Embedded centrosymmetric multilayer stacks as complete-transmission quarter-wave and half-wave retarders under conditions of frustrated total internal reflection.
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA. A, OPTICS, IMAGE SCIENCE, AND VISION 2007;
24:3255-60. [PMID:
17912318 DOI:
10.1364/josaa.24.003255]
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Abstract
A centrosymmetric multilayer stack of two transparent materials, which is embedded in a high-index prism, can function as a complete-transmission quarter-wave or half-wave retarder (QWR or HWR) under conditions of frustrated total internal reflection. The multilayer consists of a high-index center layer sandwiched between two identical low-index films with high-index-low-index bilayers repeated on both sides of the central trilayer, maintaining the symmetry of the entire stack and constituting a QWR (Delta(t)=90 degrees or 270 degrees ) or HWR (Delta(t)=180 degrees ) in transmission. A QWR design at wavelength lambda=1.55 microm is presented that employs an 11-layer stack of Si and SiO(2) thin films, which is embedded in a GaP cube prism. The intensity transmittances for the p and s polarizations remain >99% and Delta(t) deviates from 90 degrees by <+/-3 degrees over a 100 nm spectral bandwidth (1.5< or =lambda< or =1.6 microm), and by < or =+/-7 degrees over an internal field view of +/-1 degrees (incidence angle 44 degrees < or = phi(0)< or =46 degrees inside the prism). An HWR design at lambda=1.55 microm employs seven layers of Si and SiO(2) thin films embedded in a Si cube, has an average transmittance >93%, and Delta(t) that differs from 180 degrees by <+/-0.3 degrees over a 100 nm bandwidth (1.5< or =lambda< or =1.6 microm) and by <+/-17 degrees over an internal field view of +/-1 degree . The sensitivity of these devices to film-thickness errors is also considered.
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