1
|
Jia W, Lin D, Menon R, Sensale-Rodriguez B. Multifocal multilevel diffractive lens by wavelength multiplexing. APPLIED OPTICS 2023; 62:6931-6938. [PMID: 37707032 DOI: 10.1364/ao.497775] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/26/2023] [Accepted: 08/21/2023] [Indexed: 09/15/2023]
Abstract
Flat lenses with focal length tunability can enable the development of highly integrated imaging systems. This work explores machine learning to inverse design a multifocal multilevel diffractive lens (MMDL) by wavelength multiplexing. The MMDL output is multiplexed in three color channels, red (650 nm), green (550 nm), and blue (450 nm), to achieve varied focal lengths of 4 mm, 20 mm, and 40 mm at these three color channels, respectively. The focal lengths of the MMDL scale significantly with the wavelength in contrast to conventional diffractive lenses. The MMDL consists of concentric rings with equal widths and varied heights. The machine learning method is utilized to optimize the height of each concentric ring to obtain the desired phase distribution so as to achieve varied focal lengths multiplexed by wavelengths. The designed MMDL is fabricated through a direct-write laser lithography system with gray-scale exposure. The demonstrated singlet lens is miniature and polarization insensitive, and thus can potentially be applied in integrated optical imaging systems to achieve zooming functions.
Collapse
|
2
|
Dong B, Yang Y, Liu Y, Li C, Yang C, Xue C. Design of adjustable multifocal diffractive optical elements with an improved smooth phase profile by continuous variable curve with multi-subperiods method. OPTICS EXPRESS 2023; 31:28338-28354. [PMID: 37710890 DOI: 10.1364/oe.497346] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/06/2023] [Accepted: 07/30/2023] [Indexed: 09/16/2023]
Abstract
Multifocal diffractive optical elements (MDOEs), which produce arbitrary light distribution, are widely used in lightweight and compact optical systems. MDOEs that are combined with multiple functions tend to have complex step structures, limiting their applications. We propose a facile method named continuous variable curve with multi-subperiods (CVCMS) to design adjustable multifocal single-layer diffractive optical elements. Through the analysis, the model achieved arbitrary diffraction efficiency distribution with an improved smooth continuous phase profile in each diffractive ring while retaining the periodicity. To display the high design freedom of the method, we utilized this method to design and discuss a broadband multifocal intraocular lens (MIOL) focused on the optimization of far focal point. Finally, the method was compared with other multifocal design methods. The results show that the CVCMS method achieved adjustable multifocal design with better performance and smoother profile than other MDOE design techniques. The proposed model can be applied to multifocal ophthalmic lens designs.
Collapse
|
3
|
Fusco S, Oscurato SL, Salvatore M, Reda F, Moujdi S, De Oliveira M, Ambrosio A, Centore R, Borbone F. Efficient High-Refractive-Index Azobenzene Dendrimers Based on a Hierarchical Supramolecular Approach. CHEMISTRY OF MATERIALS : A PUBLICATION OF THE AMERICAN CHEMICAL SOCIETY 2023; 35:3722-3730. [PMID: 37181674 PMCID: PMC10173454 DOI: 10.1021/acs.chemmater.3c00550] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 03/10/2023] [Revised: 04/12/2023] [Indexed: 05/16/2023]
Abstract
Real-time manipulation of light in a diffractive optical element made with an azomaterial, through the light-induced reconfiguration of its surface based on mass transport, is an ambitious goal that may enable new applications and technologies. The speed and the control over photopatterning/reconfiguration of such devices are critically dependent on the photoresponsiveness of the material to the structuring light pattern and on the required extent of mass transport. In this regard, the higher the refractive index (RI) of the optical medium, the lower the total thickness and inscription time can be. In this work, we explore a flexible design of photopatternable azomaterials based on hierarchically ordered supramolecular interactions, used to construct dendrimer-like structures by mixing specially designed sulfur-rich, high-refractive-index photoactive and photopassive components in solution. We demonstrate that thioglycolic-type carboxylic acid groups can be selectively used as part of a supramolecular synthon based on hydrogen bonding or readily converted to carboxylate and participate in a Zn(II)-carboxylate interaction to modify the structure of the material and fine-tune the quality and efficiency of photoinduced mass transport. Compared with a conventional azopolymer, we demonstrate that it is possible to fabricate high-quality, thinner flat diffractive optical elements to reach the desired diffraction efficiency by increasing the RI of the material, achieved by maximizing the content of high molar refraction groups in the chemical structure of the monomers.
