Depth resolved snapshot energy-dispersive X-ray diffraction using a conical shell beam

Sparse interleaved sampling for high resolution focal construct geometry X-ray tomography

We demonstrate interleaved sampling by multiplexing conical subshells within the tomosynthesis and raster scanning a phantom through a 150 kV shell X-ray beam. Each view comprises pixels sampled on a regular 1 mm grid, which is then upscaled by padding with null pixels before tomosynthesis. We show that upscaled views comprising 1% sample pixels and 99% null pixels increase the contrast transfer function (CTF) computed from constructed optical sections from approximately 0.6 line pairs/mm to 3 line pairs/mm. The driver of our method is to complement work concerning the application of conical shell beams to the measurement of diffracted photons for materials identification. Our approach is relevant to time-critical, and dose-sensitive analytical scanning applications in security screening, process control and medical imaging.

Conical shell illumination incorporating a moving aperture for depth-resolved high-energy X-ray diffraction

In many applications, the main limitation of X-ray absorption methods is that the signals measured are a function of the attenuation coefficient, which tells us almost nothing about the chemical or crystallographic nature of objects under inspection. To calculate fundamental crystallographic parameters requires the measurement of diffracted photons from a sample. Standard laboratory diffraction methods have been refined for well over a century and provide 'gold standard' structural models for well-prepared samples and single crystals but have little applicability for thick heterogeneous samples as demanded by many screening applications. We present a new high-energy X-ray diffraction probe, which in comparison with previous depth-resolving hollow beam techniques, requires a single beam, point detector and a simple swept aperture to resolve sample signatures at unknown locations within an inspection space. We perform Monte Carlo simulations to support experiments on both single- and multiple-material localisation and identification. The new probe is configured and tested using low-cost commercial components to provide a rapid and cost-effective solution for applications including explosives detection, process control and diagnostics.

Depth resolved pencil beam radiography using AI - a proof of principle study

AIMS

Clinical radiographic imaging is seated upon the principle of differential keV photon transmission through an object. At clinical x-ray energies the scattering of photons causes signal noise and is utilized solely for transmission measurements. However, scatter - particularly Compton scatter, is characterizable. In this work we hypothesized that modern radiation sources and detectors paired with deep learning techniques can use scattered photon information constructively to resolve superimposed attenuators in planar x-ray imaging.

METHODS

We simulated a monoenergetic x-ray imaging system consisting of a pencil beam x-ray source directed at an imaging target positioned in front of a high spatial- and energy-resolution detector array. The setup maximizes information capture of transmitted photons by measuring off-axis scatter location and energy. The signal was analyzed by a convolutional neural network, and a description of scattering material along the axis of the beam was derived. The system was virtually designed/tested using Monte Carlo processing of simple phantoms consisting of 10 pseudo-randomly stacked air/bone/water materials, and the network was trained by solving a classification problem.

RESULTS

From our simulations we were able to resolve traversed material depth information to a high degree, within our simple imaging task. The average accuracy of the material identification along the beam was 0.91±0.01, with slightly higher accuracy towards the entrance/exit peripheral surfaces of the object. The average sensitivity and specificity was 0.91 and 0.95, respectively.

CONCLUSIONS

Our work provides proof of principle that deep learning techniques can be used to analyze scattered photon patterns which can constructively contribute to the information content in radiography, here used to infer depth information in a traditional 2D planar setup. This principle, and our results, demonstrate that the information in Compton scattered photons may provide a basis for further development. The work was limited by simple testing scenarios and without yet integrating complexities or optimizations. The ability to scale performance to the clinic remains unexplored and requires further study.

Combined X-ray diffraction and absorption tomography using a conical shell beam

We combine diffraction and absorption tomography by raster scanning samples through a hollow cone of pseudo monochromatic X-rays with a mean energy of 58.4 keV. A single image intensifier takes 90x90 (x,y) snapshots during the scan. We demonstrate a proof-of-principle of our technique using a heterogeneous three-dimensional (x,y,z) phantom (90x90x170 mm³) comprised of different material phases, i.e., copper and sodium chlorate. Each snapshot enables the simultaneous measurement of absorption contrast and diffracted flux. The axial resolution was ~1 mm along the (x,y) orthogonal scan directions and ~7 mm along the z-axis. The tomosynthesis of diffracted flux measurements enable the calculation of d-spacing values with ~0.1 Å full width at half maximum (FWHM) at ~2 Å. Thus the identified materials may be color-coded in the absorption optical sections. Characterization of specific material phases is of particular interest in security screening for the identification of narcotics and a wide range of homemade explosives concealed within complex "everyday objects." Other potential application areas include process control and biological imaging.

Confocal energy-dispersive X-ray diffraction tomography employing a conical shell beam

We introduce a new high-energy X-ray diffraction tomography technique for volumetric materials characterization. In this method, a conical shell beam is raster scanned through the samples. A central aperture optically couples the diffracted flux from the samples onto a pixelated energy-resolving detector. Snapshot measurements taken during the scan enable the construction of depth-resolved dark-field section images. The calculation of d-spacing values enables the mapping of material phase in a volumetric image. We demonstrate our technique using five ~15 mm thick, axially separated samples placed within a polymer tray of the type used routinely in airport security stations. Our method has broad analytical utility due to scalability in both scan size and X-ray energy. Additional application areas include medical diagnostics, materials science, and process control.

X-ray diffraction tomography with limited projection information

X-ray diffraction tomography (XDT) records the spatially-resolved X-ray diffraction profile of an extended object. Compared to conventional transmission-based tomography, XDT displays high intrinsic contrast among materials of similar electron density and improves the accuracy in material identification thanks to the molecular structural information carried by diffracted photons. However, due to the weak diffraction signal, a tomographic scan covering the entire object typically requires a synchrotron facility to make the acquisition time more manageable. Imaging applications in medical and industrial settings usually do not require the examination of the entire object. Therefore, a diffraction tomography modality covering only the region of interest (ROI) and subsequent image reconstruction techniques with truncated projections are highly desirable. Here we propose a table-top diffraction tomography system that can resolve the spatially-variant diffraction form factor from internal regions within extended samples. We demonstrate that the interior reconstruction maintains the material contrast while reducing the imaging time by 6 folds. The presented method could accelerate the acquisition of XDT and be applied in portable imaging applications with a reduced radiation dose.