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Cheng W, Wang X, Zou S, Ni M, Lu Z, Dai L, Su J, Yang K, Su X. Fabrication of Black Silicon Microneedle Arrays for High Drug Loading. J Funct Biomater 2023; 14:jfb14050245. [PMID: 37233355 DOI: 10.3390/jfb14050245] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/30/2023] [Revised: 04/18/2023] [Accepted: 04/24/2023] [Indexed: 05/27/2023] Open
Abstract
Silicon microneedle (Si-MN) systems are a promising strategy for transdermal drug delivery due to their minimal invasiveness and ease of processing and application. Traditional Si-MN arrays are usually fabricated by using micro-electro-mechanical system (MEMS) processes, which are expensive and not suitable for large-scale manufacturing and applications. In addition, Si-MNs have a smooth surface, making it difficult for them to achieve high-dose drug delivery. Herein, we demonstrate a solid strategy to prepare a novel black silicon microneedle (BSi-MN) patch with ultra-hydrophilic surfaces for high drug loading. The proposed strategy consists of a simple fabrication of plain Si-MNs and a subsequent fabrication of black silicon nanowires. First, plain Si-MNs were prepared via a simple method consisting of laser patterning and alkaline etching. The nanowire structures were then prepared on the surfaces of the plain Si-MNs to form the BSi-MNs through Ag-catalyzed chemical etching. The effects of preparation parameters, including Ag+ and HF concentrations during Ag nanoparticle deposition and [HF/(HF + H2O2)] ratio during Ag-catalyzed chemical etching, on the morphology and properties of the BSi-MNs were investigated in detail. The results show that the final prepared BSi-MN patches exhibit an excellent drug loading capability, more than twice that of plain Si-MN patches with the same area, while maintaining comparable mechanical properties for practical skin piercing applications. Moreover, the BSi-MNs exhibit a certain antimicrobial activity that is expected to prevent bacterial growth and disinfect the affected area when applied to the skin.
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Affiliation(s)
- Wei Cheng
- Jiangsu Key Laboratory of Thin Films, School of Physical Science and Technology, Soochow University, Suzhou 215006, China
| | - Xue Wang
- Department of Burn and Plastic Surgery, Suzhou Hospital Affiliated to Nanjing Medical University, Suzhou 215000, China
| | - Shuai Zou
- Jiangsu Key Laboratory of Thin Films, School of Physical Science and Technology, Soochow University, Suzhou 215006, China
- Suzhou Xiangbang Biotechnology Co., Ltd., Suzhou 215006, China
| | - Mengfei Ni
- Jiangsu Key Laboratory of Thin Films, School of Physical Science and Technology, Soochow University, Suzhou 215006, China
| | - Zheng Lu
- Jiangsu Key Laboratory of Thin Films, School of Physical Science and Technology, Soochow University, Suzhou 215006, China
| | - Longfei Dai
- Jiangsu Key Laboratory of Thin Films, School of Physical Science and Technology, Soochow University, Suzhou 215006, China
| | - Jiandong Su
- Department of Burn and Plastic Surgery, Suzhou Hospital Affiliated to Nanjing Medical University, Suzhou 215000, China
| | - Kai Yang
- Jiangsu Key Laboratory of Thin Films, School of Physical Science and Technology, Soochow University, Suzhou 215006, China
| | - Xiaodong Su
- Jiangsu Key Laboratory of Thin Films, School of Physical Science and Technology, Soochow University, Suzhou 215006, China
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Zhang Y, Loh JYY, Kherani NP. Facilely Achieved Self-Biased Black Silicon Heterojunction Photodiode with Broadband Quantum Efficiency Approaching 100. ADVANCED SCIENCE (WEINHEIM, BADEN-WURTTEMBERG, GERMANY) 2022; 9:e2203234. [PMID: 36253154 PMCID: PMC9685453 DOI: 10.1002/advs.202203234] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 06/01/2022] [Revised: 09/21/2022] [Indexed: 06/16/2023]
