Speckle-based x-ray phase-contrast imaging with a laboratory source and the scanning technique

Development of a novel single absorption grating based versatile multi-contrast imaging facility at the X-ray Imaging beamline, Indus-2

A multi-contrast x-ray imaging facility with a single x-ray absorption grating is developed at the X-ray Imaging beamline (BL-04), Indus-2 synchrotron radiation source, India, and implemented in both monochromatic and white beam operation modes of the beamline for versatile utilization of this technique in structural characterization of a wide range of samples from soft biological to metallic, dense, and thick materials. The developed facility is characterized by resolution, visibility, and signal-to-noise ratio and tested for static and dynamic morphological analysis under different experimental conditions. The qualitative and quantitative analysis of extracted multi-contrast x-ray images of different samples demonstrates the relative merits of various experimental conditions. This unique multi-contrast facility with a single x-ray absorption grating that operates in dual modes of the X-ray Imaging beamline enables the study of both static and transient phenomena across a wide range of applications at the beamline.

Transport-of-intensity model for single-mask x-ray differential phase contrast imaging

X-ray phase contrast imaging holds great promise for improving the visibility of light-element materials such as soft tissues and tumors. The single-mask differential phase contrast imaging method stands out as a simple and effective approach to yield differential phase contrast. In this work, we introduce a model for a single-mask phase imaging system based on the transport-of-intensity equation. Our model provides an accessible understanding of signal and contrast formation in single-mask x-ray phase imaging, offering a clear perspective on the image formation process, for example, the origin of alternate bright and dark fringes in phase contrast intensity images. Aided by our model, we present an efficient retrieval method that yields differential phase contrast imagery in a single acquisition step. Our model gives insight into the contrast generation and its dependence on the system geometry and imaging parameters in both the initial intensity image as well as retrieved images. The model validity as well as the proposed retrieval method are demonstrated via both experimental results on a system developed in house as well as Monte Carlo simulations. In conclusion, our work not only provides a model for an intuitive visualization of image formation but also offers a method to optimize differential phase imaging setups, holding tremendous promise for advancing medical diagnostics and other applications.

Edge-Illumination X-Ray Dark-Field Tomography

Dark-field imaging is an x-ray technique used to highlight subpixel, typically micrometer-scale, density fluctuations. It is often used alongside standard attenuation-based and also phase-contrast x-ray imaging, which both see regular use in tomography. We present x-ray dark-field computed tomography (CT) with a laboratory edge-illumination setup. The dark-field contrast is shown to increase linearly with the x-ray path length through the imaged object, a prerequisite for the use of standard tomographic reconstruction approaches. A multimaterial, custom-built phantom is used to show how dark-field contrast CT can complement attenuation contrast CT for the separation of materials based on their microstructure. As an example of a more complex, biological sample, we present a model rat heart. We show, by comparison with attenuation contrast tomography, that dark-field enables the identification of additional structures undetected through the attenuation contrast channel, as well as offering a consistently sharper reconstructed image.

Characterization of the error of the speckle-based wavefront metrology device at Shanghai Synchrotron Radiation Facility

A metrology device based on the near-field speckle technique was developed in the x-ray test beamline at the Shanghai Synchrotron Radiation Facility to meet the at-wavelength detection requirements of ultra-high-precision optical elements. Different sources of error that limit the uncertainty of the instrument were characterized. Two main factors that contribute to the uncertainty of the measurements were investigated: (1) noise errors introduced by the electronics and the errors introduced by the algorithm and (2) stability errors owing to environmental conditions. The results show that the high measurement stability of the device is realized because it is insensitive to the effect of the external environment. The repetition accuracy of the device achieved 9 nrad (rms) when measuring the planar mirror that produces weak phase curvature.

Two-dimensional speckle technique for slope error measurements of weakly focusing reflective X-ray optics

Speckle-based at-wavelength metrology techniques now play an important role in X-ray wavefront measurements. However, for reflective X-ray optics, the majority of existing speckle-based methods fail to provide reliable 2D information about the optical surface being characterized. Compared with the 1D information typically output from speckled-based methods, a 2D map is more informative for understanding the overall quality of the optic being tested. In this paper, we propose a method for in situ 2D absolute metrology of weakly focusing X-ray mirrors. Importantly, the angular misalignment of the mirror can be easily corrected with the proposed 2D processing procedure. We hope the speckle pattern data processing method presented here will help to extend this technique to wider applications in the synchrotron radiation and X-ray free-electron laser communities.

