Pupil-aberration calibration with controlled illumination for quantitative phase imaging

Fourier space aberration correction for high resolution refractive index imaging using incoherent light

An aberration correction method is introduced for 3D phase deconvolution microscopy. Our technique capitalizes on multiple illumination patterns to iteratively extract Fourier space aberrations, utilizing the overlapping information inherent in these patterns. By refining the point spread function based on the retrieved aberration data, we significantly improve the precision of refractive index deconvolution. We validate the effectiveness of our method on both synthetic and biological three-dimensional samples, achieving notable enhancements in resolution and measurement accuracy. The method's reliability in aberration retrieval is further confirmed through controlled experiments with intentionally induced spherical aberrations, underscoring its potential for wide-ranging applications in microscopy and biomedicine.

Phase aberration separation for holographic microscopy by alternating direction sparse optimization

The morphology and dynamics of label-free tissues can be exploited by sample-induced changes in the optical field from quantitative phase imaging. Its sensitivity to subtle changes in the optical field makes the reconstructed phase susceptible to phase aberrations. We import variable sparse splitting framework on quantitative phase aberration extraction based on alternating direction aberration free method. The optimization and regularization in the reconstructed phase are decomposed into object terms and aberration terms. By formulating the aberration extraction as a convex quadratic problem, the background phase aberration can be fast and directly decomposed with the specific complete basis functions such as Zernike or standard polynomials. Faithful phase reconstruction can be obtained by eliminating global background phase aberration. The aberration-free two-dimensional and three-dimensional imaging experiments are demonstrated, showing the relaxation of the strict alignment requirements for the holographic microscopes.