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Number Cited by Other Article(s)
1
Heckert M, Enghardt S, Bauch J. X‐Ray White Beam Interferences on Thin Crystals. CRYSTAL RESEARCH AND TECHNOLOGY 2021. [DOI: 10.1002/crat.202100085] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/11/2022]
2
Bauch J, Böhling M, Ullrich HJ, Wünsche D. Divergent beam hard X-ray diffraction used for the simultaneous imaging of radiographic and crystallographic information. CRYSTAL RESEARCH AND TECHNOLOGY 2010. [DOI: 10.1002/crat.201000068] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/06/2022]
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