Precise wavefront characterization of x-ray optical elements using a laboratory source

Improvements in x-ray optics critically depend on the measurement of their optical performance. The knowledge of wavefront aberrations, for example, can be used to improve the fabrication of optical elements or to design phase correctors to compensate for these errors. At present, the characterization of such optics is made using intense x-ray sources, such as synchrotrons. However, the limited access to these facilities can substantially slow down the development process. Improvements in the brightness of lab-based x-ray micro-sources in combination with the development of new metrology methods, particularly ptychographic x-ray speckle tracking, enable characterization of x-ray optics in the lab with a precision and sensitivity not possible before. Here, we present a laboratory setup that utilizes a commercially available x-ray source and can be used to characterize different types of x-ray optics. The setup is used in our laboratory on a routine basis to characterize multilayer Laue lenses of high numerical aperture and other optical elements. This typically includes measurements of the wavefront distortions, optimum operating photon energy, and focal length of the lens. To check the sensitivity and accuracy of this laboratory setup, we compared the results to those obtained at the synchrotron and saw no significant difference. To illustrate the feedback of measurements on performance, we demonstrated the correction of the phase errors of a particular multilayer Laue lens using a 3D printed compound refractive phase plate.

Quantitative X-ray phase contrast computed tomography with grating interferometry : Biomedical applications of quantitative X-ray grating-based phase contrast computed tomography

The ability of biomedical imaging data to be of quantitative nature is getting increasingly important with the ongoing developments in data science. In contrast to conventional attenuation-based X-ray imaging, grating-based phase contrast computed tomography (GBPC-CT) is a phase contrast micro-CT imaging technique that can provide high soft tissue contrast at high spatial resolution. While there is a variety of different phase contrast imaging techniques, GBPC-CT can be applied with laboratory X-ray sources and enables quantitative determination of electron density and effective atomic number. In this review article, we present quantitative GBPC-CT with the focus on biomedical applications.

Quantitative analysis of speckle-based X-ray dark-field imaging using numerical wave-optics simulations

The dark-field signal measures the small-angle scattering strength and provides complementary diagnostic information. This is of particular interest for lung imaging due to the pronounced small-angle scatter from the alveolar microstructure. However, most dark-field imaging techniques are relatively complex, dose-inefficient, and require sophisticated optics and highly coherent X-ray sources. Speckle-based imaging promises to overcome these limitations due to its simple and versatile setup, only requiring the addition of a random phase modulator to conventional X-ray equipment. We investigated quantitatively the influence of sample structure, setup geometry, and source energy on the dark-field signal in speckle-based X-ray imaging with wave-optics simulations for ensembles of micro-spheres. We show that the dark-field signal is accurately predicted via a model originally derived for grating interferometry when using the mean frequency of the speckle pattern power spectral density as the characteristic speckle size. The size directly reflects the correlation length of the diffuser surface and did not change with energy or propagation distance within the near-field. The dark-field signal had a distinct dependence on sample structure and setup geometry but was also affected by beam hardening-induced modifications of the visibility spectrum. This study quantitatively demonstrates the behavior of the dark-field signal in speckle-based X-ray imaging.

Quantitative X-ray Channel-Cut Crystal Diffraction Wavefront Metrology Using the Speckle Scanning Technique

A speckle-based method for the X-ray crystal diffraction wavefront measurement is implemented, and the slope errors of channel-cut crystals with different surface characteristics are measured. The method uses a speckle scanning technique generated by a scattering membrane translated using a piezo motor to infer the deflection of X-rays from the crystals. The method provides a high angular sensitivity of the channel-cut crystal slopes in both the tangential and sagittal directions. The experimental results show that the slope error of different cutting and etching processes ranges from 0.25 to 2.98 μrad. Furthermore, the results of wavefront deformation are brought into the beamline for simulation. This method opens up possibilities for new high-resolution applications for X-ray crystal diffraction wavefront measurement and provides feedback to crystal manufacturers to improve channel-cut fabrication.