Abstract
Photodiodes are fundamental components in modern optoelectronics. Heterojunction photodiodes, simply configured by two different contact materials, have been a hot research topic for many years. Currently reported self-biased heterojunction photodiodes routinely have external quantum efficiency (EQE) significantly below 100% due to optical and electrical losses. Herein, an approach that virtually overcomes this 100% EQE challenge via low-aspect-ratio nanostructures and drift-dominated photocarrier transport in a heterojunction photodiode is proposed. Broadband near-ideal EQE is achieved in nanocrystal indium tin oxide/black silicon (nc-ITO/b-Si) Schottky photodiodes. The b-Si comprises nanostalagmites which balance the antireflection effect and surface morphology. The built-in electric field is explored to match the optical generation profile, realizing enhanced photocarrier transport over a broadband of photogeneration. The devices exhibit unprecedented EQE among the reported leading-edge heterojunction photodiodes: average EQE surpasses ≈98% for wavelengths of 570-925 nm, while overall EQE is greater than ≈95% from 500 to 960 nm. Further, only elementary fabrication techniques are explored to achieve these excellent device properties. A heart rate sensor driven by nanowatt faint light is demonstrated, indicating the enormous potential of this near-ideal b-Si photodiode for low power consuming applications.
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Affiliation(s)
- Yibo Zhang
- The Edward S. Rogers Sr. Department of Electrical and Computer EngineeringUniversity of Toronto10 King's College RoadTorontoOntarioM5S 3G4Canada
| | - Joel Y. Y. Loh
- The Edward S. Rogers Sr. Department of Electrical and Computer EngineeringUniversity of Toronto10 King's College RoadTorontoOntarioM5S 3G4Canada
| | - Nazir P. Kherani
- The Edward S. Rogers Sr. Department of Electrical and Computer EngineeringUniversity of Toronto10 King's College RoadTorontoOntarioM5S 3G4Canada
- Department of Materials Science and EngineeringUniversity of Toronto184 College StreetTorontoOntarioM5S 3E4Canada
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Demonstration of SWIR Silicon-Based Photodetection by Using Thin ITO/Au/Au Nanoparticles/n-Si Structure. SENSORS 2022; 22:s22124536. [PMID: 35746318 PMCID: PMC9229662 DOI: 10.3390/s22124536] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 05/03/2022] [Revised: 06/02/2022] [Accepted: 06/08/2022] [Indexed: 11/17/2022]
Abstract
Plasmonic photodetection based on the hot-electron generation in nanostructures is a promising strategy for sub-band detection due to the high conversion efficiencies; however, it is plagued with the high dark current. In this paper, we have demonstrated the plasmonic photodetection with dark current suppression to create a Si-based broadband photodetector with enhanced performance in the short-wavelength infrared (SWIR) region. By hybridizing a 3 nm Au layer with the spherical Au nanoparticles (NPs) formed by rapid thermal annealing (RTA) on Si substrate, a well-behaved ITO/Au/Au NPs/n-Si Schottky photodetector with suppressed dark current and enhanced absorption in the SWIR region is obtained. This optimized detector shows a broad detection beyond 1200 nm and a high responsivity of 22.82 mA/W at 1310 nm at -1 V, as well as a low dark current density on the order of 10-5 A/cm2. Such a Si-based plasmon-enhanced detector with desirable performance in dark current will be a promising strategy for realization of the high SNR detector while keeping fabrication costs low.
