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For: Watkins SE, Zhang CZ, Walser RM, Becker MF. Electrical performance of laser damaged silicon photodiodes. Appl Opt 1990;29:827-835. [PMID: 20556191 DOI: 10.1364/ao.29.000827] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/29/2023]
Number Cited by Other Article(s)
1
Yuan D, Di W, Zhi W, Ran FT. Study on the inversion of doped concentration induced by millisecond pulsed laser irradiation silicon-based avalanche photodiode. APPLIED OPTICS 2018;57:1051-1055. [PMID: 29469886 DOI: 10.1364/ao.57.001051] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/10/2017] [Accepted: 01/04/2018] [Indexed: 06/08/2023]
2
Li Z, Wang X, Shen Z, Lu J, Ni X. Numerical simulation of millisecond laser-induced damage in silicon-based positive-intrinsic-negative photodiode. APPLIED OPTICS 2012;51:2759-2766. [PMID: 22614501 DOI: 10.1364/ao.51.002759] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 01/19/2012] [Accepted: 03/09/2012] [Indexed: 06/01/2023]
3
Li P, Wen Y, Cai Y, Li L. Light emitting diode fault detection using p-n junction photovoltaic effect. THE REVIEW OF SCIENTIFIC INSTRUMENTS 2009;80:055108. [PMID: 19485535 DOI: 10.1063/1.3137055] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/27/2023]
4
Arora VK, Dawar AL. Laser-induced damage studies in silicon and silicon-based photodetectors. APPLIED OPTICS 1996;35:7061-7065. [PMID: 21151308 DOI: 10.1364/ao.35.007061] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/30/2023]
5
Zhang C, Blarre L, Walser RM, Becker MF. Mechanisms for laser-induced functional damage to silicon charge-coupled imaging sensors. APPLIED OPTICS 1993;32:5201-5210. [PMID: 20856326 DOI: 10.1364/ao.32.005201] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/29/2023]
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