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For: Wood PC, Wydeven T, Tsuji O. Critical Process Variables for Uv-Ozone Etching of Photoresist. ACTA ACUST UNITED AC 2011. [DOI: 10.1557/proc-315-237] [Citation(s) in RCA: 11] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/13/2022]
Number Cited by Other Article(s)
1
Chuang VP, Ross CA, Bilalis P, Hadjichristidis N. Nanoscale rings fabricated using self-assembled triblock terpolymer templates. ACS NANO 2008;2:2007-2014. [PMID: 19206445 DOI: 10.1021/nn8002345] [Citation(s) in RCA: 10] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/27/2023]
2
Hogan ZL, Kreller CR, Tran KA, Hart MW, Wallraff GM, Swanson SA, Volksen W, Lee VY, Magbitang TP, Hedrick JL, Hawker CJ, Miller RD, Kim HC. Patterned nanoporous poly(methylsilsesquioxane) thin films: a potential high density substrate. MATERIALS SCIENCE & ENGINEERING. C, MATERIALS FOR BIOLOGICAL APPLICATIONS 2004. [DOI: 10.1016/j.msec.2003.10.002] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 10/26/2022]
3
Ion-implanted photoresist removal using water/carbon dioxide mixtures at elevated temperature and pressure. ACTA ACUST UNITED AC 2001. [DOI: 10.1116/1.1415519] [Citation(s) in RCA: 9] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/17/2022]
4
Kim CK, Chung CH, Moon SH. Removal of organic impurities from the silicon surface by oxygen and UV cleaning. KOREAN J CHEM ENG 1996. [DOI: 10.1007/bf02705958] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/25/2022]
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