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Zhou Y, Tu B, Weng Y, Zheng F, Su X, You L, Fang L. Copper-assisted catalyzed etching for nanotextured black silicon with enhanced photoelectric-conversion properties. OPTICS EXPRESS 2021; 29:20395-20405. [PMID: 34266130 DOI: 10.1364/oe.431062] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/11/2021] [Accepted: 06/06/2021] [Indexed: 06/13/2023]
Abstract
Black silicon contains high-aspect-ratio micro/nanostructures with greatly suppressed front-surface reflection, thus possessing superior property in photoelectric devices. In this report, by a two-step copper-assisted chemical etching method, we have fabricated pyramid n+p-black silicon with optimized morphology and anti-reflectance capability, through systematically tuning the concentration of both copper ions and reducing agents, as well as the etching time. The improved optical absorption and superior charge transfer kinetics validate n+p-black silicon as a highly active photocathode in photoelectrochemical cells. The onset potential of 0.21 V vs. RHE and the saturation photocurrent density of 32.56 mA/cm2 are achieved in the optimal n+p-black silicon. In addition, the nanoporous structure with lower reflectance is also achieved in planar p-silicon via the same etching method. Moreover, the photodetectors based on planar p-black silicon show significantly enhanced photoresponsivity over a broad spectral range. This study offers a low-cost and scalable strategy to improve the photoelectric-conversion efficiency in silicon-based devices.
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Mi G, Lv J, Que L, Zhang Y, Zhou Y, Liu Z. A Dual Four-Quadrant Photodetector Based on Near-Infrared Enhanced Nanometer Black Silicon. NANOSCALE RESEARCH LETTERS 2021; 16:38. [PMID: 33638762 PMCID: PMC7914334 DOI: 10.1186/s11671-021-03499-x] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 11/06/2020] [Accepted: 02/16/2021] [Indexed: 06/12/2023]
Abstract
In this paper, a new preparation process of nanometer black silicon is proposed, by which high trapping optical Se-doped black silicon material is prepared by nanosecond pulsed laser ablation of high-resistance silicon coated with Se film in HF gas atmosphere. The results indicate that the average absorptivity of 400-2200 nm band before annealing is 96.81%, and the absorptivity maintains at 81.28% after annealing at 600 degrees. Meanwhile, black silicon prepared under the new technology is used in double four-quadrant photodetector, the results show that, at a reversed bias of 50 V, the average unit responsiveness is 0.528 A/W at 1060 nm and 0.102 A/W at 1180 nm, and the average dark current is 2 nA at inner quadrants and 8 nA at outer quadrants. The dual four-quadrant photodetector based on near-infrared enhanced black silicon has the advantages of high responsiveness, low dark current, fast response and low crosstalk, hence it is appropriate for a series of direction of applications, such as night vision detection and medical field.
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Affiliation(s)
- Guanyu Mi
- State Key Laboratory of Electronic Thin Film and Integrated Devices, University of Electronic Science and Technology of China, Cheng du, 610054, China
| | - Jian Lv
- State Key Laboratory of Electronic Thin Film and Integrated Devices, University of Electronic Science and Technology of China, Cheng du, 610054, China
| | - Longcheng Que
- State Key Laboratory of Electronic Thin Film and Integrated Devices, University of Electronic Science and Technology of China, Cheng du, 610054, China.
| | - Yi Zhang
- State Key Laboratory of Electronic Thin Film and Integrated Devices, University of Electronic Science and Technology of China, Cheng du, 610054, China
| | - Yun Zhou
- State Key Laboratory of Electronic Thin Film and Integrated Devices, University of Electronic Science and Technology of China, Cheng du, 610054, China
| | - Zhongyuan Liu
- China Electronics Technology Group Corporation, Chongqing Acoustic Optic Electronic CO.,LT, 401332, Chong qing, China
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Fan Z, Cui D, Zhang Z, Zhao Z, Chen H, Fan Y, Li P, Zhang Z, Xue C, Yan S. Recent Progress of Black Silicon: From Fabrications to Applications. NANOMATERIALS 2020; 11:nano11010041. [PMID: 33375303 PMCID: PMC7823726 DOI: 10.3390/nano11010041] [Citation(s) in RCA: 20] [Impact Index Per Article: 5.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 11/19/2020] [Revised: 12/23/2020] [Accepted: 12/23/2020] [Indexed: 01/08/2023]
Abstract
Since black silicon was discovered by coincidence, the special material was explored for many amazing material characteristics in optical, surface topography, and so on. Because of the material property, black silicon is applied in many spheres of a photodetector, photovoltaic cell, photo-electrocatalysis, antibacterial surfaces, and sensors. With the development of fabrication technology, black silicon has expanded in more and more applications and has become a research hotspot. Herein, this review systematically summarizes the fabricating method of black silicon, including nanosecond or femtosecond laser irradiation, metal-assisted chemical etching (MACE), reactive ion etching (RIE), wet chemical etching, electrochemical method, and plasma immersion ion implantation (PIII) methods. In addition, this review focuses on the progress in multiple black silicon applications in the past 10 years. Finally, the prospect of black silicon fabricating and various applications are outlined.
