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For: Yu W, Li X, Hu R, Qu J, Liu L. Full-field measurement of complex objects illuminated by an ultrashort pulse laser using delay-line sweeping off-axis interferometry. Opt Lett 2021;46:2803-2806. [PMID: 34129544 DOI: 10.1364/ol.421313] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Received: 02/04/2021] [Accepted: 05/18/2021] [Indexed: 06/12/2023]
Number Cited by Other Article(s)
1
Verrier N, Debailleul M, Haeberlé O. Recent Advances and Current Trends in Transmission Tomographic Diffraction Microscopy. SENSORS (BASEL, SWITZERLAND) 2024;24:1594. [PMID: 38475130 PMCID: PMC10934239 DOI: 10.3390/s24051594] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 01/19/2024] [Revised: 02/21/2024] [Accepted: 02/27/2024] [Indexed: 03/14/2024]
2
Li X, Yu W, Hu R, Qu J, Liu L. Fast polarization-sensitive second-harmonic generation microscopy based on off-axis interferometry. OPTICS EXPRESS 2023;31:3143-3152. [PMID: 36785312 DOI: 10.1364/oe.471459] [Citation(s) in RCA: 3] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/15/2022] [Accepted: 12/12/2022] [Indexed: 06/18/2023]
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