Measurement of the complex refractive index of isotropic materials with mueller matrix polarimetry

Applications of Mueller Matrix Polarimetry to Biological and Agricultural Diagnostics: A Review

The review contains a systematization of the main approaches to the practical implementation of Mueller matrix polarimetry and the prospects for its application in biology and agriculture. The most typical optical layouts for measuring the Mueller matrix of various objects, such as disperse systems, tissues and surface structures, are discussed. Mueller matrix measurements, being integrated into standard schemes of conventional optical methods, such as scatterometry, optical coherence tomography, fluorimetry, spectrophotometry and reflectometry, can significantly expand their capabilities in the characterization of biological systems and bioorganic materials. Additionally, microwave Mueller matrix polarimetry can be used for monitoring soil conditions and crop growth. The proposed systematization is aimed at outlining the conceptual directions for the development of non-invasive diagnostic tools based on measuring the Mueller matrix, primarily with a focus on biological research and agricultural practice.

Snapshot spectroscopic Mueller matrix polarimetry based on spectral modulation with increased channel bandwidth

This paper presents a snapshot spectroscopic Mueller matrix polarimetry based on spectral modulation. The polarization state generator consists of a linear polarizer in front of two high-order retarders, and the polarization state analyzer is formed by two non-polarization beam splitters incorporated with three high-order retarder/linear analyzer pairs. It can simultaneously generate three modulated spectra used for reconstructing the 16 spectroscopic Mueller elements of the sample. Since each of the modulated spectra produces seven separate channels equally spaced in the Fourier domain, the channel bandwidth can be enhanced efficiently compared with the conventional spectrally modulated spectroscopic Mueller matrix polarimetry. The feasibility of the proposed spectroscopic Mueller matrix polarimetry is demonstrated by the experimental measurement of an achromatic quarter-wave plate.

Spectroscopic Mueller matrix polarimeter based on spectro-temporal modulation

A spectroscopic Mueller matrix polarimeter based on spectro-temporal modulation with a compact, low-cost, and birefringent crystal-based configuration has been developed. The polarization state generator and polarization state analyzer in the system consists of a polarizer in front of two high-order retarders with equal thickness and a rotating achromatic quarter wave-plate followed by a fixed analyzer, respectively. It can acquire the 16 spectroscopic elements of the Mueller matrix in broadband with a faster measurement speed than that of the conventional spectroscopic Mueller matrix polarimeter based on a dual-rotating retarder. In addition, the spectral polarization modulation provided by the polarization state generator can produce five separate channels in the Fourier domain, which leads to a larger bandwidth of each channel than that of the existing spectral modulated spectroscopic Mueller matrix polarimeters. Experiment on the measurements of an achromatic quarter-wave plate oriented at different azimuths and SiO₂ thin films deposited on silicon wafers with different thicknesses are carried out to show the feasibility of the developed spectroscopic Mueller matrix polarimeter.

Mid-infrared Mueller ellipsometer with pseudo-achromatic optical elements

The purpose of this article is to present a new broadband Mueller ellipsometer designed to work in the mid-infrared range, from 3 to 14 μm. The Mueller ellipsometer, which can be mounted in reflection or in transmission configuration, consists of a polarization state generator (PSG), a sample holder, and a polarization state analyzer (PSA). The PSG consists of one linear polarizer and a retarder sequentially rotated to generate a set of four optimal polarization states. The retarder consists of a biprism made of two identical Fresnel rhombs disposed symmetrically and joined by an optical contact, giving the ensemble a "V" shape. Retardation is induced by the four total internal reflections that the beam undergoes when it propagates through the biprism. Total internal reflection allows the generation of a quasi-achromatic retardation. The PSA is identical to the PSG, but with its optical elements mounted in reverse order. After a measurement run, the instrument yields a set of sixteen independent values, which is the minimum amount of data required to calculate the Mueller matrix of the sample. The design of the Mueller ellipsometer is based on the optimization of an objective criterion that allows for minimizing the propagation of errors from raw data to the Mueller matrix of the sample. The pseudo-achromatic optical elements ensure a homogeneous quality of the measurements for all wavelengths. The performance of the Mueller ellipsometer, in terms of precision and accuracy, is discussed and illustrated with a few examples.

Dual-modulator broadband infrared Mueller matrix ellipsometry

A broadband mid-infrared Mueller matrix ellipsometer is described based on two photoelastic modulators and a step-scan interferometer. The data are analyzed using a combination hardware-software double Fourier transformation. Obtaining spectra of the Mueller matrix elements requires that the infrared wavelength-dependent retardation amplitude of the modulators be known through calibration and subsequently incorporated into the data processing. The spectroscopic capability of the instrument is demonstrated in transmission and reflection geometries by the measured Mueller matrices of air, an anisotropic quartz crystal, and the ZnSe-water interface, each from 2500-4000 cm(-1).

Ti: sapphire-based picosecond visible-infrared sum-frequency spectroscopy from 900-3100 cm-1

Visible-infrared sum-frequency spectroscopy is ideally suited to the study of surfaces and interfaces. This paper introduces new sum-frequency spectroscopy instrumentation that we have developed with two novel features: (1) stable and robust infrared generation in the 900-3100 cm(-1) (11-3.2 microm) region using an amplified Ti : sapphire oscillator with a home-built OPG/OPA, and (2) continuous tuning over either 900-2700 cm(-1) (11-3.7 microm) or 1800-3100 cm(-1) (5.5-3.2 microm) in a single experiment. All practical details of baseline correction issues due to the picosecond pulses (including variation in infrared (IR) energy, spatial and temporal overlap, Fresnel coefficients) are addressed while demonstrating signal throughout this region from an amorphous gold surface. A sum-frequency spectrum from an oriented polymer is shown as a complete example of the data treatment, which reveals the vibrational modes accessible in this wavelength region.