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Affiliation(s)
- Zheng Fan
- Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China; (Z.F.); (D.C.); (Z.Z.); (Z.Z.); (H.C.); (Y.F.); (P.L.); (Z.Z.)
| | - Danfeng Cui
- Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China; (Z.F.); (D.C.); (Z.Z.); (Z.Z.); (H.C.); (Y.F.); (P.L.); (Z.Z.)
| | - Zengxing Zhang
- Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China; (Z.F.); (D.C.); (Z.Z.); (Z.Z.); (H.C.); (Y.F.); (P.L.); (Z.Z.)
| | - Zhou Zhao
- Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China; (Z.F.); (D.C.); (Z.Z.); (Z.Z.); (H.C.); (Y.F.); (P.L.); (Z.Z.)
| | - Hongmei Chen
- Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China; (Z.F.); (D.C.); (Z.Z.); (Z.Z.); (H.C.); (Y.F.); (P.L.); (Z.Z.)
| | - Yanyun Fan
- Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China; (Z.F.); (D.C.); (Z.Z.); (Z.Z.); (H.C.); (Y.F.); (P.L.); (Z.Z.)
| | - Penglu Li
- Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China; (Z.F.); (D.C.); (Z.Z.); (Z.Z.); (H.C.); (Y.F.); (P.L.); (Z.Z.)
| | - Zhidong Zhang
- Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China; (Z.F.); (D.C.); (Z.Z.); (Z.Z.); (H.C.); (Y.F.); (P.L.); (Z.Z.)
| | - Chenyang Xue
- Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China; (Z.F.); (D.C.); (Z.Z.); (Z.Z.); (H.C.); (Y.F.); (P.L.); (Z.Z.)
- Correspondence: (C.X.); (S.Y.)
| | - Shubin Yan
- The School of Electrical Engineering, Zhejiang University of Water Resources and Electric Power, Hangzhou 310018, China
- Zhejiang-Belarus Joint Laboratory of Intelligent Equipment and System for Water Conservancy and Hydropower Safety Monitoring, Zhejiang University of Water Resources and Electric Power, Hangzhou 310018, China
- Correspondence: (C.X.); (S.Y.)
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7
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Zhang S, Jiang Q, Xu Y, Guo CF, Wu Z. Facile Fabrication of Self-Similar Hierarchical Micro-Nano Structures for Multifunctional Surfaces via Solvent-Assisted UV-Lasering. MICROMACHINES 2020; 11:E682. [PMID: 32674399 PMCID: PMC7407878 DOI: 10.3390/mi11070682] [Citation(s) in RCA: 6] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 06/10/2020] [Revised: 07/04/2020] [Accepted: 07/08/2020] [Indexed: 12/30/2022]
Abstract
Cross-scale self-similar hierarchical micro-nano structures in living systems often provide unique features on surfaces and serve as inspiration sources for artificial materials or devices. For instance, a highly self-similar structure often has a higher fractal dimension and, consequently, a larger active surface area; hence, it would have a super surface performance compared to its peer. However, artificial self-similar surfaces with hierarchical micro-nano structures and their application development have not yet received enough attention. Here, by introducing solvent-assisted UV-lasering, we establish an elegant approach to fabricate self-similar hierarchical micro-nano structures on silicon. The self-similar structure exhibits a super hydrophilicity, a high light absorbance (>90%) in an ultra-broad spectrum (200-2500 nm), and an extraordinarily high efficiency in heat transfer. Through further combinations with other techniques, such surfaces can be used for capillary assembling soft electronics, surface self-cleaning, and so on. Furthermore, such an approach can be transferred to other materials with minor modifications. For instance, by doping carbon in polymer matrix, a silicone surface with hierarchical micro-nano structures can be obtained. By selectively patterning such hierarchical structures, we obtained an ultra-high sensitivity bending sensor. We believe that such a fabrication technique of self-similar hierarchical micro-nano structures may encourage researchers to deeply explore the unique features of functional surfaces with such structures and to further discover their potentials in various applications in diverse directions.
