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For: Oogane M, Tezuka N, Miyazaki T. Voltage and Temperature Dependence of the TMR Effect for Ferromagnet/Al-Oxide/Co Junctions. ACTA ACUST UNITED AC 1999. [DOI: 10.3379/jmsjmag.23.1297] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/01/2022]
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