Collapse
Affiliation(s)
- Sandra Fusco
- Department
of Chemical Sciences, University of Napoli
Federico II, Complesso Universitario di Monte Sant’Angelo, Via Cintia, 80126 Napoli, Italy
| | - Stefano Luigi Oscurato
- Department
of Physics E. Pancini, University of Napoli
Federico II, Complesso Universitario di Monte Sant’Angelo, Via Cintia, 80126 Napoli, Italy
| | - Marcella Salvatore
- Centro
Servizi Metrologici e tecnologici Avanzati (CeSMA), University of Napoli Federico II, Complesso Universitario di Monte
Sant’Angelo, Via
Cintia, 80126 Napoli, Italy
| | - Francesco Reda
- Department
of Physics E. Pancini, University of Napoli
Federico II, Complesso Universitario di Monte Sant’Angelo, Via Cintia, 80126 Napoli, Italy
| | - Sara Moujdi
- CNST@POLIMI
- Fondazione Istituto Italiano di Tecnologia, Via Pascoli 70, 20133 Milano, Italy
| | - Michael De Oliveira
- CNST@POLIMI
- Fondazione Istituto Italiano di Tecnologia, Via Pascoli 70, 20133 Milano, Italy
| | - Antonio Ambrosio
- CNST@POLIMI
- Fondazione Istituto Italiano di Tecnologia, Via Pascoli 70, 20133 Milano, Italy
| | - Roberto Centore
- Department
of Chemical Sciences, University of Napoli
Federico II, Complesso Universitario di Monte Sant’Angelo, Via Cintia, 80126 Napoli, Italy
| | - Fabio Borbone
- Department
of Chemical Sciences, University of Napoli
Federico II, Complesso Universitario di Monte Sant’Angelo, Via Cintia, 80126 Napoli, Italy
- CNST@POLIMI
- Fondazione Istituto Italiano di Tecnologia, Via Pascoli 70, 20133 Milano, Italy
| |
Collapse
|
4
|
Salvatore M, Reda F, Borbone F, Januariyasa IK, Maddalena P, Oscurato SL. Diffractive Refractometer Based on Scalar Theory. Polymers (Basel) 2023; 15:polym15071605. [PMID: 37050219 PMCID: PMC10096849 DOI: 10.3390/polym15071605] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/22/2023] [Revised: 03/20/2023] [Accepted: 03/21/2023] [Indexed: 04/14/2023] Open
Abstract
The measurement of the refractive index typically requires the use of optical ellipsometry which, although potentially very accurate, is extremely sensitive to the structural properties of the sample and its theoretical modeling, and typically requires specialized expertise to obtain reliable output data. Here, we propose a simple diffractive method for the measurement of the refractive index of homogenous solid thin films, which requires only the structuring of the surface of the material to be measured with the profile of a diffraction grating. The refractive index of an exemplary soft-moldable material is successfully estimated over a wide wavelength range by simply incorporating the measured topography and diffraction efficiency of the grating into a convenient scalar theory-based diffraction model. Without the need for specialized expertise and equipment, the method can serve as a simple and widely accessible optical characterization of materials useful in material science and photonics applications.
Collapse
Affiliation(s)
- Marcella Salvatore
- Centro Servizi Metrologici e Tecnologici Avanzati (CeSMA), University of Naples "Federico II", Complesso Universitario di Monte Sant'Angelo, Via Cintia 21, 80126 Naples, Italy
- Physics Department "E. Pancini", University of Naples "Federico II", Complesso Universitario di Monte Sant'Angelo, Via Cinthia 21, 80126 Naples, Italy
| | - Francesco Reda
- Physics Department "E. Pancini", University of Naples "Federico II", Complesso Universitario di Monte Sant'Angelo, Via Cinthia 21, 80126 Naples, Italy
| | - Fabio Borbone
- Department of Chemical Sciences, University of Naples "Federico II", Complesso Universitario di Monte Sant'Angelo, Via Cinthia 21, 80126 Naples, Italy
| | - I Komang Januariyasa
- Physics Department "E. Pancini", University of Naples "Federico II", Complesso Universitario di Monte Sant'Angelo, Via Cinthia 21, 80126 Naples, Italy
| | - Pasqualino Maddalena
- Physics Department "E. Pancini", University of Naples "Federico II", Complesso Universitario di Monte Sant'Angelo, Via Cinthia 21, 80126 Naples, Italy
| | - Stefano Luigi Oscurato
- Physics Department "E. Pancini", University of Naples "Federico II", Complesso Universitario di Monte Sant'Angelo, Via Cinthia 21, 80126 Naples, Italy
| |
Collapse
|
5
|
Wang X, Liu L, Ye Y, Liu J, Chen P, Zhang J, Du X, Liu Y. Micro vision-based measurement of concentricity for both TO base and active area of a APD chip in optical component packaging. OPTICS EXPRESS 2022; 30:38468-38480. [PMID: 36258411 DOI: 10.1364/oe.469170] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/30/2022] [Accepted: 09/15/2022] [Indexed: 06/16/2023]
Abstract
The avalanche photodiode (APD) chip is the core component of the transistor outline (TO). The concentricity between the inner circle (IC) of the APD active area and the outer circle (OC) of the TO base will directly affect a component's key performance indicators, such as external quantum efficiency, receiving sensitivity and responsivity, thereby impacting quality assurance, performance improvement, and stable operation. Nevertheless, as the surge in demand for components increases, the traditional visual inspection relying on manual and microscope has been unable to meet the requirements of mass manufacturing for real-time quality and efficiency. Thus, a Concentricity Microscopic Vision Measurement System (CMVMS) mainly composed of a microscopic vision acquisition unit and an intelligent concentricity measurement unit has been proposed, designed, and implemented. On the basis of analyzing the 3D complex environment of TO components, a coaxial illumination image acquisition scheme that can take into account the characteristics of the OC and IC has been proposed. Additionally, a concentricity image measurement method based on dynamic threshold segmentation has been designed to reduce the interference of complex industrial environment changes on measurement accuracy. The experiment results show that the measurement accuracy of the CMVMS system is over 97%, and with a single measurement time of less than 0.2s, it can better meet the real-time and accuracy requirements. To the best of our knowledge, this is the first report on the realization of real-time concentricity measurement in optical component packaging, and this technology can be extended to other fields of concentricity measurement.
Collapse
|