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Quintard L, Strelkov V, Vabek J, Hort O, Dubrouil A, Descamps D, Burgy F, Péjot C, Mével E, Catoire F, Constant E. Optics-less focusing of XUV high-order harmonics. SCIENCE ADVANCES 2019; 5:eaau7175. [PMID: 30972360 PMCID: PMC6450687 DOI: 10.1126/sciadv.aau7175] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/09/2018] [Accepted: 02/12/2019] [Indexed: 05/23/2023]
Abstract
By experimentally studying high-order harmonic beams generated in gases, we show how the spatial characteristics of these ultrashort extreme-ultraviolet (XUV) beams can be finely controlled when a single fundamental beam generates harmonics in a thin gas medium. We demonstrate that these XUV beams can be emitted as converging beams and thereby get focused after generation. We study this optics-less focusing using a spatially chirped beam that acts as a probe located inside the harmonic generation medium. We analyze the XUV beam evolution with an analytical model and obtain very good agreement with experimental measurements. The XUV foci sizes and positions vary strongly with the harmonic order, and the XUV waist can be located at arbitrarily large distances from the generating medium. We discuss how intense XUV fields can be obtained with optics-less focusing and how the order-dependent XUV beam characteristics are compatible with broadband XUV irradiation and attosecond science.
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Affiliation(s)
- L. Quintard
- Université de Bordeaux, CNRS, CEA, Centre Laser Intenses et Applications (CELIA), 43 rue P. Noailles, 33400 Talence, France
| | - V. Strelkov
- Prokhorov General Physics Institute of the Russian Academy of Sciences, 38, Vavilova Street, Moscow 119991, Russia
- Moscow Institute of Physics and Technology (State University), 141700 Dolgoprudny, Moscow Region, Russia
| | - J. Vabek
- Université de Bordeaux, CNRS, CEA, Centre Laser Intenses et Applications (CELIA), 43 rue P. Noailles, 33400 Talence, France
| | - O. Hort
- Université de Bordeaux, CNRS, CEA, Centre Laser Intenses et Applications (CELIA), 43 rue P. Noailles, 33400 Talence, France
| | - A. Dubrouil
- Université de Bordeaux, CNRS, CEA, Centre Laser Intenses et Applications (CELIA), 43 rue P. Noailles, 33400 Talence, France
| | - D. Descamps
- Université de Bordeaux, CNRS, CEA, Centre Laser Intenses et Applications (CELIA), 43 rue P. Noailles, 33400 Talence, France
| | - F. Burgy
- Université de Bordeaux, CNRS, CEA, Centre Laser Intenses et Applications (CELIA), 43 rue P. Noailles, 33400 Talence, France
| | - C. Péjot
- Université de Bordeaux, CNRS, CEA, Centre Laser Intenses et Applications (CELIA), 43 rue P. Noailles, 33400 Talence, France
| | - E. Mével
- Université de Bordeaux, CNRS, CEA, Centre Laser Intenses et Applications (CELIA), 43 rue P. Noailles, 33400 Talence, France
| | - F. Catoire
- Université de Bordeaux, CNRS, CEA, Centre Laser Intenses et Applications (CELIA), 43 rue P. Noailles, 33400 Talence, France
| | - E. Constant
- Université de Bordeaux, CNRS, CEA, Centre Laser Intenses et Applications (CELIA), 43 rue P. Noailles, 33400 Talence, France
- Université de Lyon, Université Claude Bernard Lyon 1, CNRS, Institut Lumière Matière (ILM), 69622 Villeurbanne, France
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