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Affiliation(s)
- Shuo Zhang
- State Key Laboratory of Digital Manufacturing Equipment and Technology, School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan 430074, China; (S.Z.); (Q.J.); (Y.X.)
| | - Qin Jiang
- State Key Laboratory of Digital Manufacturing Equipment and Technology, School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan 430074, China; (S.Z.); (Q.J.); (Y.X.)
| | - Yi Xu
- State Key Laboratory of Digital Manufacturing Equipment and Technology, School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan 430074, China; (S.Z.); (Q.J.); (Y.X.)
| | - Chuan Fei Guo
- Department of Materials Science and Engineering, Southern University of Science and Technology, Shenzhen 518055, China;
| | - Zhigang Wu
- State Key Laboratory of Digital Manufacturing Equipment and Technology, School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan 430074, China; (S.Z.); (Q.J.); (Y.X.)
- School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan 430074, China
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Tyagi D, Wang H, Huang W, Hu L, Tang Y, Guo Z, Ouyang Z, Zhang H. Recent advances in two-dimensional-material-based sensing technology toward health and environmental monitoring applications. NANOSCALE 2020; 12:3535-3559. [PMID: 32003390 DOI: 10.1039/c9nr10178k] [Citation(s) in RCA: 115] [Impact Index Per Article: 28.8] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/07/2023]
Abstract
Monitoring harmful and toxic chemicals, gases, microorganisms, and radiation has been a challenge to the scientific community for the betterment of human health and environment. Two-dimensional (2D)-material-based sensors are highly efficient and compatible with modern fabrication technology, which yield data that can be proficiently used for health and environmental monitoring. Graphene and its oxides, black phosphorus (BP), transition metal dichalcogenides (TMDCs), metal oxides, and other 2D nanomaterials have demonstrated properties that have been alluring for the manufacture of highly sensitive sensors due to their unique material properties arising from their inherent structures. This review summarizes the properties of 2D nanomaterials that can provide a platform to develop high-performance sensors. In this review, we have also discussed the advances made in the field of infrared photodetectors and electrochemical sensors and how the structural properties of 2D nanomaterials affect sensitivity and performance. Further, this review highlights 2D-nanomaterial-based electrochemical sensors that can be used to check for contaminations from heavy metals, organic/inorganic compounds, poisonous gases, pesticides, bacteria, antibiotics, etc., in water or air, which are severe risks to human wellbeing as well as the environment. Moreover, the limitations, future prospects, and challenges for the development of sensors based on 2D materials are also discussed for future advancements.
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Affiliation(s)
- Deepika Tyagi
- Shenzhen Engineering Laboratory of Phosphorene and Optoelectronics, International Collaborative Laboratory of 2D Materials for Optoelectronics Science and Technology, Engineering Technology Research Center for 2D Material Information Function Devices and Systems of Guangdong Province, College of Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, P. R. China. and College of Electronic Science and Technology of Shenzhen University, THz Technical Research Center of Shenzhen University, Key Laboratory of Optoelectronics Devices and Systems of Ministry of Education and Guangdong Province, Shenzhen University, Shenzhen 518060, China
| | - Huide Wang
- Shenzhen Engineering Laboratory of Phosphorene and Optoelectronics, International Collaborative Laboratory of 2D Materials for Optoelectronics Science and Technology, Engineering Technology Research Center for 2D Material Information Function Devices and Systems of Guangdong Province, College of Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, P. R. China.
