Characterization of a nematic PALC at large oblique incidence angles

Microstructural and microspectral characterization of a vertically aligned liquid crystal display panel

The microstructural and microspectral characteristics of a vertically aligned liquid crystal display (VA-LCD) panel were obtained noninvasively for the first time. With 1 μm axial and 2 μm transversal resolutions, the cell gap profile beneath the patterned thin-film transistor of the VA-LCD panel can clearly be resolved. The thicknesses of the multiple thin-film layers and the embedded defects can also be unveiled. As far as spectral response is concerned, the light transmittance at the layer boundaries can be estimated from the measured reflectance, which is crucial information for the design of a highly transmissive panel. The color shift of the VA-LCD panel due to fabrication error was evaluated.

Two-dimensional cell parameters of twisted nematic liquid crystal with an amplitude-sensitive heterodyne ellipsometer

To be compared with the wavelength modulation technique for measuring two-dimensional (2D) cell parameters of a twisted nematic liquid crystal (TN-LC), we propose an amplitude-sensitive heterodyne ellipsometer (ASHE) of a single wavelength that is able to characterize TN-LC in 2D quantitatively. A quarter-wave plate (QWP) is rotated continuously in this setup to modulate the polarization state of the incident laser beam to obtain the amplitude ratio of the S and P waves versus the rotation angle of the QWP. Thus the cell parameters, including the twisted angle Phi, untwisted phase retardation Gamma, rubbing direction angle alpha, and cell gap d, of a TN-LC cell are obtained simultaneously by best fitting the detected amplitude ratio with a prediction based on the transfer matrix of TN-LC cell. 2D distributions of (Phi,Gamma,alpha,d) are then obtained either by scanning the TN-LC cell or by using a CCD camera for high-speed measurement. In this experiment, the stability of the amplitude-ratio measurement of the proposed ASHE was 0.5%. The goal is to integrate the rotating elliptical wave plate with the TN-LC cell in a heterodyne ellipsometer to obtain cell parameters at amplitude sensitivity. This increases not only the sensitivity of the measurement but also the possibility of extending the 2D distribution of cell parameters in real time.

High speed interferometric ellipsometer

A novel high speed interferometric ellipsometer (HSIE) is proposed and demonstrated. It is based on a novel differential-phase decoder which is able to convert the phase modulation into amplitude modulation in a polarized heterodyne interferometer. Not only high detection sensitivity but also fast response ability on ellipsometric parameters (EP) measurements based on amplitude-sensitive method is constructed whereas different amplitudes with respect to P and S polarized heterodyne signals in this phase to amplitude modulation conversion is discussed. The ability of HSIE was verified by testing a quarter wave plate while a real time differential-phase detection of a liquid crystal device versus applied voltage by using HSIE was demonstrated too. These results confirm that HSIE is able to characterize the optical property of specimen in terms of EP at high speed and high detection sensitivity experimentally.