Low-dose in situ prelocation of protein microcrystals by 2D X-ray phase-contrast imaging for serial crystallography

Serial protein crystallography has emerged as a powerful method of data collection on small crystals from challenging targets, such as membrane proteins. Multiple microcrystals need to be located on large and often flat mounts while exposing them to an X-ray dose that is as low as possible. A crystal-prelocation method is demonstrated here using low-dose 2D full-field propagation-based X-ray phase-contrast imaging at the X-ray imaging beamline TOMCAT at the Swiss Light Source (SLS). This imaging step provides microcrystal coordinates for automated serial data collection at a microfocus macromolecular crystallography beamline on samples with an essentially flat geometry. This prelocation method was applied to microcrystals of a soluble protein and a membrane protein, grown in a commonly used double-sandwich in situ crystallization plate. The inner sandwiches of thin plastic film enclosing the microcrystals in lipid cubic phase were flash cooled and imaged at TOMCAT. Based on the obtained crystal coordinates, both still and rotation wedge serial data were collected automatically at the SLS PXI beamline, yielding in both cases a high indexing rate. This workflow can be easily implemented at many synchrotron facilities using existing equipment, or potentially integrated as an online technique in the next-generation macromolecular crystallography beamline, and thus benefit a number of dose-sensitive challenging protein targets.

Wavelet-transform-based speckle vector tracking method for X-ray phase imaging

We introduce a new X-ray speckle-vector tracking method for phase imaging, which is based on the wavelet transform. Theoretical and experimental results show that this method, which is called wavelet-transform-based speckle-vector tracking (WSVT), has stronger noise robustness and higher efficiency compared with the cross-correlation-based method. In addition, the WSVT method has the controllable noise reduction and can be applied with fewer scan steps. These unique features make the WSVT method suitable for measurements of large image sizes and phase shifts, possibly under low-flux conditions, and has the potential to broaden the applications of speckle tracking to new areas requiring faster phase imaging and real-time wavefront sensing, diagnostics, and characterization.

X-ray phase imaging with the unified modulated pattern analysis of near-field speckles at a laboratory source

X-ray phase-contrast techniques are powerful methods for discerning features with similar densities, which are normally indistinguishable with conventional absorption contrast. While these techniques are well-established tools at large-scale synchrotron facilities, efforts have increasingly focused on implementations at laboratory sources for widespread use. X-ray speckle-based imaging is one of the phase-contrast techniques with high potential for translation to conventional x-ray systems. It yields phase-contrast, transmission, and dark-field images with high sensitivity using a relatively simple and cost-effective setup tolerant to divergent and polychromatic beams. Recently, we have introduced the unified modulated pattern analysis (UMPA) [Phys. Rev. Lett.118, 203903 (2017)PRLTAO0031-900710.1103/PhysRevLett.118.203903], which further simplifies the translation of x-ray speckle-based imaging to low-brilliance sources. Here, we present the proof-of-principle implementation of UMPA speckle-based imaging at a microfocus liquid-metal-jet x-ray laboratory source.

Absolute metrology method of the x-ray mirror with speckle scanning technique

As an important characterization method for beamline optics, at-wavelength metrology technology based on wavefront measurements has been developed for many years. However, the previous studies on at-wavelength metrology of reflective mirrors is limited to the indirect method. So, the accurate surface information of the mirror under test would normally be inaccessible because of lack of experimental deconvolution between the mirror and any backgrounds from upstream optics. In this study, an absolute metrology method is developed based on the speckle scanning technique. Using this method, the surface profile of the mirror can be extracted exactly from the mixed information of the entire upstream beamline. At the same time, data acquisition time can also be significantly reduced by the processing algorithm introduced in this study without sacrificing the angular sensitivity.

Ptychographic imaging of incoherently illuminated extended objects using speckle correlations

A scattering layer is usually considered an obstacle to imaging. However, using speckle correlation imaging techniques, the scattering layer effectively acts as a lens. To date, the speckle correlation imaging method has been limited to imaging sparse samples. Here, we demonstrate imaging of incoherently illuminated extended objects in transmission and around-the-corner geometries. We are able to image extended objects by constraining the illumination spot on the object and then scanning the object. A ptychography algorithm is used to reconstruct the extended object. This work demonstrates the applicability of ptychography to spatially incoherent light and enables a new method of imaging in spectral regions where there is limited choice in optics, such as the terahertz, extreme ultraviolet, and x-ray regions.

