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Martínez-Romeu J, Diez I, Golat S, Rodríguez-Fortuño FJ, Martínez A. Longitudinal chiral forces in photonic integrated waveguides to separate particles with realistically small chirality. NANOPHOTONICS (BERLIN, GERMANY) 2024; 13:4275-4289. [PMID: 39678109 PMCID: PMC11636476 DOI: 10.1515/nanoph-2024-0339] [Citation(s) in RCA: 1] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 06/27/2024] [Accepted: 09/07/2024] [Indexed: 12/17/2024]
Abstract
Chiral optical forces exhibit opposite signs for the two enantiomeric versions of a chiral molecule or particle. If large enough, these forces might be able to separate enantiomers all optically, which would find numerous applications in different fields, from pharmacology to chemistry. Longitudinal chiral forces are especially promising for tackling the challenging scenario of separating particles of realistically small chiralities. In this work, we study the longitudinal chiral forces arising in dielectric integrated waveguides when the quasi-TE and quasi-TM modes are combined as well as their application to separate absorbing and non-absorbing chiral particles. We show that chiral gradient forces dominate in the scenario of beating of non-denegerate TE and TM modes when considering non-absorbing particles. For absorbing particles, the superposition of degenerate TE and TM modes can lead to chiral forces that are kept along the whole waveguide length. We accompany the calculations of the forces with particle tracking simulations for specific radii and chirality parameters. We show that longitudinal forces can separate non-absorbing chiral nanoparticles in water even for relatively low values of the particle chirality and absorbing particles with arbitrarily low values of chirality can be effectively separated after enough interaction time.
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Affiliation(s)
- Josep Martínez-Romeu
- Nanophotonics Technology Center, Universitat Politècnica de València, Valencia, Spain
| | - Iago Diez
- Nanophotonics Technology Center, Universitat Politècnica de València, Valencia, Spain
| | | | | | - Alejandro Martínez
- Nanophotonics Technology Center, Universitat Politècnica de València, Valencia, Spain
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Yi W, Huang H, Lai C, He T, Wang Z, Dai X, Shi Y, Cheng X. Optical Forces on Chiral Particles: Science and Applications. MICROMACHINES 2024; 15:1267. [PMID: 39459141 PMCID: PMC11509618 DOI: 10.3390/mi15101267] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/19/2024] [Revised: 10/15/2024] [Accepted: 10/16/2024] [Indexed: 10/28/2024]
Abstract
Chiral particles have attracted considerable attention due to their distinctive interactions with light, which enable a variety of cutting-edge applications. This review presents a comprehensive analysis of the optical forces acting on chiral particles, categorizing them into gradient force, radiation pressure, optical lateral force, pulling force, and optical force on coupled chiral particles. We thoroughly overview the fundamental physical mechanisms underlying these forces, supported by theoretical models and experimental evidence. Additionally, we discuss the practical implications of these optical forces, highlighting their potential applications in optical manipulation, particle sorting, chiral sensing, and detection. This review aims to offer a thorough understanding of the intricate interplay between chiral particles and optical forces, laying the groundwork for future advancements in nanotechnology and photonics.
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Affiliation(s)
- Weicheng Yi
- Institute of Precision Optical Engineering, School of Physics Science and Engineering, Tongji University, Shanghai 200092, China; (W.Y.); (H.H.); (C.L.); (T.H.); (Z.W.); (X.C.)
- MOE Key Laboratory of Advanced Micro-Structured Materials, Shanghai 200092, China
- Shanghai Institute of Intelligent Science and Technology, Tongji University, Shanghai 200092, China
- Shanghai Frontiers Science Center of Digital Optics, Shanghai 200092, China
| | - Haiyang Huang
- Institute of Precision Optical Engineering, School of Physics Science and Engineering, Tongji University, Shanghai 200092, China; (W.Y.); (H.H.); (C.L.); (T.H.); (Z.W.); (X.C.)
- MOE Key Laboratory of Advanced Micro-Structured Materials, Shanghai 200092, China
- Shanghai Institute of Intelligent Science and Technology, Tongji University, Shanghai 200092, China
- Shanghai Frontiers Science Center of Digital Optics, Shanghai 200092, China
| | - Chengxing Lai
- Institute of Precision Optical Engineering, School of Physics Science and Engineering, Tongji University, Shanghai 200092, China; (W.Y.); (H.H.); (C.L.); (T.H.); (Z.W.); (X.C.)
- MOE Key Laboratory of Advanced Micro-Structured Materials, Shanghai 200092, China
- Shanghai Institute of Intelligent Science and Technology, Tongji University, Shanghai 200092, China
- Shanghai Frontiers Science Center of Digital Optics, Shanghai 200092, China
| | - Tao He
- Institute of Precision Optical Engineering, School of Physics Science and Engineering, Tongji University, Shanghai 200092, China; (W.Y.); (H.H.); (C.L.); (T.H.); (Z.W.); (X.C.)
- MOE Key Laboratory of Advanced Micro-Structured Materials, Shanghai 200092, China
- Shanghai Institute of Intelligent Science and Technology, Tongji University, Shanghai 200092, China
- Shanghai Frontiers Science Center of Digital Optics, Shanghai 200092, China
| | - Zhanshan Wang
- Institute of Precision Optical Engineering, School of Physics Science and Engineering, Tongji University, Shanghai 200092, China; (W.Y.); (H.H.); (C.L.); (T.H.); (Z.W.); (X.C.)
- MOE Key Laboratory of Advanced Micro-Structured Materials, Shanghai 200092, China
- Shanghai Institute of Intelligent Science and Technology, Tongji University, Shanghai 200092, China
- Shanghai Frontiers Science Center of Digital Optics, Shanghai 200092, China
| | - Xinhua Dai
- Technology Innovation Center of Mass Spectrometry for State Market Regulation, Center for Advanced Measurement Science, National Institute of Metrology, Beijing 100029, China
| | - Yuzhi Shi
- Institute of Precision Optical Engineering, School of Physics Science and Engineering, Tongji University, Shanghai 200092, China; (W.Y.); (H.H.); (C.L.); (T.H.); (Z.W.); (X.C.)
- MOE Key Laboratory of Advanced Micro-Structured Materials, Shanghai 200092, China
- Shanghai Institute of Intelligent Science and Technology, Tongji University, Shanghai 200092, China
- Shanghai Frontiers Science Center of Digital Optics, Shanghai 200092, China
| | - Xinbin Cheng
- Institute of Precision Optical Engineering, School of Physics Science and Engineering, Tongji University, Shanghai 200092, China; (W.Y.); (H.H.); (C.L.); (T.H.); (Z.W.); (X.C.)
- MOE Key Laboratory of Advanced Micro-Structured Materials, Shanghai 200092, China
- Shanghai Institute of Intelligent Science and Technology, Tongji University, Shanghai 200092, China
- Shanghai Frontiers Science Center of Digital Optics, Shanghai 200092, China
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