c02963] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 02/13/2021] [Accepted: 03/30/2021] [Indexed: 06/12/2023]
3
Polek T, Semen’ko M, Endo T, Nakamura Y, Lotey GS, Tovstolytkin A. ESR Study of (La,Ba)MnO3/ZnO Nanostructure for Resistive Switching Device. NANOSCALE RESEARCH LETTERS 2017;12:180. [PMID: 28282983 PMCID: PMC5344876 DOI: 10.1186/s11671-017-1961-8] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 12/29/2016] [Accepted: 02/27/2017] [Indexed: 06/06/2023]
4
Fu J, Hua M, Ding S, Chen X, Wu R, Liu S, Han J, Wang C, Du H, Yang Y, Yang J. Stability and its mechanism in Ag/CoOx/Ag interface-type resistive switching device. Sci Rep 2016;6:35630. [PMID: 27759116 PMCID: PMC5069483 DOI: 10.1038/srep35630] [Citation(s) in RCA: 14] [Impact Index Per Article: 1.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/11/2015] [Accepted: 09/30/2016] [Indexed: 11/21/2022]  Open
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