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Xu M, Chen C, Chang X, Chen Q, Lu H. Dielectric Liquid Microlens Array with Tunable Focal Length Based on Microdroplet Array Created via Dip-Coating Method. LANGMUIR : THE ACS JOURNAL OF SURFACES AND COLLOIDS 2024; 40:5809-5817. [PMID: 38445621 DOI: 10.1021/acs.langmuir.3c03689] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 03/07/2024]
Abstract
A dielectric liquid microlens array (LMA) with a tunable focal length was fabricated by using a microdroplet array generated through the dip-coating method. The process began with treating the octadecyltrichlorosilane (OTS) layer with selective UV/O3 irradiation for 20 min to establish a hydrophilic-hydrophobic patterning surface. The substrate was subsequently immersed in glycerol and then withdrawn at a constant rate to create a microdroplet array. Upon filling the cell with matching oil (SL5267) and placing it within a square array of a 200 μm diameter glycerol microdroplet array, the LMA was produced. The focal length ranged from approximately -0.96 to -0.3 mm within a voltage range of 0 to 60 Vrms. The glycerol microdroplets, characterized by their shapes, sizes, curvatures, and filling factors, can be precisely controlled by designing an OTS patterning or adjusting the dip-coating speed. This approach offers a rapid and high-throughput method for preparation. Our approach to fabricating tunable LMA offers several advantages, including simplicity of fabrication, uniform structural properties, cost-effectiveness, polarization independence, and excellent optical performance. These focus-tunable LMAs hold significant potential for applications in image processing, 3D displays, medical endoscopy, and military technologies.
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Affiliation(s)
- Miao Xu
- Academy of Opto-Electric Technology, Special Display and Imaging Technology, Innovation Center of Anhui Province, National Engineering Laboratory of Special Display Technology, Anhui Province Key Laboratory of Measuring Theory and Precision Instrument, School of Instrument Science and Optoelectronics Engineering, Anhui Provincial Engineering Research Center of Semiconductor Inspection Technology and Instrument, Hefei University of Technology, Hefei 230009, China
| | - Cuifen Chen
- Academy of Opto-Electric Technology, Special Display and Imaging Technology, Innovation Center of Anhui Province, National Engineering Laboratory of Special Display Technology, Anhui Province Key Laboratory of Measuring Theory and Precision Instrument, School of Instrument Science and Optoelectronics Engineering, Anhui Provincial Engineering Research Center of Semiconductor Inspection Technology and Instrument, Hefei University of Technology, Hefei 230009, China
| | - Xueying Chang
- Academy of Opto-Electric Technology, Special Display and Imaging Technology, Innovation Center of Anhui Province, National Engineering Laboratory of Special Display Technology, Anhui Province Key Laboratory of Measuring Theory and Precision Instrument, School of Instrument Science and Optoelectronics Engineering, Anhui Provincial Engineering Research Center of Semiconductor Inspection Technology and Instrument, Hefei University of Technology, Hefei 230009, China
| | - Qilong Chen
- Academy of Opto-Electric Technology, Special Display and Imaging Technology, Innovation Center of Anhui Province, National Engineering Laboratory of Special Display Technology, Anhui Province Key Laboratory of Measuring Theory and Precision Instrument, School of Instrument Science and Optoelectronics Engineering, Anhui Provincial Engineering Research Center of Semiconductor Inspection Technology and Instrument, Hefei University of Technology, Hefei 230009, China
| | - Hongbo Lu
- Academy of Opto-Electric Technology, Special Display and Imaging Technology, Innovation Center of Anhui Province, National Engineering Laboratory of Special Display Technology, Anhui Province Key Laboratory of Measuring Theory and Precision Instrument, School of Instrument Science and Optoelectronics Engineering, Anhui Provincial Engineering Research Center of Semiconductor Inspection Technology and Instrument, Hefei University of Technology, Hefei 230009, China
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