| | - Weichun Huang
- College of Chemistry and Chemical Engineering, Nantong University, Nantong 226019, Jiangsu, P. R. China
| | - Lanping Hu
- College of Chemistry and Chemical Engineering, Nantong University, Nantong 226019, Jiangsu, P. R. China
| | - Yanfeng Tang
- College of Chemistry and Chemical Engineering, Nantong University, Nantong 226019, Jiangsu, P. R. China
| | - Zhinan Guo
- Shenzhen Engineering Laboratory of Phosphorene and Optoelectronics, International Collaborative Laboratory of 2D Materials for Optoelectronics Science and Technology, Engineering Technology Research Center for 2D Material Information Function Devices and Systems of Guangdong Province, College of Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, P. R. China.
| | - Zhengbiao Ouyang
- College of Electronic Science and Technology of Shenzhen University, THz Technical Research Center of Shenzhen University, Key Laboratory of Optoelectronics Devices and Systems of Ministry of Education and Guangdong Province, Shenzhen University, Shenzhen 518060, China
| | - Han Zhang
- Shenzhen Engineering Laboratory of Phosphorene and Optoelectronics, International Collaborative Laboratory of 2D Materials for Optoelectronics Science and Technology, Engineering Technology Research Center for 2D Material Information Function Devices and Systems of Guangdong Province, College of Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, P. R. China.
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Malekmohammad F, Malekmohammad M. Fabrication of a broadband anti-reflection layer using metal-assisted chemical etching. APPLIED OPTICS 2019; 58:9039-9043. [PMID: 31873580 DOI: 10.1364/ao.58.009039] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/22/2019] [Accepted: 10/07/2019] [Indexed: 06/10/2023]
Abstract
In this paper, an easy and cost-efficient method to create a single anti-reflective layer on a silicon substrate is presented. In this experiment, by using the silver nanoparticles on a silicon substrate at room temperature, a porous nanostructure is created. This nanostructure significantly reduces the reflection and increases the transmission in a wide spectral range. By using this method, a porous layer on one side of the silicon substrate is fabricated. The results show that the reflection reduces to 31% and the transmission increases to 68% in the 3500-5000 nm spectral range, and these values are close to the reflection and transmission of a sample with ideal one-sided anti-reflection.
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Ilyas N, Li D, Song Y, Zhong H, Jiang Y, Li W. Low-Dimensional Materials and State-of-the-Art Architectures for Infrared Photodetection. SENSORS (BASEL, SWITZERLAND) 2018; 18:E4163. [PMID: 30486432 PMCID: PMC6308609 DOI: 10.3390/s18124163] [Citation(s) in RCA: 14] [Impact Index Per Article: 2.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 10/29/2018] [Revised: 11/22/2018] [Accepted: 11/22/2018] [Indexed: 12/13/2022]
Abstract
Infrared photodetectors are gaining remarkable interest due to their widespread civil and military applications. Low-dimensional materials such as quantum dots, nanowires, and two-dimensional nanolayers are extensively employed for detecting ultraviolet to infrared lights. Moreover, in conjunction with plasmonic nanostructures and plasmonic waveguides, they exhibit appealing performance for practical applications, including sub-wavelength photon confinement, high response time, and functionalities. In this review, we have discussed recent advances and challenges in the prospective infrared photodetectors fabricated by low-dimensional nanostructured materials. In general, this review systematically summarizes the state-of-the-art device architectures, major developments, and future trends in infrared photodetection.
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Affiliation(s)
- Nasir Ilyas
- School of Optoelectronic Information, University of Electronic Science and Technology of China, Chengdu 610054, China.
| | - Dongyang Li
- School of Optoelectronic Information, University of Electronic Science and Technology of China, Chengdu 610054, China.
| | - Yuhao Song
- School of Optoelectronic Information, University of Electronic Science and Technology of China, Chengdu 610054, China.
| | - Hao Zhong
- School of Optoelectronic Information, University of Electronic Science and Technology of China, Chengdu 610054, China.
| | - Yadong Jiang
- School of Optoelectronic Information, University of Electronic Science and Technology of China, Chengdu 610054, China.
| | - Wei Li
- State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, China.