Photon detection efficiency of laboratory-based x-ray phase contrast imaging techniques for mammography: a Monte Carlo study

An important challenge in real-world biomedical applications of x-ray phase contrast imaging (XPCI) techniques is the efficient use of the photon flux generated by an incoherent and polychromatic x-ray source. This efficiency can directly influence dose and exposure time and ideally should not affect the superior contrast and sensitivity of XPCI. In this paper, we present a quantitative evaluation of the photon detection efficiency of two laboratory-based XPCI methods, grating interferometry (GI) and coded-aperture (CA). We adopt a Monte Carlo approach to simulate existing prototypes of those systems, tailored for mammography applications. Our simulations were validated by means of a simple experiment performed on a CA XPCI system. Our results show that the fraction of detected photons in the standard energy range of mammography are about 1.4% and 10% for the GI and CA techniques, respectively. The simulations indicate that the design of the optical components plays an important role in the higher efficiency of CA compared to the GI method. It is shown that the use of lower absorbing materials as the substrates for GI gratings can improve its flux efficiency by up to four times. Along similar lines, we also show that an optimized and compact configuration of GI could lead to a 3.5 times higher fraction of detected counts compared to a standard and non-optimised GI implementation.

Edge-illumination x-ray phase contrast imaging with Pt-based metallic glass masks

Edge-illumination x-ray phase contrast imaging (EI XPCI) is a non-interferometric phase-sensitive method where two absorption masks are employed. These masks are fabricated through a photolithography process followed by electroplating which is challenging in terms of yield as well as time- and cost-effectiveness. We report on the first implementation of EI XPCI with Pt-based metallic glass masks fabricated by an imprinting method. The new tested alloy exhibits good characteristics including high workability beside high x-ray attenuation. The fabrication process is easy and cheap, and can produce large-size masks for high x-ray energies within minutes. Imaging experiments show a good quality phase image, which confirms the potential of these masks to make the EI XPCI technique widely available and affordable.

X-ray Phase-Contrast Imaging and Metrology through Unified Modulated Pattern Analysis

We present a method for x-ray phase-contrast imaging and metrology applications based on the sample-induced modulation and subsequent computational demodulation of a random or periodic reference interference pattern. The proposed unified modulated pattern analysis (UMPA) technique is a versatile approach and allows tuning of signal sensitivity, spatial resolution, and scan time. We characterize the method and demonstrate its potential for high-sensitivity, quantitative phase imaging, and metrology to overcome the limitations of existing methods.

Noise analysis of speckle-based x-ray phase-contrast imaging

Speckle-based x-ray phase-contrast imaging has drawn increasing interest in recent years as a simple, multimodal, cost-efficient, and laboratory-source adaptable method. We investigate its noise properties to help further optimization on the method and further comparison with other phase-contrast methods. An analytical model for assessing noise in a differential phase signal is adapted from studies on the digital image correlation technique in experimental mechanics and is supported by simulations and experiments. The model indicates that the noise of the differential phase signal from speckle-based imaging has a behavior similar to that of the grating-based method.

High energy X-ray phase and dark-field imaging using a random absorption mask

High energy X-ray imaging has unique advantage over conventional X-ray imaging, since it enables higher penetration into materials with significantly reduced radiation damage. However, the absorption contrast in high energy region is considerably low due to the reduced X-ray absorption cross section for most materials. Even though the X-ray phase and dark-field imaging techniques can provide substantially increased contrast and complementary information, fabricating dedicated optics for high energies still remain a challenge. To address this issue, we present an alternative X-ray imaging approach to produce transmission, phase and scattering signals at high X-ray energies by using a random absorption mask. Importantly, in addition to the synchrotron radiation source, this approach has been demonstrated for practical imaging application with a laboratory-based microfocus X-ray source. This new imaging method could be potentially useful for studying thick samples or heavy materials for advanced research in materials science.

From synchrotron radiation to lab source: advanced speckle-based X-ray imaging using abrasive paper

X-ray phase and dark-field imaging techniques provide complementary and inaccessible information compared to conventional X-ray absorption or visible light imaging. However, such methods typically require sophisticated experimental apparatus or X-ray beams with specific properties. Recently, an X-ray speckle-based technique has shown great potential for X-ray phase and dark-field imaging using a simple experimental arrangement. However, it still suffers from either poor resolution or the time consuming process of collecting a large number of images. To overcome these limitations, in this report we demonstrate that absorption, dark-field, phase contrast, and two orthogonal differential phase contrast images can simultaneously be generated by scanning a piece of abrasive paper in only one direction. We propose a novel theoretical approach to quantitatively extract the above five images by utilising the remarkable properties of speckles. Importantly, the technique has been extended from a synchrotron light source to utilise a lab-based microfocus X-ray source and flat panel detector. Removing the need to raster the optics in two directions significantly reduces the acquisition time and absorbed dose, which can be of vital importance for many biological samples. This new imaging method could potentially provide a breakthrough for numerous practical imaging applications in biomedical research and materials science.