Clustered-minority-pixel error diffusion

A Machine Learning Approach to Design of Aperiodic, Clustered-Dot Halftone Screens via Direct Binary Search

Aperiodic, clustered-dot, halftone patterns have recently become popular for commercial printing of continuous-tone images with laser, electrophotographic presses, because of their inherent stability and resistance to moiré artifacts. Halftone screens designed using the multistage, multipass, clustered direct binary search (MS-MP-CLU-DBS) algorithm can yield halftone patterns with very high visual quality. But the characteristics of these halftone patterns depend on three input parameters for which there are no known formulas to choose their values to yield halftone patterns of a certain quality level and scale. Using machine learning methods, two predictors are developed that take as input these three parameters. One predicts the quality level of the halftone pattern. The other one predicts the scale of the halftone pattern. To provide ground truth information for training these predictors, human subjects viewed a large number of halftone patches generated from MS-MP-CLU-DBS-designed screens and assigned each patch to one of four quality levels. For each patch, the location of the peak in the radially averaged power spectrum (RAPS) is calculated as a measure of the scale or effective line frequency of the pattern. Experimental results demonstrate the accuracy of the two predictors and the effectiveness of screen design procedures based on these predictors to generate both monochrome and color high quality halftone images.

Clustered-dot halftoning with direct binary search

In this paper, we present a new algorithm for aperiodic clustered-dot halftoning based on direct binary search (DBS). The DBS optimization framework has been modified for designing clustered-dot texture, by using filters with different sizes in the initialization and update steps of the algorithm. Following an intuitive explanation of how the clustered-dot texture results from this modified framework, we derive a closed-form cost metric which, when minimized, equivalently generates stochastic clustered-dot texture. An analysis of the cost metric and its influence on the texture quality is presented, which is followed by a modification to the cost metric to reduce computational cost and to make it more suitable for screen design.

Ranked dither for high-quality robust printing

A robust parallelized halftoning method is proposed that is insensitive to dot loss, which can be a problem with xerographic and high-resolution printing. The method uses standard clustered-dot dither for smooth image blocks but uses the rankings of dither thresholds to halftone image blocks with high spatial activity. Experiments compare the ranked dither to dither, error diffusion, and green-noise error diffusion for four-color printing using standard clustered-dot dither masks at standard angles for the cyan, magenta, yellow, and black planes, respectively.

A new framework for characterization of halftone textures

Characterization of halftone texture is important for quantitative assessment of halftone quality. In this paper, we develop a new framework based on directional local sequency analysis and a filter bank structure. We decompose a halftone image into subband images, from which we can easily reconstruct the original halftone. Based on these subband images, we define the directional sequency spectrum which is analogous to the two-dimensional Fourier spectrum, and formulate several texture measures. Two test image sets are used to justify these measures.

Quantization of accumulated diffused errors in error diffusion

Due to its high image quality and moderate computational complexity, error diffusion is a popular halftoning algorithm for use with inkjet printers. However, error diffusion is an inherently serial algorithm that requires buffering a full row of accumulated diffused error (ADE) samples. For the best performance when the algorithm is implemented in hardware, the ADE data should be stored on the chip on which the error diffusion algorithm is implemented. However, this may result in an unacceptable hardware cost. In this paper, we examine the use of quantization of the ADE to reduce the amount of data that must be stored. We consider both uniform and nonuniform quantizers. For the nonuniform quantizers, we build on the concept of tone-dependency in error diffusion, by proposing several novel feature-dependent quantizers that yield improved image quality at a given bit rate, compared to memoryless quantizers. The optimal design of these quantizers is coupled with the design of the tone-dependent parameters associated with error diffusion. This is done via a combination of the classical Lloyd-Max algorithm and the training framework for tone-dependent error diffusion. Our results show that 4-bit uniform quantization of the ADE yields the same halftone quality as error diffusion without quantization of the ADE. At rates that vary from 2 to 3 bits per pixel, depending on the selectivity of the feature on which the quantizer depends, the feature-dependent quantizers achieve essentially the same quality as 4-bit uniform quantization.