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Zhong H, Ilyas N, Song Y, Li W, Jiang Y. Enhanced near-infrared absorber: two-step fabricated structured black silicon and its device application. NANOSCALE RESEARCH LETTERS 2018; 13:316. [PMID: 30306413 PMCID: PMC6179974 DOI: 10.1186/s11671-018-2741-9] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 08/06/2018] [Accepted: 10/01/2018] [Indexed: 06/08/2023]
Abstract
Silicon is widely used in semiconductor industry but has poor performance in near-infrared photoelectronic devices because of its high reflectance and band gap limit. In this study, two-step process, deep reactive ion etching (DRIE) method combined with plasma immersion ion implantation (PIII), are used to fabricate microstructured black silicon on the surface of C-Si. These improved surfaces doped with sulfur elements realize a narrower band gap and an enhancement of light absorptance, especially in the near-infrared range (800 to 2000 nm). Meanwhile, the maximum light absorptance increases significantly up to 83%. A Si-PIN photoelectronic detector with microstructured black silicon at the back surface exhibits remarkable device performance, leading to a responsivity of 0.53 A/W at 1060 nm. This novel microstructured black silicon, combining narrow band gap characteristic, could have a potential application in near-infrared photoelectronic detection.
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Affiliation(s)
- Hao Zhong
- State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, 610054 China
| | - Nasir Ilyas
- School of Optoelectronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, 610054 China
| | - Yuhao Song
- School of Optoelectronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, 610054 China
| | - Wei Li
- State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, 610054 China
| | - Yadong Jiang
- State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, 610054 China
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12
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Zhou ZQ, Hu F, Zhou WJ, Chen HY, Ma L, Zhang C, Lu M. An Investigation on a Crystalline-Silicon Solar Cell with Black Silicon Layer at the Rear. NANOSCALE RESEARCH LETTERS 2017; 12:623. [PMID: 29247301 PMCID: PMC5732119 DOI: 10.1186/s11671-017-2388-y] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 11/08/2017] [Accepted: 11/28/2017] [Indexed: 06/07/2023]
Abstract
Crystalline-Si (c-Si) solar cell with black Si (b-Si) layer at the rear was studied in order to develop c-Si solar cell with sub-band gap photovoltaic response. The b-Si was made by chemical etching. The c-Si solar cell with b-Si at the rear was found to perform far better than that of similar structure but with no b-Si at the rear, with the efficiency being increased relatively by 27.7%. This finding was interesting as b-Si had a large specific surface area, which could cause high surface recombination and degradation of solar cell performance. A graded band gap was found to form at the rear of the c-Si solar cell with b-Si layer at the rear. This graded band gap tended to expel free electrons away from the rear, thus reducing the probability of electron-hole recombination at b-Si and improving the performance of c-Si solar cell.
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Affiliation(s)
- Zhi-Quan Zhou
- Department of Optical Science and Engineering and Shanghai Ultra-Precision Optical Manufacturing Engineering Center, Fudan University, Shanghai, 200433 China
| | - Fei Hu
- Department of Optical Science and Engineering and Shanghai Ultra-Precision Optical Manufacturing Engineering Center, Fudan University, Shanghai, 200433 China
| | - Wen-Jie Zhou
- Department of Optical Science and Engineering and Shanghai Ultra-Precision Optical Manufacturing Engineering Center, Fudan University, Shanghai, 200433 China
| | - Hong-Yan Chen
- Department of Micro-electronics, Fudan University, Shanghai, 200433 China
| | - Lei Ma
- Department of Optical Science and Engineering and Shanghai Ultra-Precision Optical Manufacturing Engineering Center, Fudan University, Shanghai, 200433 China
| | - Chi Zhang
- Department of Optical Science and Engineering and Shanghai Ultra-Precision Optical Manufacturing Engineering Center, Fudan University, Shanghai, 200433 China
| | - Ming Lu
- Department of Optical Science and Engineering and Shanghai Ultra-Precision Optical Manufacturing Engineering Center, Fudan University, Shanghai, 200433 China
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